Substrate analysis systems

• US 8,318,094 B1
• Filed: 06/16/2011
• Issued: 11/27/2012
• Est. Priority Date: 06/18/2010
• Status: Active Grant

• Current Assignee: Pacific Bioscience of California Incorporated (L'Oreal SA)
• Original Assignee: Pacific Bioscience of California Incorporated (L'Oreal SA)
• Inventors: Bayandorian, Hovig, Dixon, John, Hester, Kevin, Huang, Yanqiao, Lundquist, Paul, Roy, Joy, Turner, Stephen, Zhao, Peiqian, Zhong, Cheng Frank, Cheng, Yujuan
• Primary Examiner(s): Gordon, Brian R
• Application Number:
  US13/162,433
• Time in Patent Office: 530 Days
• Field of Search: 422 62- 63, 422/67, 422/68.1, 422/50, 422 8205- 8209, 422/400, 436/43, 436/164
• US Class Current: 422/63
• CPC Class Codes: G01N 2021/6417 Spectrofluorimetric devices
• CPC Class Codes: G01N 2035/00039 Transport arrangements specific to flat sample substrates, e.g. pusher blade
• CPC Class Codes: G01N 21/645 Specially adapted constructive features of fluorimeters
• CPC Class Codes: G01N 35/0099 comprising robots or similar manipulators robots per se B25J
• CPC Class Codes: Y10T 436/11 Automated chemical analysis

Abstract

This invention provides systems for analyzing substrates. Also provided by the invention are improved optical systems for enhanced multiplex illumination, optical systems with compact multi-wavelength illumination architectures, optical systems for enhanced detection of optical signals, and optical systems for reduced autofluorescence background noise.

Claims

1. An automated high-throughput substrate analysis system, comprising:

a substrate container storage tray configured to accept a plurality of substrate containers;

a substrate preparation station configured to deliver one or more reactant to at least one reaction site on at least one substrate;

an automated gripper configured to puncture a seal on a substrate container mounted in the storage tray, and to grasp the substrate inside of the container, wherein, during operation of the system, the gripper removes the substrate from the container and delivers it to the substrate preparation station;

an optional incubation station that incubates the substrate, wherein the automated gripper moves the substrate from the substrate preparation station to the incubation station;

an analysis mount configured to accept at least one substrate from the substrate preparation station or the incubation station for analysis;

an environmental control module that controls one or more environmental parameters of the substrate preparation station, incubation station, or the analysis mount;

a machine vision system that monitors one or more of;

substrate transport, substrate positioning, gripper position, gripper movement, or activity of the substrate preparation station, the incubation station, or the analysis mount;

at least one optical train configured to illuminate the substrate in the substrate mount and to receive optical signals from the substrate, the substrate holder or the optical train being adjustable relative to one another;

an autofocus module configured to monitor the quality of optical signal detection and adjust the relative positions of the substrate and one or more components of the optical train to enhance detection of optical signals from the substrate;

an output that delivers optical signal data from the optical train to an analysis module;

at least one low vibration cooling element that cools the substrate when mounted in the substrate mount, or that cools the substrate mount, or that cools the optical train, or a combination thereof; and

,

a user interface that accepts user instructions to control the substrate preparation station, gripper, analysis mount, environmental control module, or low vibration cooling element.

2. The system of claim 1, comprising a cabinet, the cabinet comprising an upper region and a lower region, the upper region housing the substrate container storage tray, the substrate preparation station, the automated gripper, and the analysis mount;

the lower region housing the optical train;

wherein, during operation of the system, the environmental control system maintains a positive cabinet pressure in at least a portion of the cabinet.

3. The system of claim 1, wherein the optical train or the mount comprises one or more leveling or vibration damping components.

4. The system of claim 1 wherein the autofocus module comprises:

an optical energy source;

an optical element that blocks a portion of a beam of optical energy emanating from the optical energy source;

an objective lens configured to focus optical energy not blocked by the optical element onto a surface of the substrate, which focused optical energy is reflected off the surface of the substrate; and

,

an optical detector that detects the optical energy reflected off the surface of the substrate.

5. The system of claim 4 comprising a dichroic mirror that directs the optical energy reflected off the surface of the substrate toward the optical detector.

6. The system of claim 4 comprising a lens that optically couples the dichroic mirror and the optical detector.

7. The system of claim 1, wherein the optical train comprises one or more fluid cooling structures and the substrate analysis mount comprises or is coupled proximal to at least one heat sink or Peltier cooling structure.

8. The system of claim 1, wherein the substrate comprises one or more zero mode waveguide.

9. The system of claim 8, wherein the one or more zero mode waveguide comprises about 80,000 or more zero mode waveguides.

10. The of claim 1, having two or more beamlets of excitation radiation and comprising an alignment module that aligns the two or more beamlets of excitation radiation with the two or more reaction regions on the substrate.

11. The system of claim 10, comprising one or more micromirror disposed proximal to each of the two or more reaction regions on the substrate.

12. The system of claim 11, wherein the alignment module comprises:

an optical energy source that directs optical energy toward the substrate; and

,

an optical energy detector configured to detect optical energy reflected from the one or more micromirror disposed proximal to each of the two or more reaction regions of the substrate.

13. The system of claim 12, comprising a lens through which optical energy reflected from the one or more micromirror passes prior to reaching the optical energy detector.

14. The system of claim 12, wherein the optical energy detector is configured to detect the positions of the two or more beamlets of excitation radiation on the substrate.

15. The system of claim 14, wherein the alignment module compares the position on the detector of the detected optical energy reflected from the one or more micromirror and the positions of the two or more beamlets of excitation radiation on the substrate to align the two or more beamlets with the two or more reaction regions.