Systems and methods for adjusting threshold voltage
First Claim
Patent Images
1. An apparatus comprising:
- means for measuring a threshold voltage of a transistor of an integrated circuit;
means for determining a bias voltage which, responsive to application to a body well of said transistor, reduces a difference between said threshold voltage and a desired threshold voltage for said transistor; and
means for encoding said bias voltage into non-volatile storage on said integrated circuit.
9 Assignments
0 Petitions
Accused Products
Abstract
Systems and methods for adjusting threshold voltage. A threshold voltage of a transistor of an integrated circuit is measured. A bias voltage, which when applied to a body well of the transistor corrects a difference between the threshold voltage and a desired threshold voltage for the transistor, is determined. The bias voltage is encoded into non-volatile storage on the integrated circuit. The non-volatile storage can be digital and/or analog.
-
Citations
24 Claims
-
1. An apparatus comprising:
-
means for measuring a threshold voltage of a transistor of an integrated circuit; means for determining a bias voltage which, responsive to application to a body well of said transistor, reduces a difference between said threshold voltage and a desired threshold voltage for said transistor; and means for encoding said bias voltage into non-volatile storage on said integrated circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
-
-
13. An apparatus comprising:
-
circuitry configured to measure a threshold voltage of a transistor of an integrated circuit; circuitry configured to determine a bias voltage which, responsive to application to a body well of said transistor, reduces a difference between said threshold voltage and a desired threshold voltage for said transistor; and circuitry configured to encode said bias voltage into non-volatile storage on said integrated circuit. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
-
-
24. An apparatus comprising:
-
circuitry configured to measure a threshold voltage of a transistor of an integrated circuit; circuitry configured to determine a bias voltage which, responsive to application to a body well of said transistor, reduces a difference between said unbiased threshold voltage and a desired threshold voltage for said transistor; circuitry configured to encode said bias voltage into non-volatile storage on said integrated circuit; and circuitry configured to apply said body bias voltage to said transistor to achieve said desired threshold voltage.
-
Specification