System and method to measure capacitance of capacitive sensor array
First Claim
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1. A method for determining position information, the method comprising:
- selecting a column of a capacitive sensor array;
selecting a first row of said capacitive sensor array;
selecting a second row of said capacitive sensor array, wherein said first row and said second row intersect with said column of said capacitive sensor array;
measuring a differential current between;
a current associated with a capacitor of said first row and said column, andanother current associated with another capacitor of said second row and said column;
measuring a differential capacitance between said first row and said second row, based on the measured differential current, the measuring of the differential capacitance including;
converting the measured differential current to a voltage; and
generating a digital value based on the voltage, the digital value representing the measured differential capacitance; and
determining a location of an object proximate to said capacitive sensor array, based on the measured differential capacitance.
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Abstract
A system and method for measuring capacitance of a capacitive sensor array is disclosed. Upon measuring the capacitance, position information with respect to the sensor array may be determined. A column, a first row, and a second row of a capacitive sensor array may be selected. The first row and the second row intersect with the column of the capacitive sensor array. A differential capacitance between the first row and the second row may be measured. The differential capacitance may be utilized in determining a location of an object proximate to the capacitive sensor array.
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Citations
16 Claims
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1. A method for determining position information, the method comprising:
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selecting a column of a capacitive sensor array; selecting a first row of said capacitive sensor array; selecting a second row of said capacitive sensor array, wherein said first row and said second row intersect with said column of said capacitive sensor array; measuring a differential current between; a current associated with a capacitor of said first row and said column, and another current associated with another capacitor of said second row and said column; measuring a differential capacitance between said first row and said second row, based on the measured differential current, the measuring of the differential capacitance including; converting the measured differential current to a voltage; and generating a digital value based on the voltage, the digital value representing the measured differential capacitance; and determining a location of an object proximate to said capacitive sensor array, based on the measured differential capacitance. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. An apparatus to determine location of an object proximate to a capacitive sensor array, the apparatus comprising:
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means for selecting a column of a capacitive sensor array; means for selecting a first row of the capacitive sensor array; means for selecting a second row of the capacitive sensor array, wherein the first row and the second row intersect with the column of the capacitive sensor array; means for measuring a differential current between; a current associated with a capacitor of the first row and the column, and another current associated with another capacitor of the second row and the column; means for measuring a differential capacitance between the first row and the second row, based on the measured differential current, wherein the means for measuring of the differential capacitance is configured to convert the measured differential current to a voltage and generate a digital value based on the voltage, the digital value representing the measured differential capacitance; and means for determining a location of an object proximate to the capacitive sensor array, based on the measured differential capacitance. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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Specification