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Dual chamber, multi-analyte test strip with opposing electrodes

  • US 8,323,467 B2
  • Filed: 10/27/2009
  • Issued: 12/04/2012
  • Est. Priority Date: 10/27/2009
  • Status: Active Grant
First Claim
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1. A dual chamber, multi-analyte test strip comprising:

  • a first insulating layer;

    a first electrically conductive layer disposed on the first insulating layer, the electrically conductive layer including a first working electrode with a first analyte contact pad;

    a first patterned spacer layer positioned above the first electrically conductive layer, the patterned spacer layer defining a first sample-receiving chamber therein that overlies the first working electrode, the first sample-receiving chamber having a first end opening and a second end opening;

    a first counter/reference electrode layer overlying and exposed to the first sample receiving chamber, the first counter/reference electrode layer configured in an opposing relationship to the first working electrode and having a first counter/reference contact pad;

    a counter/reference insulating layer disposed over the first counter/reference electrode layer,a second counter/reference electrode layer disposed over the counter/reference insulating layer the second counter/reference electrode layer having a second counter/reference contact pad,a second patterned spacer layer positioned above the second counter/reference electrode layer, the second patterned spacer layer defining a second sample-receiving chamber therein with a first end opening and a second end opening;

    a second electrically conductive layer disposed above the second patterned spacer layer, the second electrically conductive layer including a second working electrode with a second analyte contact pad;

    a second insulating layer disposed above the second electrically conductive layer;

    a first analyte reagent layer disposed on at least a portion of the first working electrode within the first sample-receiving chamber; and

    a second analyte reagent layer disposed on at least a portion of the second working electrode within the second sample-receiving chamber;

    wherein the second sample-receiving chamber overlies the second working electrode, andwherein the second counter/reference electrode layer is exposed to the second sample receiving chamber and configured in an opposing relationship to the second working electrode.

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