Crash sensor and method for processing at least one measuring signal

• US 8,326,581 B2
• Filed: 09/06/2007
• Issued: 12/04/2012
• Est. Priority Date: 10/09/2006
• Status: Active Grant

• Current Assignee: Robert Bosch GmbH
• Original Assignee: Robert Bosch GmbH
• Inventors: Schruellkamp, Michael
• Primary Examiner(s): Khuu, Cindy H
• Assistant Examiner(s): HWANG, TIMOTHY
• Application Number:
  US12/303,516
• Publication Number:
  US 20100010778A1
• Time in Patent Office: 1,916 Days
• Field of Search: 702/189
• US Class Current: 702/189
• CPC Class Codes: B60R 21/01332 by frequency or waveform analysis
• CPC Class Codes: B60R 21/0134 responsive to imminent contact with an obstacle , e.g. using radar systems
• CPC Class Codes: G01D 3/022 having an ideal characteristic, map or correction data stored in a digital memory
• CPC Class Codes: G01D 3/08 with provision for safeguarding the apparatus, e.g. against abnormal operation, against breakdown

Abstract

In a crash sensor and a method for processing a measured value of the crash sensor, at least one measured quantity is detected by a sensor element and a first rewritable memory is provided in which first data for influencing the processing of the at least one measured quantity are stored. In addition, a second hardwired memory is provided in which second data for influencing the processing are stored. A logic module is provided which loads the first or second data, as a function of a test of the first memory, for processing the at least one measured quantity.

Claims

1. A crash sensor, comprising:

a sensor element adapted to detect at least one measured quantity;

a first, rewritable memory storing first data configured to influence a processing of the at least one measured quantity, wherein the first data is stored during at least one of (a) a time of manufacture of the crash sensor, and (b) an adaptation in which the first data is adapted in response to operation of the crash sensor;

a second memory storing second data configured to influence the processing, wherein the second data is stored in a hard-wired manner and differs from the first data with respect to (i) a degree to which the first data and the second data influence an amplification of the at least one measured quantity, and (ii) a degree to which the first data and the second data influence a reference voltage of a circuit on which the crash sensor is located, and wherein the degree of the second data to influence the amplification of the at least one measured quantity and the reference voltage provides for less accurate processing of the at least one measured quantity compared to the first data; and

a logic module configured to load one of (a) the first and (b) the second data to a microcontroller, as a function of a test of the first memory, for processing the at least one measured quantity.

2. The crash sensor according to claim 1, wherein the logic module is configured to perform the test using a check sum.

3. The crash sensor according to claim 1, wherein the crash sensor has a rapid offset regulation for eliminating an offset of the sensor element and a slow offset regulation for eliminating a drift, the logic module being configured to use the rapid offset regulation in an initial power-up phase and the slow offset regulation in a cyclic phase following the power-up phase.

4. The crash sensor according to claim 1, wherein the crash sensor has an interface over which the crash sensor sends a test result.

5. A method for processing at least one measured quantity of a crash sensor, comprising:

detecting the at least one measured quantity;

testing a first, rewritable memory;

loading one of (a) first and (b) second data as a function of the test to a microcontroller, the first data being stored in the first memory and the second data being stored in a hardwired manner in a second memory, wherein;

the first data is stored during at least one of (a) a time of manufacture of the crash sensor, and (b) an adaptation in which the first data is adapted in response to operation of the crash sensor; and

the second data differs from the first data with respect to (i) a degree to which the first data and the second data influence an amplification of the at least one measured quantity, and (ii) a degree to which the first data and the second data influence a reference voltage of a circuit on which the crash sensor is located, and wherein the degree of the second data to influence the amplification of the at least one measured quantity and the reference voltage provides for less accurate processing of the at least one measured quantity compared to the first data; and

influencing the processing of the microcontroller by the loaded one of (a) the first and (b) the second data.

6. The method according to claim 5, wherein the test is performed using a check sum.

7. The method according to claim 5, wherein a transmission of the processed at least one measured value is suppressed for a predefined period of time if the test indicates an error in a cyclic phase.

8. The method according to claim 5, wherein a rapid offset regulation for eliminating an offset of a sensor element is used in an initial power-up phase, and a slow offset regulation for eliminating the drift is used in a cyclic phase following the power-up phase.