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Creating emission images of integrated circuits

  • US 8,331,726 B2
  • Filed: 06/29/2009
  • Issued: 12/11/2012
  • Est. Priority Date: 06/29/2009
  • Status: Expired due to Fees
First Claim
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1. A method of creating an image from a device, comprising:

  • defining a region of interest of the device;

    separating said region of interest into a plurality of overlapping areas;

    computing image acquisition locations for each of said overlapping areas;

    using the computed image acquisition locations to acquire first and second images from first and second areas of the plurality of overlapping areas of the device, said first and second images having overlapping portions;

    using the computed image acquisition locations for estimating said overlapping portions to obtain an approximate shift amount to align approximately said first and second images;

    analyzing said overlapping portions, using a defined cross-correlation algorithm, to calculate a precise shift amount to align the first and second images; and

    using said calculated precise shift amount to join the first and second images together to form a joined image.

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