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Temperature sensing circuit of semiconductor device

  • US 8,342,747 B2
  • Filed: 01/27/2010
  • Issued: 01/01/2013
  • Est. Priority Date: 01/29/2009
  • Status: Active Grant
First Claim
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1. A temperature sensing circuit of a semiconductor device, comprising:

  • a code signal generator configured to output a first count signal having an increase rate that varies according to a change in temperature;

    a comparator configured to receive the first count signal and a control signal, compare the first count signal with the control signal, and output a comparison signal;

    a reference clock generator configured to generate a reference clock having a uniform period regardless of the change in temperature during an activation period of the comparison signal; and

    a final temperature code signal generator configured to count pulses of the reference clock, generate a second count signal, modify the second count signal using an offset value, and output the modified second count signal as a final temperature code signal.

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