Self calibration methods for optical analysis system

• US 8,345,234 B2
• Filed: 03/10/2006
• Issued: 01/01/2013
• Est. Priority Date: 11/28/2005
• Status: Active Grant

• Current Assignee: Halliburton Energy Services Incorporated (Halliburton Company)
• Original Assignee: Halliburton Energy Services Incorporated (Halliburton Company)
• Inventors: Myrick, Michael L., Freese, Robert P., Perkins, David L.
• Primary Examiner(s): Geisel, Kara E
• Application Number:
  US12/094,205
• Publication Number:
  US 20090316150A1
• Time in Patent Office: 2,489 Days
• Field of Search: 356/319, 356/411, 356/435
• US Class Current: 356/300
• CPC Class Codes: G01J 2003/1217 Indexed discrete filters or choppers
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0232 using shutters
• CPC Class Codes: G01J 3/08 Beam switching arrangements
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08
• CPC Class Codes: G01N 21/274 Calibration, base line adjustment, drift correction
• CPC Class Codes: G01N 21/31 Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry G01N21/72 takes precedence

Abstract

Disclosed is a system and methodologies for providing self-calibration in an optical analysis system. Illumination light is directed toward a material to be sampled while provisions are made to modify the characteristics of at least a portion of the illumination light falling on a reference detector. The modified characteristics may include light presence and/or spectral characteristics. Light presence may be modified by rotating or moving mirror assemblies to cause light to fall on either a sample detector or a reference detector while spectral characteristics may be modified by placing materials having known spectral characteristics in the path of the illumination light.

Claims

1. A method for calibrating an optical analysis system, comprising:

providing an illumination light from a source;

providing a sample detector and a reference detector;

providing a mirror between a sample and the combination of the sample detector and the reference detector;

directing the illumination light to the sample in a first measurement, and alternately to the sample detector and the reference detector in a second measurement using the mirror; and

modifying at least one characteristic of the illumination light arriving at the sample detector and reference detector,

establishing a baseline by measuring the illumination light directed by the mirror to the sample detector and the reference detector in the second measurement, for measurements taken by the optical analysis system.

2. The method of claim 1 wherein modifying at least one characteristic of the illumination light comprises modulating the illumination light.

3. The method of claim 2, wherein modulating the illumination light is performed by a photoelastic modulator.

4. The method of claim 2, wherein modulating the illumination light is performed by a chopper wheel.

5. The method of claim 1 wherein modifying at least one characteristic of the illumination light comprises placing a plurality of spectral elements between the source and the sample detector and the reference detector.

6. The method of claim 5 wherein the plurality of spectral elements comprises at least one multivariate optical element (MOE).

7. The method of claim 6 wherein at least one MOE is placed between the source and the sample detector.

8. The method of claim 1 wherein the sample detector and the reference detector are the same and a multivariate optical element (MOE) is placed in front of the detector.

9. A method for calibrating an optical analysis system, comprising the steps of:

providing an illumination light from a source;

providing a sample detector and a reference detector;

providing a mirror between a sample and the combination of the sample detector and the reference detector;

directing the illumination light to the sample in a first measurement, and alternately to the sample detector and the reference detector in a second measurement using the mirror;

providing a chopper wheel having a predetermined number of windows between the illumination source and the mirror to produce a modulation of the light provided by the illumination source; and

establishing a baseline by measuring the illumination light directed by the mirror to the sample detector and reference detector in the second measurement for measurements taken by the optical analysis system.

10. The method of claim 9, where the step of directing the illumination light comprises periodically turning the mirror so that the illumination light is alternately directed to the sample and to the sample detector and the reference detector.

11. The method of claim 9, further comprising the step of placing at least one material having a known spectral characteristic in at least one of the predetermined windows of the chopper wheel.

12. The method of claim 9, further comprising the step of placing at least two materials having known spectral characteristics in at least two separate predetermined windows of the chopper wheel.

13. The method of claim 9 further comprising the step of modifying at least one characteristic of the illumination light arriving at the sample detector and reference detector.

14. The method of claim 13, wherein the step of modifying at least one characteristic of the illumination light comprises placing a light turning element in the chopper wheel.

15. The method of claim 14, wherein the light turning element has a known spectral characteristic.

16. The method of claim 14, further comprising the step of placing at least one known material having a known spectral characteristic in at least one of the predetermined windows of the chopper wheel.

17. The method of claim 14, further comprising the step of placing at least two materials having known spectral characteristics in at least two separate predetermined windows of the chopper wheel.

18. The method of claim 9 wherein the sample detector and the reference detector are the same and a MOE is placed in front of the detector.

19. A self-calibrating optical analysis system, comprising:

an illumination source;

a sample detector and a reference detector;

a mirror between the illumination source and a combination of the sample detector and the reference detector to direct a light provided by the illumination source through a sample in a first measurement and alternately to the sample detector and the reference detector in a second measurement;

a chopper wheel having a predetermined number of windows positioned between the illumination source and the mirror to produce a modulation of the light provided by the illumination source; and

,

whereby a baseline is established by measuring the light from the illumination source directed by the mirror to the sample detector and reference detector in the second measurement for measurements taken by the optical analysis system.

20. The system of claim 19, further comprising a means for turning the mirror so that light from the illumination source is alternately directed to the sample detector and the reference detector.

21. The system of claim 19, further comprising at least one material having a known spectral characteristic placed in at least one of the predetermined windows of the chopper wheel.

22. The system of claim 19, further comprising at least two materials having known spectral characteristics placed in at least two separate predetermined windows of the chopper wheel.

23. The system of claim 19 further comprising a means for modifying at least one characteristic of light arriving at the sample detector and reference detector from the illumination source.

24. The system of claim 23, wherein the means for modifying at least one characteristic of light comprises at least one light turning element positioned in at least one window of the chopper wheel.

25. The system of claim 24, wherein the light turning element has a known spectral characteristic.

26. The system of claim 24, further comprising at least one material having a known spectral characteristic material placed in at least one of the predetermined windows of the chopper wheel.

27. The system of claim 24, further comprising at least two materials having known spectral characteristics placed in at least two separate predetermined windows of the chopper wheel.

28. The system of claim 19 wherein the sample detector and the reference detector are the same and a MOE is placed in front of the detector.

29. A self-calibrating optical analysis system, comprising:

an illumination source;

a sample detector and a reference detector;

a first mirror, and a second mirror placed at a distance from the first mirror, the first mirror and the second mirror placed between a sample and the combination of the sample detector and the reference detector to direct a light provided by the illumination source through the sample in a first measurement, and alternately to the sample detector and the reference detector in a second measurement;

a chopper wheel having a predetermined number of windows positioned between the illumination source and the first mirror to produce a modulation of the light provided by the illumination source;

wherein

a baseline is established by measuring the light from the illumination source directed to the sample detector and reference detector in the second measurement for measurements taken by the optical analysis system; and

further wherein

at least one light turning element is positioned in at least one window of the chopper wheel, wherein light from the illumination source may be directed by the at least one light turning element to said reference detector by way of the second mirror when the at least one window of the chopper wheel is placed between the illumination source and the first mirror.

30. The system of claim 29, further comprising a housing wherein the illumination source, the chopper wheel and the second mirror are separated from the first mirror, the sample detector and the reference detector.

31. A method for calibrating an optical analysis system, comprising:

placing an optical element between a sample and a combination of a sample detector and a reference detector;

directing, with the optical element, a light provided by an illumination source through the sample in a first measurement and alternately to the sample detector and the reference detector in a second measurement;

modifying at least one characteristic of the light arriving at the sample detector and reference detector from the illumination source; and

establishing a baseline by measuring the light from the illumination source to the sample detector and the reference detector in the second measurement, for measurements taken by the optical analysis system.

32. A method for calibrating an optical analysis system, comprising the steps of:

placing an optical element between a sample and a combination of a sample detector and a reference detector;

directing, with the optical element an illumination, light to the sample in a first measurement and alternately to the sample detector and the reference detector in a second measurement;

modulating the illumination light using a chopper wheel having a predetermined number of windows,

establishing a baseline by measuring the illumination light directed to the sample detector and reference detector in the second measurement for measurements taken by the optical analysis system.

33. The method of claim 32 wherein directing the illumination light comprises:

coupling a first mirror to a second mirror;

directing the illumination light via the first mirror through the sample in the first measurement;

displacing the coupled first mirror and second mirror so that the illumination light is directed via the second mirror to the sample detector and the reference detector in the second measurement.

34. The method of claim 33 wherein the sample detector and the reference detector are the same and a MOE is placed in front of the detector.

35. A self-calibrating optical analysis system, comprising:

a sample detector and a reference detector;

an optical element placed between a sample and a combination of the sample detector and the reference detector;

a source providing an illumination light to the sample in a first measurement and alternately providing the illumination light to the sample detector and the reference detector in a second measurement with the optical element; and

a chopper wheel having a predetermined number of windows positioned between the source and the sample detector and the reference detector to produce a modulation of the illumination light,

wherein a baseline is established by measuring the light from the source provided to the sample detector and reference detector in the second measurement for measurements taken by the optical analysis system.

36. The system of claim 35, wherein the optical element comprises:

a first mirror disposed between the source and the combination of the sample detector and the reference detector; and

a second mirror coupled to the first mirror, and wherein displacement of the coupled first mirror and the second mirror alternately directs the illumination light from the first mirror to the sample in the first measurement and from the second mirror to the sample detector and the reference detector in the second measurement.

37. The system of claim 36 wherein the sample detector and the reference detector are the same and a MOE is placed in front of the detector.