Voltage reference and temperature sensor
First Claim
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1. Apparatus for providing a voltage reference, the apparatus comprising:
- a semiconductor device;
current means selectively and alternatively passing a first current or a second current, the second current smaller in magnitude than the first current, through the semiconductor device;
first measurement means measuring a first voltage drop across the semiconductor device during the passing of the first current;
second measurement means measuring a second voltage drop across the semiconductor device during the passing of the second current;
calculation means responsive to the first voltage drop and to the second voltage drop, yielding a voltage reference.
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Abstract
A highly accurate voltage reference and temperature sensor circuit requires only several low-cost components in addition to a general-purpose microcontroller with an analog-to-digital converter. Unlike known circuits, the circuit disclosed does not rely on matching between a pair of semiconductor devices, as only a single semiconductor junction is used. All of the signal processing may be performed digitally.
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Citations
12 Claims
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1. Apparatus for providing a voltage reference, the apparatus comprising:
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a semiconductor device; current means selectively and alternatively passing a first current or a second current, the second current smaller in magnitude than the first current, through the semiconductor device; first measurement means measuring a first voltage drop across the semiconductor device during the passing of the first current; second measurement means measuring a second voltage drop across the semiconductor device during the passing of the second current; calculation means responsive to the first voltage drop and to the second voltage drop, yielding a voltage reference. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method for providing a voltage reference, the method comprising the steps of:
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passing a first current through a semiconductor device, and measuring a first voltage drop across the semiconductor device during the passing of the first current;
passing a second current through the semiconductor device, the second current smaller in magnitude than the first current, and measuring a second voltage drop across the semiconductor device during the passing of the second current; andcarrying out a calculation responsive to the first voltage drop and to the second voltage drop, yielding information indicative of a voltage reference. - View Dependent Claims (11, 12)
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Specification