Method for generating high resolution surface topology map using surface profiling and surveying instrumentation

• US 8,352,189 B2
• Filed: 03/23/2009
• Issued: 01/08/2013
• Est. Priority Date: 02/02/2009
• Status: Active Grant

• Current Assignee: Surface Systems & Instruments, Inc.
• Original Assignee: Surface Systems & Instruments, Inc.
• Inventors: Scott, Dennis P., Day, Dwight D.
• Primary Examiner(s): LE, TOAN M
• Application Number:
  US12/409,329
• Publication Number:
  US 20100198517A1
• Time in Patent Office: 1,387 Days
• Field of Search: 702/5, 702 1- 2, 702/14, 702/16, 702/33, 702/81, 702/84, 702/127, 702141-142, 702149-160, 702/179, 702182-183, 702188-189, 703/5, 703/7, 701/2, 701/23, 701 25- 26
• US Class Current: 702/5
• CPC Class Codes: G01C 15/00 Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
• CPC Class Codes: G01C 21/1652 with ranging devices, e.g. LIDAR or RADAR

Abstract

A method for generating a high-resolution surface topology map of a surface using surface profiling data combined with data collected from a surveying instrument. The system and method involve collecting a plurality of survey sample points and collecting a plurality of profile sample points of the surface. The profile sample points are then correlated with the survey sample points in the Z direction. Once the correlation is performed, the correlated profile sample points are merged or “filled-in” between the survey sample points. The high-resolution surface topology map is generated from the merging of the survey and profile sample points. In various embodiments, the survey data may be generated using an inertial profiler, an inclinometer based walking device, or a rolling-reference type profile device.

Claims

1. A method for generating a surface topology map of a surface, comprising:

collecting a plurality of survey sample points of the surface from a surveying instrument;

collecting a plurality of profile sample points of the surface from a profiler device;

correlating on a data processing device the profile sample points with the survey sample points in the Z direction;

merging on the data processing device the plurality of survey sample points and the correlated profile sample points; and

generating, with the data processing device, the surface topology map of the surface from the merged plurality of survey sample points and the correlated profile sample points.

2. The method of claim 1, wherein each of the plurality of survey sample points defines a latitude, longitude, and elevation reading of a sampled location on the surface.

3. The method of claim 1, wherein each of the plurality of profile sample points defines an height reading of a sampled location on the surface.

4. The method of claim 1, further comprising indexing the plurality of survey sample points to the plurality of profile sample points respectively.

5. The method of claim 4, wherein the plurality of survey sample points and the plurality of profile sample points are indexed by one of the following:

(i) indexed by the time the survey sample points were collected relative to the time the profile sample points were collected;

(ii) indexed by location on the surface;

or

(iii) both (i) and (ii).

6. The method of claim 1, wherein collecting the plurality of survey sample points and collecting the plurality of profile sample points further comprises:

roving a profiler device over the surface;

collecting the plurality of profile sample points as the profiler device roves over the surface; and

receiving the plurality of survey sample points from a surveying instrument located on or proximity to the surface.

7. The method of claim 6, further comprising reconciling the collected plurality of profile sample points with the received plurality of survey sample points from the surveying instrument.

8. The method of claim 6, wherein receiving the plurality of survey sample points from the surveying instrument further comprises:

ascertaining a latitude, longitude, and elevation reading for each of the plurality of survey sample points at the surveying instrument as the profiling device roves across the surface; and

transmitting the ascertained latitude, longitude, and elevation readings for the plurality of survey sample points from the survey instrument to the roving profiler device.

9. The method of claim 8, wherein the survey instrument is a total stations device.

10. The method of claim 8, wherein the total stations device is used in cooperation with either a VRS or GPS system.

11. The method of claim 6, wherein receiving the plurality of survey sample points further comprises:

collecting the plurality of survey sample points at the profiler device as the profiler device roves over the surface, each of the plurality of survey sample points defining a latitude, longitude, and elevation reading of the surface;

receiving a correction factor signal at the profiler device as the plurality of survey sample points are collected; and

compensating at least the elevation readings of the plurality of survey sample points in response to the received corrections factor signal.

12. The method of claim 11, further comprising collecting the plurality of survey sample points and the plurality of profile sample points at the roving profiler device at substantially the same time as the profiler device roves across the surface.

13. The method of claim 12, wherein the plurality of survey sample points and the plurality of profile sample points are collected along a first longitudinal track traveled by the roving profiler device.

14. The method of claim 11, wherein receiving the corrections factor signal further comprises receiving the corrections factor signal from a Real Time Kinemetic (RTK) surveying device located on or proximity of the surface.

15. The method of claim 14, wherein the RTK surveying instrument operates in cooperation with either a Virtual Reference Station (VRS)or GPS system when generating the corrections factor signal.

16. The method of claim 6, wherein roving the profiler device over the surface further comprising mounting the profiler device onto a vehicle and driving the vehicle over the surface, wherein the profiling device is an inertial profiling device.

17. The method of claim 6, wherein roving the profiler device further comprising walking the profiler device over the surface, wherein the profiler device is an inclinometer based walking profiler device.

18. The method of claim 12, further comprising:

collecting the plurality of survey sample points along a first longitudinal track and a second longitudinal track as the profiler device roves across the surface; and

compensating for tilt of the profiler device between the first longitudinal track and the second longitudinal track as the profiler device roves across the surface.

19. The method of claim 1, wherein merging the plurality of survey sample points and the correlated profile sample points further comprises mathematically filling in the correlated profile sample points between the survey sample points respectively.

20. The method of claim 1, further comprising

collecting the plurality of survey sample points at a first sampling frequency;

and

collecting the plurality of profile sample points at a second sampling frequency, wherein the second sampling frequency is greater than the first sampling frequency.

21. The method of claim 20, wherein correlating the profile sample points with the survey sample points in the Z direction further comprises indexing each of the plurality of survey sample points to a corresponding one of the plurality of profile sample points respectively.

22. The method of claim 21, further comprising computing a correction factor for each of the plurality of survey sample respectively.

23. The method of claim 22, wherein the corrections factor is computed by generating a drift model between each of the plurality of survey sample points relative to the corresponding one of the plurality of profile sample points respectively.

24. The method of claim 23, wherein generating the drift model further comprises selecting a set of (N) survey sample points to build the model.

25. The method of claim 24, wherein (N) is initially set to the first 4 survey sample points.

26. The method of claim 24, wherein the drift model is computed by:

(a) computing the elevation difference between the (N) survey sample points and the corresponding indexed profile sample points respectively; and

(b) computing the drift model between the (N) sample points and the corresponding indexed profile sample points by using a fitting equation that relates drift to distance.

27. The method of claim 26, wherein using the fitting equation that relates drift to distance further comprises:

(c) creating a Vandermonde matrix for the (N) survey sample points, the Vandermonde matrix including the second power, the first power and the zero power of the corresponding indexed profile sample points of the (N) survey sample points respectively; and

(d) performing a Moore-Penrose inverse of the Vandermonde matrix;

(e) multiplying the Moore-Penrose inverse as a Matrix with the computed differences between the (N) survey sample points and the corresponding indexed profile sample points as a vector; and

(f) defining from the results of the multiplication of (e) an equation for drift for the indexed profile sample points corresponding to the indexed (N) survey sample points respectively.

28. The method of claim 27, further comprising:

(g) computing a correction for drift versus distance for a first profile sample point corresponding to the (N) survey sample points from the equation defined in (f); and

(h) adding the computed correction of (g) to the height reading of the first profile sample point.

29. The method of claim 28, further comprising:

(i) incrementing the first profile sample point to the next profile sample point;

(j) repeating (g) and (h) for the incremented profile sample point; and

(k) repeating (j) for each incremented profile survey point until the incremented profile sample points exceeds a midpoint range of the profile sample points corresponding to the (N) survey sample points respectively.

30. The method of claim 29, further comprising after the midpoint range of the profile sample points is exceeded:

(l) selecting a new set of (N) survey sample points by removing the lowest indexed survey sample point from the previous (N) survey points and including the next indexed survey sample point to the new set of (N) survey sample points; and

(m) repeating (a) through (k) for the profile sample points corresponding to the new set of (N) survey sample points respectively.

31. The method of claim 30, further comprising:

(n) repeating (l) and (m) until the last survey sample point.

32. The method of claim 31, wherein generating the surface topology map of the surface from the merged plurality of survey sample points and the correlated profile sample points further comprises:

generating the surface topology map of the surface from the plurality of survey sample points and the computed correction of the height reading of the correlated profile sample points after performing (n).

33. The method of claim 23, wherein generating the drift model further comprises selecting an algebraic order of (M), where (M) is set to 2.

34. The method of claim 23, wherein the drift model is generated between each of the plurality of survey sample points relative to the corresponding one of the plurality of profile sample points as a function of distance respectively.

35. The method of claim 1, further comprising using the surface topology map of the surface for one or more of the following:

(i) construction project planning;

(ii) project design;

(iii) site preparation;

(iv) construction project bid preparation; and

(v) construction project progress and/or evaluation.

36. The method of claim 1, further comprising using the surface topology map for surface preparation of the mapped surface by using the surface topology map to at least partially control the machinery used to prepare the surface.

37. The method of claim 1, wherein the Z direction is a height reading.