Package of MEMS device and method for fabricating the same
First Claim
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1. A method for fabricating a package of a micro-electro-mechanical systems (MEMS) device, the method comprising:
- forming a MEMS device wafer, the forming of the MEMS device wafer comprising forming a first array mark, the formed MEMS device wafer comprising first outer pads adjacent to the formed first array mark;
forming a cap wafer, the forming of the cap wafer comprising forming a second array mark corresponding to the first array mark, the formed cap wafer comprising bonding bumps, array bumps respectively corresponding to the first outer pads, and inner interconnection lines configured to respectively couple the array bumps to the bonding bumps;
bonding the formed cap wafer to the formed MEMS device wafer based on the formed second array mark corresponding to the formed first array mark and the array bumps respectively corresponding to the first outer pads;
removing the formed second array mark from the bonded cap wafer, the removing of the formed second array mark comprising removing a portion of the cap wafer that is not bonded to the MEMS device wafer; and
removing the formed first array mark from the bonded MEMS device wafer, the removing of the formed first array mark comprising removing a portion of the MEMS device wafer that is not bonded to the cap wafer.
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Abstract
A package of a micro-electro-mechanical systems (MEMS) device includes a cap wafer, a plurality of bonding bumps formed over the cap wafer, a plurality of array bumps arrayed on an outer side of the bonding bumps, and an MEMS device wafer over which a plurality of first outer pads are formed corresponding to the array bumps, wherein the array bumps are bonded to the respective outer pads when the cap wafer and the MEMS device wafer are bonded together.
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Citations
18 Claims
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1. A method for fabricating a package of a micro-electro-mechanical systems (MEMS) device, the method comprising:
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forming a MEMS device wafer, the forming of the MEMS device wafer comprising forming a first array mark, the formed MEMS device wafer comprising first outer pads adjacent to the formed first array mark; forming a cap wafer, the forming of the cap wafer comprising forming a second array mark corresponding to the first array mark, the formed cap wafer comprising bonding bumps, array bumps respectively corresponding to the first outer pads, and inner interconnection lines configured to respectively couple the array bumps to the bonding bumps; bonding the formed cap wafer to the formed MEMS device wafer based on the formed second array mark corresponding to the formed first array mark and the array bumps respectively corresponding to the first outer pads; removing the formed second array mark from the bonded cap wafer, the removing of the formed second array mark comprising removing a portion of the cap wafer that is not bonded to the MEMS device wafer; and removing the formed first array mark from the bonded MEMS device wafer, the removing of the formed first array mark comprising removing a portion of the MEMS device wafer that is not bonded to the cap wafer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A method for fabricating a package of a micro-electro-mechanical systems (MEMS) device, the method comprising:
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forming a MEMS device wafer, the forming of the MEMS device wafer comprising forming a first array mark, the formed MEMS device wafer comprising first outer pads adjacent to the formed first array mark; forming a cap wafer, the forming of the cap wafer comprising forming a second array mark corresponding to the first array mark, the formed cap wafer comprising bonding bumps, array bumps respectively corresponding to the first outer pads, and inner interconnection lines configured to respectively couple the array bumps to the bonding bumps; forming a sealing line between the bonding bumps and the array bumps to encompass the bonding bumps; bonding the formed cap wafer to the formed MEMS device wafer based on the formed second array mark corresponding to the formed first array mark and the array bumps respectively corresponding to the first outer pads; removing the formed second array mark from the bonded cap wafer, the removing of the formed second array mark comprising removing a portion of the cap wafer that is not bonded to the MEMS device wafer; and removing the formed first array mark from the bonded MEMS device wafer, the removing of the formed first array mark comprising removing a portion of the MEMS device wafer that is not bonded to the cap wafer.
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Specification