Method for fast, robust, multi-dimensional pattern recognition
First Claim
1. An apparatus for inspecting a found instance of a pattern in an image, the apparatus comprising:
- a training module computer program, on a data processing device, configured to receive a training image, and provide a model pattern, the model pattern including a geometric description of the expected shape of the object, the geometric description including a plurality of probes, each probe having a position with respect to the model pattern at which at least one test is to be performed upon an image at a found pose of the model pattern, each such test contributing evidence for inspection; and
a run-time module computer program, on a data processing device, configured to receive;
the model pattern,a list of generalized degrees-of-freedom (DOFs), anda run-time image,the run-time module computer program is further configured to provide a list of results, each result of the list of results containing a match score and individual probe rating information for inspection purposes.
4 Assignments
0 Petitions
Accused Products
Abstract
Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.
259 Citations
16 Claims
-
1. An apparatus for inspecting a found instance of a pattern in an image, the apparatus comprising:
-
a training module computer program, on a data processing device, configured to receive a training image, and provide a model pattern, the model pattern including a geometric description of the expected shape of the object, the geometric description including a plurality of probes, each probe having a position with respect to the model pattern at which at least one test is to be performed upon an image at a found pose of the model pattern, each such test contributing evidence for inspection; and a run-time module computer program, on a data processing device, configured to receive; the model pattern, a list of generalized degrees-of-freedom (DOFs), and a run-time image, the run-time module computer program is further configured to provide a list of results, each result of the list of results containing a match score and individual probe rating information for inspection purposes. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
-
-
15. An apparatus for inspecting a found instance of a pattern in an image, the apparatus comprising:
-
a training module including a data processing device configured to receive a training image, and provide a model pattern, the model pattern including a geometric description of the expected shape of the object, the geometric description including a plurality of probes, each probe having a position with respect to the model pattern at which at least one test is to be performed upon an image at a found pose of the model pattern, each such test contributing evidence for inspection; and a run-time module including a data processing device configured to receive; the model pattern, a list of generalized degrees-of-freedom (DOFs), and a run-time image, the data processing device included in the run-time module is further configured to provide a list of results, each result of the list of results containing a match score and individual probe rating information for inspection purposes. - View Dependent Claims (16)
-
Specification