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Wafer-level semiconductor device packages with electromagnetic interference shielding

  • US 8,378,466 B2
  • Filed: 11/19/2009
  • Issued: 02/19/2013
  • Est. Priority Date: 11/19/2009
  • Status: Active Grant
First Claim
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1. A semiconductor package, comprising:

  • a die having an active surface;

    a package body encapsulating die, the package body including an upper surface, a lower surface, and lateral surfaces disposed adjacent to a periphery of the package body, the lower surface of the package body and the active surface of the die defining a front surface;

    a redistribution layer disposed on the front surface, the redistribution layer including lateral surfaces disposed adjacent to a periphery of the redistribution layer and a grounding element, the grounding element including a connection surface that is electrically exposed adjacent to at least one of the lateral surfaces of the redistribution layer; and

    an electromagnetic interference shield disposed adjacent to the upper surface of the package body and the lateral surfaces of the package body, and extending along at least one of the lateral surfaces of the redistribution layer for electrical connection to the connection surface of the grounding element;

    wherein the grounding element provides an electrical pathway to ground electromagnetic emissions incident upon the electromagnetic interference shield.

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