Active matrix liquid crystal device

• US 8,378,954 B2
• Filed: 03/23/2007
• Issued: 02/19/2013
• Est. Priority Date: 03/23/2006
• Status: Expired due to Fees

• Current Assignee: Sharp Kabushiki Kaisha (Hon Hai Precision Industry Co., Ltd.)
• Original Assignee: Sharp Kabushiki Kaisha (Hon Hai Precision Industry Co., Ltd.)
• Inventors: Brown, Christopher J.
• Primary Examiner(s): PHAM, VIET DAVID
• Application Number:
  US12/225,093
• Publication Number:
  US 20090102780A1
• Time in Patent Office: 2,160 Days
• Field of Search: 345 87-101
• US Class Current: 345/101
• CPC Class Codes: G09G 2320/041 Temperature compensation
• CPC Class Codes: G09G 3/3614 Control of polarity reversal in general
• CPC Class Codes: G09G 3/3648 using an active matrix G09G3/367 - G09G3/3696 take precedence

Abstract

An active matrix liquid crystal device comprises an active matrix substrate (1) and a counter electrode substrate separated by a layer of liquid crystal material. A temperature sensing capacitor (11) comprises electrodes on the substrates separated by the liquid crystal layer, which thus forms the dielectric of the capacitor. A reference capacitor (C_REF) and a calibration capacitor (C_CAL) are also provided and have nominally the same capacitance. These capacitors form part of charge-transfer capacitance measuring branches (25, 26, 30) within a sample/hold circuit (12). During a calibration cycle, the sample/hold circuit (12) provides a signal dependent on the difference between the capacitances of the calibration capacitor (C_CAL) and the reference capacitor (C_REF) and this is supplied to an analog/digital converter (20-22, 31, 32), which forms a reference voltage. During subsequent parts of the measurement cycle, the converter converts the output of the sample/hold circuit using the reference voltage in order to improve the accuracy of measurement of the liquid crystal capacitor (11), and hence the temperature of the liquid crystal material. This temperature measurement may be used, for example, to compensate the AMLCD for the effects of temperature variation in the liquid crystal properties.

Claims

1. An active matrix liquid crystal device comprising:

an active matrix first substrate having an active matrix area;

a second substrate carrying a common electrode for the active matrix;

a layer of liquid crystal material between the first and second substrates;

a temperature sensing first capacitor comprising a first electrode outside the image generating region of the active matrix area on the first substrate separated from the common electrode, which forms a second electrode of the first capacitor, by the liquid crystal layer, which forms the first capacitor dielectric; and

a capacitance measuring circuit arranged, during operation of the active matrix, (i) repeatedly to perform the steps of precharging the first capacitor to a substantially fixed stable known first precharge voltage magnitude and forming a signal representing the capacitance of the first capacitor, (ii) to measure the capacitance of the first capacitor in synchronism with addressing of at least one of a plurality of rows included in a pixel matrix, and (iii) to charge the first capacitor to the same magnitude of voltage during each precharging step.

2. A device as claimed in claim 1, in which the measuring circuit is formed on the first substrate.

3. A device as claimed in claim 1, in which measuring circuit is arranged to charge the first capacitor to the same polarity of voltage during each precharging step.

4. A device as claimed in claim 1, in which the measuring circuit is arranged to perform each precharging step at a same part of an active matrix addressing cycle.

5. A device as claimed in claim 4, in which the same part comprises the same part of a line addressing period.

6. A device as claimed in claim 1, in which the active matrix and the common electrode are arranged periodically to invert the polarity of drive voltages applied to pixel cells of the device.

7. A device as claimed in claim 3, in which the active matrix and the common electrode are arranged to invert the polarity during alternate line addressing periods.

8. A device as claimed in claim 7, in which the measuring circuit is arranged to perform the precharging step during alternate line addressing periods.

9. A device as claimed in claim 1, in which the forming step measures the charge stored in the first capacitor during the precharging step.

10. A device as claimed in claim 9, in which the measuring circuit is arranged to measure the stored charge by charge-sharing.

11. A device as claimed in claim 10, in which the measuring circuit is arranged, during each forming step of a first part of a conversion cycle, to share the stored charge with a transfer second capacitor during a first forming phase, and to make the first resulting voltage across the second capacitor available during a second forming phase.

12. A device as claimed in claim 11, in which the measuring circuit is arranged to charge a reference third capacitor to a second precharge voltage during the precharging step, to share the stored charge with a transfer fourth capacitor during the first forming phase, and to make the second resulting voltage across the fourth capacitor available during the second forming phase.

13. A device as claimed in claim 12, in which the third capacitor has a value less than or equal to a lowest-expected value of the first capacitor.

14. A device as claimed in claim 12, comprising means for forming the difference between the first and second resulting voltages.

15. A device as claimed in claim 14, in which the means comprises a summation fifth capacitor arranged to be connected temporarily between the second and fourth capacitors.

16. A device as claimed in claim 14, in which the means comprises a differential input of a following stage.

17. A device as claimed in claim 1, in which the measuring circuit comprises an analog/digital converter.

18. A device as claimed in claim 17, in which the converter is an integrating converter.

19. A device as claimed in claim 18, in which the converter is a dual-slope converter.

20. A device as claimed in claim 12, in which the measuring circuit comprises a dual-slope analog/digital converter and is arranged, during each of repeated discharge cycles of a second part of the conversion cycle, to charge a discharge fifth capacitor to a third precharge voltage during a third phase, to share the stored change with a transfer sixth capacitor during a fourth phase, and to make the third resulting voltage across the sixth capacitor available during a fifth phase.

21. A device as claimed in claim 20, in which the measuring circuit is arranged to charge the third capacitor to a fourth precharge voltage during the third phase, to share the stored charge with the fourth capacitor during the fourth phase, and to make the fourth resulting voltage across the fourth capacitor available during the fifth phase.

22. A device as claimed in claim 21, in which the fifth capacitor has a value less than that of the third capacitor.

23. A device as claimed in claim 1, in which at least one said precharge voltage is derived from a complement of a voltage on the common electrode.

24. A device as claimed in claim 1, in which at least one said precharge voltage is derived from a matrix element drive voltage.

25. A device as claimed in claim 12, in which the measuring circuit is arranged, during each of repeated calibration cycles of an initial part of the conversion cycle, to charge a calibration fifth capacitor to a fifth precharge voltage during a sixth phase, to share the stored charge with a transfer sixth capacitor during a seventh phase, and to make the fifth resulting voltage across the transfer sixth capacitor available during an eighth phase.

26. A device as claimed in claim 25, in which the measuring circuit is arranged to charge the third capacitor to a sixth precharge voltage during the sixth phase, to share the stored charge with the fourth capacitor during the seventh phase, and to make the sixth resulting voltage across the fourth capacitor available during the eighth phase.

27. A device as claimed in claim 25, in which the measuring circuit comprises a reference voltage generator for generating a reference voltage from the fifth resulting voltage.

28. A device as claimed in claim 27, in which the generator comprises a seventh capacitor arranged to integrate the fifth resulting voltages from the calibration cycles.

29. A device as claimed in claim 20, in which the measuring circuit is arranged, during each of repeated calibration cycles of an initial part of the conversion cycle, to charge a calibration seventh capacitor to a fifth precharge voltage during a sixth phase, to share the stored charge with a transfer eighth capacitor during a seventh phase, and to make the fifth resulting voltage across the eighth capacitor available during an eighth phase.

30. A device as claimed in claim 29, in which the measuring circuit comprises a reference voltage generator for generating a reference voltage from the fifth resulting voltage.

31. A device as claimed in claim 30, in which the generator is arranged to supply the reference voltage to a comparator of the converter during the second part of the conversion cycle.

32. A device as claimed in claim 1, in which the signal representing the capacitance provides a measure of the liquid crystal material temperature.

33. A device as claimed in claim 32, comprising an arrangement, responsive to the measure of the liquid crystal material temperature, for supplying temperature-compensated drive signals to the cells of the matrix.