System and method for optical sensor interrogation
First Claim
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1. An optical sensor-interrogation system comprising:
- a multi-frequency optical source configured to generate an optical interrogation signal;
at least one optical sensor configured to filter light at a wavelength corresponding to a value of a sensed parameter and generate an optical sensor data signal;
a photodetector configured to detect a reference signal and the optical sensor data signal and generate an electrical difference frequency signal corresponding to a wavelength difference between the reference signal and the optical sensor data signal; and
an electrical frequency measurement module configured to measure the electrical difference frequency.
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Abstract
An optical sensor interrogation system comprises: a multi-frequency optical source configured to generate an optical interrogation signal, at least one optical sensor configured to filter light at a wavelength corresponding to a value of a sensed parameter and generate an optical sensor data signal, a photodetector configured to detect a reference signal and the optical sensor data signal and generate an electrical difference frequency signal corresponding to a wavelength difference between the reference signal and the optical sensor data signal, and an electrical frequency measurement module configured to measure the electrical difference frequency.
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Citations
27 Claims
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1. An optical sensor-interrogation system comprising:
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a multi-frequency optical source configured to generate an optical interrogation signal; at least one optical sensor configured to filter light at a wavelength corresponding to a value of a sensed parameter and generate an optical sensor data signal; a photodetector configured to detect a reference signal and the optical sensor data signal and generate an electrical difference frequency signal corresponding to a wavelength difference between the reference signal and the optical sensor data signal; and an electrical frequency measurement module configured to measure the electrical difference frequency. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. An optical sensor-interrogation system comprising:
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a laser source configured to generate an optical interrogation signal; at least one optical sensor configured to filter light at a wavelength corresponding to a value of a sensed parameter and generate an optical sensor data signal; at least one reference sensor configured to filter light at a wavelength corresponding to a value of a reference parameter and generate a reference signal; a photodetector configured to detect the reference signal and the optical sensor data signal and generate an electrical difference frequency signal corresponding to a wavelength difference between the reference signal and the optical sensor data signal; and an electrical frequency measurement module configured to measure the electrical difference frequency, wherein the electrical frequency measurement module comprises a series of narrow band filters. - View Dependent Claims (12, 13, 14, 15)
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16. A method for optical sensor interrogation and measurement comprising:
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interrogating at least one optical sensor via a multi-frequency optical interrogation signal, the at least one optical sensor configured to filter light at a wavelength corresponding to value of a sensed parameter to generate an optical sensor data signal; detecting a reference signal and the optical sensor data signal via a single broadband photodetector, the photodetector generating an electrical difference frequency signal corresponding to the wavelength difference between the reference signal and the optical sensor data signal; and measuring electrical frequency of the difference frequency signal. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27)
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Specification