×

Method for manufacturing semiconductor device

  • US 8,389,326 B2
  • Filed: 06/13/2012
  • Issued: 03/05/2013
  • Est. Priority Date: 06/30/2009
  • Status: Active Grant
First Claim
Patent Images

1. A method for manufacturing a display device comprising the steps of:

  • forming a gate insulating film over a gate electrode;

    forming an oxide semiconductor layer over the gate insulating film;

    performing a heat treatment at a temperature higher than or equal to 400°

    C. on the oxide semiconductor layer and then cooling the oxide semiconductor layer in an atmosphere containing oxygen;

    forming a source electrode and a drain electrode over the oxide semiconductor layer after the step of heating;

    forming an oxide insulating film over the gate insulating film, the oxide semiconductor layer, the source electrode, and the drain electrode;

    forming an insulating layer over the oxide insulating film; and

    forming an electrode for a display element over the insulating layer, the electrode electrically connected to the source electrode or the drain electrode,wherein the oxide insulating film is in contact with part of the oxide semiconductor layer.

View all claims
  • 0 Assignments
Timeline View
Assignment View
    ×
    ×