Optical imaging writer system
First Claim
1. A method for processing image data in a lithography manufacturing process, comprising:
- providing a parallel imaging writer system, wherein the parallel imaging writer system includes a plurality of spatial light modulator (SLM) imaging units arranged in one or more parallel arrays, and wherein each of the plurality of SLM imaging units includes one or more illumination sources, one or more alignment sources, one or more projection lenses, and a plurality of micro mirrors configured to project light from the one or more illumination sources to the corresponding one or more projection lens, and wherein each SLM imaging unit is individually controlled;
receiving a mask data pattern to be written to a substrate;
processing the mask data pattern to form a plurality of partitioned mask data patterns corresponding to different areas of the substrate;
identifying one or more objects in an area of the substrate to be imaged by corresponding SLMs; and
performing multiple exposures to image the one or more objects in the area of the substrate by controlling the plurality of SLMs to write the plurality of partitioned mask data patterns in parallel.
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Abstract
System and method for applying mask data patterns to substrate in a lithography manufacturing process are disclosed. In one embodiment, the method includes providing a parallel imaging writer system which has a plurality of spatial light modulator (SLM) imaging units arranged in one or more parallel arrays, receiving a mask data pattern to be written to a substrate, processing the mask data pattern to form a plurality of partitioned mask data patterns corresponding to different areas of the substrate, identifying one or more objects in an area of the substrate to be imaged by corresponding SLMs, and controlling the plurality of SLMs to write the plurality of partitioned mask data patterns in parallel by performing multiple exposures to image the one or more objects in the area of the substrate.
51 Citations
20 Claims
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1. A method for processing image data in a lithography manufacturing process, comprising:
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providing a parallel imaging writer system, wherein the parallel imaging writer system includes a plurality of spatial light modulator (SLM) imaging units arranged in one or more parallel arrays, and wherein each of the plurality of SLM imaging units includes one or more illumination sources, one or more alignment sources, one or more projection lenses, and a plurality of micro mirrors configured to project light from the one or more illumination sources to the corresponding one or more projection lens, and wherein each SLM imaging unit is individually controlled; receiving a mask data pattern to be written to a substrate; processing the mask data pattern to form a plurality of partitioned mask data patterns corresponding to different areas of the substrate; identifying one or more objects in an area of the substrate to be imaged by corresponding SLMs; and performing multiple exposures to image the one or more objects in the area of the substrate by controlling the plurality of SLMs to write the plurality of partitioned mask data patterns in parallel. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system for processing image data in a lithography manufacturing process, comprising:
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a parallel imaging writer system, wherein the parallel imaging writer system includes a plurality of spatial light modulator (SLM) imaging units arranged in one or more parallel arrays, and wherein each of the plurality of SLM imaging units includes one or more illumination sources, one or more alignment sources, one or more projection lenses, and a plurality of micro mirrors configured to project light from the one or more illumination sources to the corresponding one or more projection lens, and wherein each SLM imaging unit is individually controlled; a controller configured to control the plurality of SLM imaging units, wherein the controller includes logic for receiving a mask data pattern to be written to a substrate; logic for processing the mask data pattern to form a plurality of partitioned mask data patterns corresponding to different areas of the substrate; logic for identifying one or more objects in an area of the substrate to be imaged by corresponding SLMs; and logic for performing multiple exposures to image the one or more objects in the area of the substrate by controlling the plurality of SLMs to write the plurality of partitioned mask data patterns in parallel. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification