Method and apparatus for automatic application and monitoring of a structure to be applied onto a substrate
First Claim
Patent Images
1. A method for automatic application and monitoring of a structure to be applied onto a substrate, the method comprising:
- determining a reference contour by utilizing a first camera in a leading direction to record a plurality of images;
regulating the progression of the structure to be applied according to the reference contour;
guiding an application facility based on the images recorded by the first camera;
applying the structure onto the substrate by the application facility according to the reference contour determined by the first camera; and
monitoring the structure applied onto the substrate by the application facility utilizing a second camera in trailing direction;
wherein the method is performed such that the cameras have an overlapping area on a circular line, a segment of the circular line is assigned to images of each camera, at least one of the reference contour and the applied structure progresses relative to the cameras from one camera to the next camera, and an automatic switch is made when the applied structure or the reference contour progresses relative to the cameras from the segment of the circular line of one camera via the overlapping area to the segment of the circular line of another camera.
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Abstract
A method and apparatus are provided for automatic application and monitoring of a structure to be applied onto substrate. A plurality of cameras positioned around an application facility are utilized to monitor the automatic application of a structure on a substrate by means of a stereometry procedure. Three-dimensional recognition of a reference contour position results in the overlapping area to be used for gross adjustment of the application facility prior to applying the structure.
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Citations
45 Claims
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1. A method for automatic application and monitoring of a structure to be applied onto a substrate, the method comprising:
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determining a reference contour by utilizing a first camera in a leading direction to record a plurality of images; regulating the progression of the structure to be applied according to the reference contour; guiding an application facility based on the images recorded by the first camera; applying the structure onto the substrate by the application facility according to the reference contour determined by the first camera; and monitoring the structure applied onto the substrate by the application facility utilizing a second camera in trailing direction; wherein the method is performed such that the cameras have an overlapping area on a circular line, a segment of the circular line is assigned to images of each camera, at least one of the reference contour and the applied structure progresses relative to the cameras from one camera to the next camera, and an automatic switch is made when the applied structure or the reference contour progresses relative to the cameras from the segment of the circular line of one camera via the overlapping area to the segment of the circular line of another camera. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 43, 44)
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25. A method for automatic application and monitoring of a structure to be applied onto a substrate, the method comprising:
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determining a reference contour of a component to be connected to the substrate by utilizing a first camera in a leading direction to record a plurality of images; regulating the progression of the structure to be applied according to the reference contour; guiding an application facility based on the images recorded by the first camera; applying the structure onto the substrate by the application facility according to the reference contour determined by the first camera; and monitoring the structure applied onto the substrate by the application facility utilizing a second camera in trailing direction; wherein the method is performed with a third camera, each camera being configured to regulate in a leading direction according to the reference contour and to monitor the applied structure in a trailing direction, and the three cameras each comprise an overlapping area to an adjacent camera on a circular line, and wherein the method is performed such that at least one of the reference contour and the applied structure progresses relative to the cameras from one camera to the next camera, and an automatic switch is made when the applied structure or the reference contour progresses relative to the cameras from the segment of the circular line of one camera via the overlapping area to the segment of the circular line of another camera.
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26. An apparatus for automatic application and monitoring of a structure to be applied onto a substrate, the apparatus comprising:
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at least one illumination module; an application facility for applying the structure onto the substrate; and a sensor unit having two cameras provided around the application facility, the two cameras including a first camera configured in a leading direction for regulation of the application facility by means of a reference contour and a second camera configured in a trailing direction for simultaneous online monitoring of the structure applied onto the substrate; wherein the cameras are configured such that the cameras have an overlapping area on a circular line, a segment of the circular line is assigned to images of each camera, and an automatic switch is made when the applied structure or the reference contour progresses relative to the cameras from the segment of the circular line of one camera via the overlapping area to the segment of the circular line of another camera. - View Dependent Claims (27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42)
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45. An apparatus for automatic application and monitoring of a structure to be applied onto a substrate, the apparatus comprising:
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at least one illumination module; an application facility for applying the structure onto the substrate; a sensor unit having multiple cameras provided around the application facility, the multiple cameras including a first camera configured in a leading direction for regulation of the application facility by means of a reference contour, a second camera configured in a trailing direction for simultaneous online monitoring of the structure applied onto the substrate, and a third camera; and a calibrating device having individual form elements spaced apart at an angle distance of 10°
to calibrate the individual cameras for assignment of an angle assignment, wherein the calibrating device further comprises at least three marker sites for calibrating the three cameras, the marker sites being arranged in a circular arc and located at approximately 0°
, 120° and
240°
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Specification