Mounted component inspection apparatus, component mounting machine comprising the mounted component inspection apparatus, and mounted component inspection method

• US 8,406,503 B2
• Filed: 01/29/2010
• Issued: 03/26/2013
• Est. Priority Date: 01/29/2009
• Status: Expired due to Fees

• Current Assignee: Panasonic Corporation (Panasonic Holdings Corporation)
• Original Assignee: Panasonic Corporation (Panasonic Holdings Corporation)
• Inventors: Ueda, Yoichiro
• Primary Examiner(s): Ton, Tri T
• Application Number:
  US12/696,838
• Publication Number:
  US 20100189340A1
• Time in Patent Office: 1,152 Days
• Field of Search: 382/100, 382/141, 382145-152, 3562371-2376
• US Class Current: 382/147
• CPC Class Codes: G01N 21/956 Inspecting patterns on the surface of objects contactless testing of electronic circuits G01R31/308; testing currency G07D; manufacturing processes per se of semiconductor devices implementing a measuring step H01L22/10
• CPC Class Codes: Y10T 29/53013 Computer input
• CPC Class Codes: Y10T 29/53174 Means to fasten electrical component to wiring board, base, or substrate

Abstract

A mounted component inspection apparatus according to the present invention includes: a component library holding inspection information; an inspection processing unit for inspecting a component under inspection using the component library; a match rate acquisition unit for acquiring a match rate indicating the degree to which the inspection information is suitable for the inspection by the inspection processing unit, on the basis of the result of the inspection by the inspection processing unit; and a judgment unit for selecting the inspection information having a higher match rate, of the inspection information before updating and the inspection information after updating. The component library can hold the inspection information before and after updating, and the inspection processing unit carries out the inspection using the inspection information before and after updating held in the component library.

Claims

1. A mounted component inspection apparatus comprising:

an inspection processing unit for carrying out an inspection of a component by using a component library holding updatable inspection information;

a match rate acquisition unit for acquiring, respectively for inspection information before and after updating held by the component library, a match rate that indicates a degree to which inspection information is suitable for an inspection by the inspection processing unit, on a basis of results of inspections by the inspection processing unit; and

a judgment unit for selecting the inspection information having a higher match rate, of the inspection information before updating and the inspection information after updating,

wherein the component library can hold the inspection information before and after updating,

after carrying out inspections of components using the inspection information before and after updating held in the component library, the inspection processing unit carries out an inspection of a component using inspection information selected by the judgment unit, and

each match rate of the inspection information before and after updating is a value obtained by dividing a count value obtained by counting the number of times that acceptable information is generated, the acceptable information indicating that a result of an inspection by the inspection processing unit using the inspection information is satisfactory, by a total number of times that the inspection information has been used.

2. The mounted component inspection apparatus according to claim 1, further comprising a component library control unit for, when information for updating the inspection information is input, causing the component library to hold the inspection information updated on a basis of the input information.

3. The mounted component inspection apparatus according to claim 1, further comprising a point of difference reporting unit for reporting points of difference in the inspection information before and after updating.

4. The mounted component inspection apparatus according to claim 1, further comprising a match rate reporting unit for reporting the respective match rates of the inspection information before and after updating acquired by the match rate acquisition unit.

5. The mounted component inspection apparatus according to claim 1, further comprising an excessive judgment rate acquisition unit for acquiring an excessive judgment rate indicating a ratio of excessive judgments that have been made, on a basis of information indicating that the judgment is excessive.

6. The mounted component inspection apparatus according to claim 5, wherein the excessive judgment rate is a value obtained by dividing a count value obtained by counting a number of times that the information indicating that the judgment is excessive is input, by a number of times that the inspection processing unit has judged results of inspections to be unsatisfactory.

7. The mounted component inspection apparatus according to claim 1, wherein a revision number is assigned to the inspection information, and the revision number has a global setting number assigned by a supplier of the component library and a local setting number which can be changed by a recipient of the component library.

8. The mounted component inspection apparatus according to claim 7, further comprising an incrementing unit for, when the inspection information after updating is selected by the judgment unit, incrementing the local setting number assigned to the inspection information after updating.

9. The mounted component inspection apparatus according to claim 1, further comprising a component library control unit for assigning, to the inspection information before and after updating, an evaluation time setting number for distinguishing between before updating and after updating.

10. A component mounting machine for mounting components on a substrate, comprising the mounted component inspection apparatus according to claim 1, wherein the components mounted on the substrate are inspected by the mounted component inspection apparatus.

11. A mounted component inspection method, comprising:

carrying out inspections of components by using inspection information before and after updating held in a component library;

acquiring, respectively for the inspection information before and after updating, a match rate indicating a degree to which the inspection information is suitable for an inspection of a component, on a basis of results of the inspections thus carried out;

selecting the inspection information having a higher match rate, on a basis of the respective match rates of the inspection information before and after updating thus acquired; and

inspecting the component using the inspection information thus selected,

wherein each match rate of the inspection information before and after updating is a value obtained by dividing a count value obtained by counting a number of times that acceptable information is generated, the acceptable information indicating a satisfactory result of an inspection using the inspection information, by a total number of times that the inspection information has been used.

12. The mounted component inspection method according to claim 11, wherein, when information for updating the inspection information is input, inspection information that is updated on a basis of the input information is held in the component library.

13. The mounted component inspection method according to claim 12, wherein the information for updating the inspection information is input when a lot of components is changed.

14. The mounted component inspection method according to claim 11, wherein inspection information having a lower match rate, of the inspection information before and after updating, is discarded from the component library.

15. The mounted component inspection method according to claim 11, wherein a revision number is assigned to the inspection information, and the revision number comprises a global setting number assigned by a supplier of the component library and a local setting number which can be changed by a recipient of the component library.

16. The mounted component inspection method according to claim 15, wherein, when the inspection information after updating is selected, the local setting number assigned to the inspection information after updating is incremented.

17. The mounted component inspection method according to claim 11, wherein, when the inspection information is updated, an evaluation time setting number for distinguishing between before updating and after updating is assigned to the inspection information before and after updating.

18. The mounted component inspection method according to claim 11, wherein the component is inspected using, together with the component library, scale conversion data and brightness correction data which are specific to equipment.