Leak current calculation apparatus and method for calculating leak current

• US 8,407,642 B2
• Filed: 03/09/2010
• Issued: 03/26/2013
• Est. Priority Date: 03/17/2009
• Status: Expired due to Fees

• Current Assignee: Fujitsu Limited
• Original Assignee: Fujitsu Limited
• Inventors: Kanazawa, Yuzi
• Primary Examiner(s): Kik, Phallaka
• Application Number:
  US12/720,033
• Publication Number:
  US 20100237878A1
• Time in Patent Office: 1,113 Days
• Field of Search: 716/111, 716/106, 716/136, 703/16, 702/64, 702/117, 324/522, 714/32, 714/37, 714/738
• US Class Current: 716/111
• CPC Class Codes: G06F 30/33 Design verification, e.g. functional simulation or model checking

Abstract

A leak current calculation apparatus includes an acquiring section for acquiring partial circuit information, and a grouping section for forming a plurality of groups each comprising a part of the partial circuits connected with each other and for generating group information. The apparatus includes a leak difference value calculating section for calculating a leak difference value, which is a difference between a provisional maximum value acquired by adding up the maximum values of the leak current values of all the partial circuits and a sum of maximum values of the leak current values contained in the group information of the groups, and a maximum leak current calculating section for calculating the maximum leak current value of the integrated circuit by adjusting the provisional maximum value with the leak difference value.

Claims

1. A leak current calculation apparatus to calculate a leak current value of an integrated circuit including a plurality of partial circuits, the leak current calculation apparatus comprising:

an acquiring section to acquire partial circuit information including leak current values caused by the partial circuits when input signal patterns are inputted to the partial circuits for each of the partial circuits;

a grouping section to form a plurality of circuit groups each including a part of the partial circuits connected with each other and to generate circuit group information including leak current values caused by the circuit groups when input signal patterns are inputted to the circuit groups for each of the circuit groups based on the acquired partial circuit information;

a leak difference value calculating section to calculate a leak difference value, which is a difference between a provisional maximum value acquired by adding up maximum values of the leak current values of all the partial circuits and a sum of maximum values of the leak current values contained in the circuit group information of the circuit groups; and

a maximum leak current calculating section to calculate a maximum leak current value of the integrated circuit by adjusting the provisional maximum value with the leak difference value.

2. The leak current calculation apparatus according to claim 1, wherein the leak difference value calculating section calculates a leak difference value which is a difference between a provisional maximum value acquired by adding up the maximum values of the leak current values of all the partial circuits included in each of the circuit group and a maximum value of the leak current values contained in the circuit group information of each of the circuit groups.

3. The leak current calculation apparatus according to claim 2, further comprising:

a selecting section to select one of the circuit groups based on the leak difference value calculated by the leak difference value calculating section;

a limiting section to limit an input signal pattern contained in circuit group information on the selected circuit group to an input signal pattern corresponding to a highest leak current value;

an updating section to add the circuit group information on the selected circuit group with the limited input signal pattern to the partial circuit information on each of the corresponding partial circuits and to delete the partial circuit information on the partial circuits included in the selected circuit group from the partial circuit information on each of the corresponding partial circuits to update the acquired partial circuit information; and

a processing section for repetitively performing a corresponding processing until a number of times of processing by the updating section reaches a predetermined number of times,

wherein the maximum leak current calculating section calculates the maximum leak current value of the integrated circuit, if the number of times of processing by the updating section reaches the predetermined number of times, by using information on the leak current value of each of the partial circuits, which is contained in the updated partial circuit information.

4. The leak current calculation apparatus according to claim 1, wherein the grouping section generates the partial circuit group information on the partial circuit group including partial circuits connected mutually in a tree shape of single input/multi output before the partial circuit group information on other partial circuit groups.

5. The leak current calculation apparatus according to claim 1, wherein the grouping section generates the partial circuit group information on the partial circuit group including partial circuits connected mutually in a tree shape of multi-input/single output before the partial circuit group information on other partial circuit group.

6. A method to calculate a leak current value of an integrated circuit including a plurality of partial circuits, the method comprising:

acquiring partial circuit information including leak current values caused by the partial circuits when input signal patterns are inputted to the partial circuits for each of the partial circuits;

forming a plurality of circuit groups each including a part of the partial circuits connected with each other and generating circuit group information including leak current values caused by the circuit groups when input signal patterns are inputted to the circuit groups for each of the circuit groups based on the partial circuit information acquiring;

calculating, using a processor, a leak difference value, which is a difference between a provisional maximum value acquired by adding up maximum values of the leak current values of all the partial circuits and a sum of maximum values of the leak current values contained in the circuit group information of the circuit groups; and

calculating, using a processor, a maximum leak current value of the integrated circuit by adjusting the provisional maximum value with the leak difference value.

7. The method according to claim 6, wherein the leak difference value calculating operation includes calculating a leak difference value which is a difference between a provisional maximum value acquired by adding up the maximum values of the leak current values of all the partial circuits included in each of the circuit group and a maximum value of the leak current values contained in the circuit group information of each of the circuit groups.

8. The method according to claim 7, further comprising:

selecting one of the circuit groups based on the calculated leak difference value;

limiting an input signal pattern contained in the circuit group information on the selected circuit group to an input signal pattern corresponding to a highest leak current value;

adding the circuit group information on the selected circuit group with a limited input signal pattern to the partial circuit information on each of the corresponding partial circuits and deleting the partial circuit information on the partial circuits included in the selected circuit group from the partial circuit information on each of the corresponding partial circuits to update the acquired partial circuit information; and

repetitively performing a corresponding processing until a number of times of processing by the updating section reaches a predetermined number of times,

wherein the maximum leak current calculating operation calculates the maximum leak current value of the integrated circuit, if the number of times of processing by the updating section reaches the predetermined number of times, by using information on the leak current value of each of the partial circuits, which is contained in the updated partial circuit information.

9. The method according to claim 6, wherein the forming generates the partial circuit group information on the partial circuit group including partial circuits connected mutually in a tree shape of single input/multi output before the partial circuit group information on other partial circuit groups.

10. The method according to claim 6, wherein the forming generates the partial circuit group information on the partial circuit group including partial circuits connected mutually in a tree shape of multi-input/single output before the partial circuit group information on other partial circuit group.

11. A non-transitory storage medium storing a leak current value calculation program allowing causing a processor of a computer to execute a process for a leak current value calculation of an integrated circuit including a plurality of partial circuits, the process comprising:

acquiring partial circuit information including leak current values caused by the partial circuits when input signal patterns are inputted to the partial circuits for each of the partial circuits;

forming a plurality of circuit groups each including a part of the partial circuits connected with each other and generating circuit group information including leak current values caused by the circuit groups when input signal patterns are inputted to the circuit groups for each of the circuit groups based on the acquired partial circuit information the acquiring;

calculating a leak difference value, which is a difference between a provisional maximum value acquired by adding up maximum values of the leak current values of all the partial circuits and a sum of maximum values of the leak current values contained in the circuit group information of the circuit groups; and

calculating a maximum leak current value of the integrated circuit by adjusting the provisional maximum value with the leak difference value.

12. The non-transitory storage medium according to claim 11, wherein the leak difference value calculating operation includes calculating a leak difference value which is a difference between a provisional maximum value acquired by adding up the maximum values of the leak current values of all the partial circuits included in each of the circuit group and a maximum value of the leak current values contained in the circuit group information of each of the circuit groups.

13. The non-transitory storage medium according to claim 12, the process comprising:

selecting one of the circuit groups based on the leak difference value calculated by the leak difference value calculating operation;

limiting an input signal pattern contained in the circuit group information on the selected circuit group to an input signal pattern corresponding to a highest leak current value;

adding the circuit group information on the selected circuit group with the limited input signal pattern to the partial circuit information on each of the corresponding partial circuits and deleting the partial circuit information on the partial circuits included in the selected circuit group from the partial circuit information on each of the corresponding partial circuits to update the acquired partial circuit information; and

repetitively performing a corresponding processing until a number of times of processing by the updating section reaches a predetermined number of times,

wherein the maximum leak current calculating operation calculates the maximum leak current value of the integrated circuit, if the number of times of processing by the updating section reaches the predetermined number of times, by using information on the leak current value of each of the partial circuits, which is contained in the updated partial circuit information.

14. The non-transitory storage medium according to claim 11, wherein forming generates the partial circuit group information on the partial circuit group including partial circuits connected mutually in a tree shape of single input/multi output before the partial circuit group information on other partial circuit groups.

15. The non-transitory storage medium according to claim 11, wherein the forming generates the partial circuit group information on the partial circuit group including partial circuits connected mutually in a tree shape of multi-input/single output before the partial circuit group information on other partial circuit group.

16. The non-transitory storage medium according to claim 11, wherein the calculating of the leak difference value is performed using a processor.

17. The non-transitory storage medium according to claim 11, wherein the calculating of the maximum leak current value is performed using a processor.