Optical measurement apparatus including hemispherical optical integrator

• US 8,422,018 B2
• Filed: 02/16/2011
• Issued: 04/16/2013
• Est. Priority Date: 02/24/2010
• Status: Active Grant

• Current Assignee: Otsuka Electronics Co., Ltd. (Otsuka Holdings Company Limited)
• Original Assignee: Otsuka Electronics Co., Ltd. (Otsuka Holdings Company Limited)
• Inventors: Osawa, Yoshihiro, Ohkubo, Kazuaki
• Primary Examiner(s): Toatley, Gregory J
• Assistant Examiner(s): Underwood, Jarreas C
• Application Number:
  US13/029,067
• Publication Number:
  US 20110205541A1
• Time in Patent Office: 790 Days
• Field of Search: 356445-448, 356450-458
• US Class Current: 356/445
• CPC Class Codes: G01J 1/58 using luminescence generated by light
• CPC Class Codes: G01J 2001/0481 Preset integrating sphere or cavity
• CPC Class Codes: G01J 2001/4247 for testing lamps or other light sources
• CPC Class Codes: G01J 3/0254 Spectrometers, other than colorimeters, making use of an integrating sphere

Abstract

An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.

Claims

1. An optical measurement apparatus comprising:

a hemispherical portion having a diffuse reflection layer on an inner wall; and

a plane portion, disposed to involve a substantial center of curvature of said hemispherical portion and close an opening of said hemispherical portion, having a reflection layer that faces an inner surface side of said hemispherical portion,

said plane portion including;

at least one of a window for introducing light to be homogenized in an integrating space formed between said hemispherical portion and said plane portion, and a window for extracting light homogenized in said integrating space;

an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference at which said plane portion abuts on the inner wall of said hemispherical portion; and

an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than said first material, and occupying a region inside said outer portion.

2. The optical measurement apparatus according to claim 1, wherein

a range of said inner portion is defined so that an influence of light absorption between said inner portion and the inner wall of said hemispherical portion is substantially negligible.

3. The optical measurement apparatus according to claim 1, wherein

a range of said inner portion is defined so that light absorptance in said integrating space is a predetermined value or less.

4. The optical measurement apparatus according to claim 3, wherein

said predetermined value is 10%.

5. The optical measurement apparatus according to claim 1, wherein

said inner portion is disposed in a circle having a radius of a length of 50% to 70% relative to a distance from the substantial center of curvature of said hemispherical portion to said outermost circumference.

6. The optical measurement apparatus according to claim 5, wherein

said inner portion is a polygon and said circle is a circumcircle of the polygon.

7. The optical measurement apparatus according to claim 1, wherein

said inner portion is defined to have an area of 25% to 50% relative to an area of a region within said outermost circumference.

8. The optical measurement apparatus according to claim 1, wherein

said outer portion is formed of a metal-deposited mirror, and

said inner portion is formed of one of sintered polytetrafluoroethylene and barium sulfate.

9. The optical measurement apparatus according to claim 1, wherein

said plane portion includes a first window to which a light source to be measured can be attached so that a luminous flux generated from the light source is applied toward the inner wall of said hemispherical portion, and

said optical measurement apparatus further comprises:

a detector for detecting illuminance at the inner wall of said hemispherical portion through a second window disposed at said hemispherical portion or said plane portion; and

a blocking portion disposed on a path from said first window to said second window.

10. The optical measurement apparatus according to claim 1, wherein

said plane portion includes a first window provided near the substantial center of curvature of said hemispherical portion, and a second window provided at a position separated by a predetermined distance from said first window, and

said optical measurement apparatus further comprises:

a light source for emitting excitation light through said first window;

a spectroscope for measuring a spectrum at the inner wall of said hemispherical portion through said second window; and

a processing unit for calculating a quantum efficiency of an object to be measured that is disposed to have at least a portion exposed to inside of said hemispherical portion, based on a first spectrum measured by said spectroscope when said excitation light is applied from said light source to said object to be measured, and a second spectrum measured by said spectroscope when said excitation light is applied from said light source to a reference object disposed instead of said object to be measured and having a known reflectance characteristic or transmittance characteristic.