Test apparatus and power supply apparatus
First Claim
Patent Images
1. A test apparatus that tests a device under test, comprising:
- a first capacitor and a second capacitor;
a switching section that (i) switches which of the first capacitor and the second capacitor supplies power to the device under test and (ii), when the first capacitor and the second capacitor supply power to the device under test, switches, according to a test voltage for testing the device under test, whether the first capacitor and the second capacitor are used in a parallel connection or in a serial connection;
a judging section that judges acceptability of the device under test based on an operational result of the device under test;
a power supply section that includes a first power supply unit that charges the first capacitor and a second power supply unit that charges the second capacitor; and
a monitoring section that monitors degradation amounts of the first capacitor and the second capacitor, whereinthe switching section has states comprising;
a first state in which the second capacitor is electrically connected to the device under test but the first capacitor and the second capacitor are not connected to the device under test in series;
a second state in which the first capacitor is electrically connected to the device under test but the first capacitor and the second capacitor are not connected to the device under test in series;
a third state in which neither the first capacitor nor the second capacitor is electrically connected to the device under test, and a negative terminal of the first capacitor and a negative terminal of the second capacitor are connected to each other; and
a fourth state in which the first capacitor and the second capacitor are connected to the device under test in series, andthe power supply section (i) causes the first capacitor to connect to the first power supply unit when the switching section is in the first state, (ii) causes the second capacitor to connect to the second power supply unit when the switching section is in the second state, (iii) causes the first capacitor to connect to the first power supply unit, charges the first capacitor with the first power supply unit, causes the second capacitor to connect to the second power supply unit, and charges the second capacitor with the second power supply unit when the switching section is in the third state, and (iv) causes the first capacitor not to connect to the first power supply unit and causes the second capacitor not to connect to the second power supply unit when the switching section is in the fourth state.
2 Assignments
0 Petitions
Accused Products
Abstract
Provided is a test apparatus that tests a device under test, comprising a plurality of capacitors that are each charged to a predetermined voltage; a switching section that switches which of the capacitors charged to a predetermined voltage supplies power to the device under test; and a judging section that judges acceptability of the device under test based on an operational result of the device under test. Also provided is a test apparatus that selects one of a plurality of capacitors and a corresponding one of a plurality of power supply units, according to content of a test performed after a test that uses another of the capacitors to supply power to the device under test.
19 Citations
10 Claims
-
1. A test apparatus that tests a device under test, comprising:
-
a first capacitor and a second capacitor; a switching section that (i) switches which of the first capacitor and the second capacitor supplies power to the device under test and (ii), when the first capacitor and the second capacitor supply power to the device under test, switches, according to a test voltage for testing the device under test, whether the first capacitor and the second capacitor are used in a parallel connection or in a serial connection; a judging section that judges acceptability of the device under test based on an operational result of the device under test; a power supply section that includes a first power supply unit that charges the first capacitor and a second power supply unit that charges the second capacitor; and a monitoring section that monitors degradation amounts of the first capacitor and the second capacitor, wherein the switching section has states comprising; a first state in which the second capacitor is electrically connected to the device under test but the first capacitor and the second capacitor are not connected to the device under test in series; a second state in which the first capacitor is electrically connected to the device under test but the first capacitor and the second capacitor are not connected to the device under test in series; a third state in which neither the first capacitor nor the second capacitor is electrically connected to the device under test, and a negative terminal of the first capacitor and a negative terminal of the second capacitor are connected to each other; and a fourth state in which the first capacitor and the second capacitor are connected to the device under test in series, and the power supply section (i) causes the first capacitor to connect to the first power supply unit when the switching section is in the first state, (ii) causes the second capacitor to connect to the second power supply unit when the switching section is in the second state, (iii) causes the first capacitor to connect to the first power supply unit, charges the first capacitor with the first power supply unit, causes the second capacitor to connect to the second power supply unit, and charges the second capacitor with the second power supply unit when the switching section is in the third state, and (iv) causes the first capacitor not to connect to the first power supply unit and causes the second capacitor not to connect to the second power supply unit when the switching section is in the fourth state. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
-
Specification
-
- Resources
Litigation Campaign Assessment
Thank you for your request. You will receive a custom alert email when the Litigation Campaign Assessment is available.
×
-
Current AssigneeAdvantest Corporation
-
Original AssigneeAdvantest Corporation
-
InventorsAmanuma, Seiji
-
Primary Examiner(s)Vazquez, Arleen M
-
Application NumberUS12/861,695Publication NumberTime in Patent Office974 DaysField of Search324/750.01, 324/762.02, 324/764.01, 307/71, 307/115US Class Current324/750.01CPC Class CodesG01R 31/2839 using signal generators, po...G01R 31/2851 Testing of integrated circu...
