Methods and systems for rapid detection of concealed objects
DCFirst Claim
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1. An apparatus for inspecting an object, comprising:
- a first stage inspection system comprising a conveyor for transporting the object into a first inspection volume, a dual energy X-ray source wherein said dual energy X-ray source is configured to irradiate said first inspection volume with dual energy radiation, and a detector array positioned opposite said dual energy X-ray source, configured to receive dual energy radiation transmitted through said object, and adapted to generate signals, comprising high energy data component and low energy data, based upon said received dual energy radiation; and
at least one processor for processing said signals to generate a three dimensional image of said object and to locate a threat within said object and for plotting said high energy data against said low energy data to identify at least one of spectra, parameters of analytical expressions, or spectral attenuation functions in a lookup table.
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Abstract
This specification is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials (“SNM”) and/or high atomic number materials. The system employs a dual energy CT scanning first stage inspection system and advanced image processing techniques to analyze images of an object under inspection (“OUI”), which includes, but is not limited to baggage, parcels, vehicles and cargo.
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Citations
20 Claims
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1. An apparatus for inspecting an object, comprising:
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a first stage inspection system comprising a conveyor for transporting the object into a first inspection volume, a dual energy X-ray source wherein said dual energy X-ray source is configured to irradiate said first inspection volume with dual energy radiation, and a detector array positioned opposite said dual energy X-ray source, configured to receive dual energy radiation transmitted through said object, and adapted to generate signals, comprising high energy data component and low energy data, based upon said received dual energy radiation; and at least one processor for processing said signals to generate a three dimensional image of said object and to locate a threat within said object and for plotting said high energy data against said low energy data to identify at least one of spectra, parameters of analytical expressions, or spectral attenuation functions in a lookup table. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. An apparatus for inspecting an object, comprising:
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a first stage inspection system comprising a conveyor for transporting the object into a first inspection volume, a dual energy X-ray source wherein said dual energy X-ray source is configured to irradiate said first inspection volume with dual energy radiation, and a detector array positioned opposite said dual energy X-ray source, configured to receive dual energy radiation transmitted through said object, and adapted to generate signals, comprising high energy data component and low energy data, based upon said received dual energy radiation; at least one processor for processing said signals to generate a three dimensional image of said object, to locate a threat within said object, to generate a signal comprising data defining said location and to map said high energy data against said low energy data to identify at least one of spectra, parameters of analytical expressions, or spectral attenuation functions in a lookup table; and a second stage inspection system comprising a radiation source and a detector array having at least one transmission detector or energy-dispersive detector, wherein said second stage inspection system inspects said object based on said location. - View Dependent Claims (18, 19, 20)
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Specification