System and method of determining object pose
First Claim
1. A method for determining a pose of an object of interest at a run time, the method comprising:
- capturing a first image of a first structured light pattern projected onto a first local surface of the object of interest, the first structured light pattern including a plurality of lines of structured light;
wherein the first local surface is a portion of a surface on the object of interest characterized by the absence of a discernible feature that, when captured in the first image, would otherwise provide sufficient information to determine a complete pose of the object of interest;
determining a first run-time data set from the captured first image, wherein the first run-time data set corresponds to information determined from the first structured light pattern projected onto the first local surface and corresponds to surface contours of the first local surface determined from the plurality of lines of structured light of the first structured light pattern;
comparing the determined first run-time data set and a corresponding first reference data set, the first reference data set corresponding to an ideal pose of the first local surface on an ideally posed reference object; and
determining at least one first degree of constraint that defines a first partial pose of the first local surface, the at least one first degree of constraint based upon the comparison of the first run-time data set with the corresponding first reference data set.
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Accused Products
Abstract
Briefly described, one embodiment determines pose of an object of interest at a run time by capturing a first image of a first structured light pattern projected onto a first local surface of the object of interest; determining a first run-time data set from the captured first image, wherein the first run-time data set corresponds to information determined from the first structured light pattern projected onto the first local surface; comparing the determined first run-time data set and a corresponding first reference data set, the first reference data set corresponding to an ideal pose of the first local surface on an ideally posed reference object; and determining at least one first degree of constraint that defines a first partial pose of the first local surface, the at least one first degree of constraint based upon the comparison of the first run-time data set with the corresponding first reference data set.
214 Citations
27 Claims
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1. A method for determining a pose of an object of interest at a run time, the method comprising:
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capturing a first image of a first structured light pattern projected onto a first local surface of the object of interest, the first structured light pattern including a plurality of lines of structured light; wherein the first local surface is a portion of a surface on the object of interest characterized by the absence of a discernible feature that, when captured in the first image, would otherwise provide sufficient information to determine a complete pose of the object of interest;
determining a first run-time data set from the captured first image, wherein the first run-time data set corresponds to information determined from the first structured light pattern projected onto the first local surface and corresponds to surface contours of the first local surface determined from the plurality of lines of structured light of the first structured light pattern;comparing the determined first run-time data set and a corresponding first reference data set, the first reference data set corresponding to an ideal pose of the first local surface on an ideally posed reference object; and determining at least one first degree of constraint that defines a first partial pose of the first local surface, the at least one first degree of constraint based upon the comparison of the first run-time data set with the corresponding first reference data set. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 15, 16)
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14. A method for determining a pose of an object of interest at a run time, the method comprising:
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capturing a first image of a first structured light pattern projected onto a first local surface of the object of interest; determining a first run-time data set from the captured first image, wherein the first run-time data set corresponds to information determined from the first structured light pattern projected onto the first local surface; comparing the determined first run-time data set and a corresponding first reference data set, the first reference data set corresponding to an ideal pose of the first local surface on an ideally posed reference object; determining at least one first degree of constraint that defines a first partial pose of the first local surface, the at least one first degree of constraint based upon the comparison of the first run-time data set with the corresponding first reference data set; comparing the determined first run-time data set and the second run-time data set to determine an aggregate run-time data set; comparing the determined aggregate run-time data set and a corresponding reference data set, the reference data set corresponding to an ideal pose of the first local surface on an ideally posed reference object; determining at least one first degree of constraint that defines a first partial pose of the first local surface, the at least one first degree of constraint based upon the comparison of the aggregate run-time data set with the corresponding first reference data set comparing the determined second run-time data set and a corresponding reference data set, the reference data set corresponding to an ideal pose of the first local surface on an ideally posed reference object; determining at least one second degree of constraint that defines the first partial pose of the first local surface, the at least one second degree of constraint based upon the comparison of the second run-time data set with the corresponding first reference data set; comparing the determined first degree of constraint and the second degree of constraint to determine an aggregate degree of constraint; and determining at least partial pose of the first local surface based upon the comparison of the a first degree of constraint and the second degree of constraint.
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17. A system that determines a pose of an object of interest at a run time, comprising:
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an image capture system operable to capture a first image of a first structured light pattern projected onto a first local surface of the object of interest and operable to capture a second image of a second structured light pattern projected onto a second local surface of the object of interest, wherein the first structured light pattern includes a first plurality of lines of structured light and wherein the second structured light pattern includes a second plurality of lines of structured light; a structured light source system operable to project the first structured light pattern onto the first local surface and operable to project the second structured light pattern onto the second local surface; and a processor communicatively coupled to the image capture system and the structured light source system, and operable to; determine a first run-time data set from the captured first image, wherein the first run-time data set corresponds to information determined from the first structured light pattern projected onto the first local surface and corresponds to surface contours of the first local surface determined from the first plurality of lines of structured light of the first structured light pattern; determine a second run-time data set from the captured second image, wherein the second run-time data set corresponds to information determined from the second structured light pattern projected onto the second local surface and corresponds to surface contours of the second local surface determined from the second plurality of lines of structured light of the second structured light pattern; compare the determined first run-time data set and a corresponding first reference data set, the first reference data set corresponding to an ideal pose of the first local surface on an ideally posed reference object, to determine at least a first degree of constraint corresponding to the pose of the first local surface; and compare the determined second run-time data set and a corresponding second reference data set, the second reference data set corresponding to the ideal pose of the second local surface on the ideally posed reference object, to determine at least a second degree of constraint corresponding to the pose of the second local surface. - View Dependent Claims (18, 19, 20, 21, 22)
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23. A method for determining a pose of an object of interest, the method comprising:
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capturing at least one reference image of each of a plurality of reference local surfaces on a reference object oriented in a reference pose, wherein each of the plurality of reference local surfaces of the reference object has a structured light pattern projected thereon, the structured light pattern including a plurality of lines of structured light; determining a plurality of reference data sets, wherein one reference data set is determined for each one of the plurality of reference local surfaces, and wherein the plurality of reference data sets corresponds to information determined from the structured light pattern projected onto its respective reference local surface and corresponds to surface contours of the respective local surface determined from the plurality of lines of structured light; and capturing at least one image of each of a plurality of local surfaces on the object of interest in an unknown pose at a run time, wherein each of the local surfaces of the object of interest in the unknown pose has the structured light pattern projected thereon, and wherein each one of the local surfaces of the object of interest in the unknown pose correspond to one of the reference local surfaces; determining a plurality of run-time data sets, wherein one run-time data set is determined for each one of the plurality of local surfaces, and wherein the run-time data sets correspond to information determined from the structured light pattern projected onto its respective local surface; and comparing the determined run-time data sets and the corresponding reference data sets. - View Dependent Claims (24)
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25. A method for determining a pose of an object of interest, the method comprising:
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capturing at least one reference image of each of a plurality of reference local surfaces on a reference object oriented in a reference pose, wherein each of the plurality of reference local surfaces of the reference object has a structured light pattern projected thereon; determining a plurality of reference data sets, wherein one reference data set is determined for each one of the plurality of reference local surfaces, and wherein the plurality of reference data sets corresponds to information determined from the structured light pattern projected onto its respective reference local surface; capturing at least one image of each of a plurality of local surfaces on the object of interest in an unknown pose at a run time, wherein each of the local surfaces of the object of interest in the unknown pose has the structured light pattern projected thereon, and wherein each one of the local surfaces of the object of interest in the unknown pose correspond to one of the reference local surfaces; determining a plurality of run-time data sets, wherein one run-time data set is determined for each one of the plurality of local surfaces, and wherein the run-time data sets correspond to information determined from the structured light pattern projected onto the respective local surface; comparing the determined run-time data sets and the corresponding reference data sets; determining at least one reference degree of constraint from each of the reference data sets; and determining at least one run-time degree of constraint from each of the run-time data sets, wherein comparing the run-time data sets and the reference data sets comprises; comparing the determined at least one run-time degree of constraint and the determined respective reference degree of constraint; and determining the pose of the object of interest in the unknown pose based upon the comparison of the determined at least one run-time degree of constraint and the determined respective reference degree of constraint. - View Dependent Claims (26)
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27. A system that determines a pose of an object of interest at a run time, comprising:
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means for capturing at least one image of each of a plurality of local surfaces on the object of interest in an unknown pose at the run time, wherein each of the local surfaces of the object of interest in the unknown pose has a structured light pattern projected thereon, wherein each structured light pattern includes a plurality of lines of structured light and wherein each one of the local surfaces of the object of interest in the unknown pose corresponds to one of a plurality of reference local surfaces; means for determining a plurality of run-time data sets, each data set including a plurality of points, wherein one run-time data set is determined for each one of the plurality of local surfaces, and wherein the plurality of run-time data sets corresponds to information determined from the structured light pattern projected onto its respective local surface and corresponds to surface contours of the respective local surface determined from the plurality of lines of structured light; and means for comparing the determined run-time data sets and a plurality of corresponding reference data sets means for capturing at least one reference image from a fixed location with respect to each of a plurality of reference local surfaces on a reference object oriented in a reference pose, wherein each of the plurality of reference local surfaces of the reference object has a structured light pattern projected thereon; and means for determining the plurality of reference data sets, wherein one reference data set is determined for each one of the plurality of reference local surfaces, and wherein the plurality of reference data sets corresponds to information determined from the structured light pattern projected onto its respective reference local surface.
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Specification