Structures and control processes for efficient generation of different test clocking sequences, controls and other test signals in scan designs with multiple partitions, and devices, systems and processes of making

• US 8,438,437 B2
• Filed: 11/03/2010
• Issued: 05/07/2013
• Est. Priority Date: 07/27/2010
• Status: Active Grant

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Jain, Arvind, Kulkarni, Prashant Mohan, Vooka, Srinivas Kumar, Subramanian, Sundarrajan, Parekhji, Rubin Ajit
• Primary Examiner(s): LE, DIEU MINH T
• Application Number:
  US12/938,939
• Publication Number:
  US 20120030532A1
• Time in Patent Office: 916 Days
• Field of Search: 714/726, 714/725, 714/727, 714/728, 714/729, 714/730, 714/731, 714/738
• US Class Current: 714/726
• CPC Class Codes: G01R 31/318547 Data generators or compressors

Abstract

A scannable integrated circuit (100) including a functional integrated circuit (P1, P2) having scan chains, multiple scan decompressors (120.1, 120.2), each operable to supply scan bits to some of the scan chains (101.k, 102.k), a shared scan-programmable control circuit (110, 300), a tree circuit (400) coupled with the functional integrated circuit (P1, P2), the shared scan-programmable control circuit (110, 300) coupled to control the tree circuit (400), and a selective coupling circuit (180) operable to provide selective coupling with the shared scan-programmable control circuit (110, 300) for scan programming through any of the multiple scan decompressors (120.1, 120.2). Other circuits, devices, systems, and processes of operation and manufacture are disclosed.

Claims

1. A scannable integrated circuit comprising:

a functional integrated circuit having scan chains;

multiple scan decompressors, each operable to supply scan bits to some of the scan chains;

a shared scan-programmable control circuit;

a tree circuit coupled with the functional integrated circuit, the shared scan-programmable control circuit coupled to control the tree circuit; and

a selective coupling circuit operable to provide selective coupling with said shared scan-programmable control circuit for scan programming through any of said multiple scan decompressors.

2. The scannable integrated circuit claimed in claim 1 wherein said selective coupling circuit is operable on a per pattern basis.

3. The scannable integrated circuit claimed in claim 1 wherein said multiple scan decompressors are operable on a per-pattern basis to decompress test patterns for a selected set of scan chains for each such pattern.

4. The scannable integrated circuit claimed in claim 1 operable in test runs and wherein said functional integrated circuit has multiple clock domains, and said tree circuit couples with at least two of said multiple clock domains for a single test run.

5. The scannable integrated circuit claimed in claim 1 wherein said functional integrated circuit has multiple clock domains and has both inter-clock domain logic and intra-clock domain logic coupled with said tree circuit.

6. The scannable integrated circuit claimed in claim 1 further comprising multiple scan compactors and a second selective coupling circuit operable to provide coupling of said shared scan-programmable control circuit for compaction and scan output through any selected one of said multiple scan compactors.

7. The scannable integrated circuit claimed in claim 6 further comprising at least one dummy chain wherein said second selective coupling circuit is operable to selectively couple at least one said dummy chain to a said scan compactor unless said shared scan-programmable control circuit is coupled to that scan compactor.

8. The scannable integrated circuit claimed in claim 6 further comprising at least one dummy chain coupled with at least one of said scan compactors.

9. The scannable integrated circuit claimed in claim 1 further comprising at least one dummy chain coupled with at least one of said scan decompressors.

10. The scannable integrated circuit claimed in claim 1 further comprising multiple scan compactors corresponding to said multiple scan decompressors, and a second selective coupling circuit operable to provide coupling of said shared scan-programmable control circuit for compression and scan output through a selected one of said multiple scan compactors corresponding to the currently-selected one of said multiple scan decompressors selected by said first-named selective coupling circuit.

11. The scannable integrated circuit claimed in claim 10 further comprising at least one dummy chain coupled to both said first-named selective coupling circuit and to said second selective coupling circuit wherein at least one of said first-named and second coupling circuits are arranged and operable to provide a scan path via the at least one said dummy chain between a said decompressor and the corresponding said scan compactor unless said shared scan-programmable control circuit is currently-selected to provide such scan path therebetween.

12. The scannable integrated circuit claimed in claim 1 wherein said functional integrated circuit has plural partitions each having some of the scan chains associated with the decompressors respectively, and wherein said functional integrated circuit has multiple clock domains associated among said partitions, said tree circuit extending to at least two of said multiple clock domains.

13. The scannable integrated circuit claimed in claim 1 wherein at least one of said multiple scan decompressors is operable to concurrently feed programming to the shared control circuit along with the scan bits to said some of the scan chains.

14. The scannable integrated circuit claimed in claim 1 wherein said functional integrated circuit has plural partitions each having some of the scan chains associated with said decompressors respectively, and said multiple scan decompressors are operable to partition-specifically scan-initialize the partitions one-by-one in phases in response to respective input test patterns.

15. The scannable integrated circuit claimed in claim 14 wherein said multiple scan decompressors are operable to decompress respective input test patterns into respective programming for the shared control circuit from pattern to pattern concurrently as the scan-initialize operations occur for the partitions one-by-one.

16. The scannable integrated circuit claimed in claim 15 wherein said shared scan-programmable control circuit and said tree circuit are thereby programmable to variously operate or not operate across multiple partitions after one or more of the partition-specific initialization phases, whereby providing test flexibility and test coverage.

17. The scannable integrated circuit claimed in claim 1 wherein said functional integrated circuit is operable in response to said shared scan-programmable control circuit and said scan chains are operable for scan out.

18. The scannable integrated circuit claimed in claim 1 having multiple partitions and operable to apply partition-specific control by the shared scan-programmable control circuit and tree circuit across said multiple partitions.

19. The scannable integrated circuit claimed in claim 1 having multiple partitions each having a dummy chain that is switchable into such partition when coupling to said shared scan-programmable control circuit is switched from that partition to another partition, and said dummy chain switchable out of the partition when said shared scan-programmable control circuit is switched into the partition.

20. The scannable integrated circuit claimed in claim 1 wherein said functional integrated circuit has isolation control structures and said shared scan-programmable control circuit is operable to control at least some of said isolation control structures.

21. The scannable integrated circuit claimed in claim 1 wherein said shared scan-programmable control circuit is operable to control power gating structures for selective powering on/off of parts of the integrated circuit.

22. A process for utilizing a plurality of test patterns in an integrated circuit having multiple partitions and scan chains therein, the process comprising:

decompressing such test patterns to provide decompressed test patterns;

partition-specifically supplying bits to a plurality of the partitions via scan-in of the scan chains therein using parts of the decompressed test patterns; and

routing in at least another part of the decompressed test patterns as programming bits to a shared control circuit, regardless of which test pattern in the plurality, to control a tree circuit that is coupled to the plurality of the partitions.

23. The process claimed in claim 22 wherein the decompressing decompresses different ones of the test patterns in different decompressor circuits depending on the partition targeted, and the routing-in includes multiplexing said another part of the decompressed test patterns to the single shared control circuit from whichever decompressor circuit is currently active.

24. The process claimed in claim 22 further comprising applying a sequence of different test patterns wherein each such test pattern respectively initiates both an instance of the partition-specific supplying of bits to a respective one of the partitions as well as a respective instance of the routing in of programming bits to the shared control circuit.

25. The process claimed in claim 22 wherein the decompressing decompresses such a test pattern to target a currently-selected partition, and the routing-in includes selectively switching at least one scan chain for the shared control circuit into the currently-selected partition to receive the programming bits for the shared control circuit.

26. The process claimed in claim 25 further comprising switching a dummy chain into a partition unless a scan chain for the shared control circuit is switched into the partition.

27. The process claimed in claim 22 further comprising operating the shared control circuit to apply a time-sequenced set of controls to the tree circuit, the time-sequenced set of controls issuing over time in response to given programming bits.

28. The process claimed in claim 22 further comprising partition-specifically functional-clocking one or more of the plurality of the partitions via the tree circuit in response to at least some of the programming bits.

29. The process claimed in claim 28 wherein the decompressing decompresses some test patterns one-by-one, and the partition-specific functional-clocking includes selectively applying or not applying the functional clocking partition-specifically in response to a current set of such control circuit programming bits on a per-pattern basis, test pattern by test pattern.

30. The process claimed in claim 28 wherein the decompressing decompresses test patterns one-by-one, and the partition-specific functional-clocking includes selectively applying the functional clocking partition-specifically with respective frequencies in response to a current set of such control circuit programming bits on a per-pattern basis.

31. The process claimed in claim 28 wherein the partition-specifically functional-clocking includes functional-clocking at least one of those partitions at a first clock frequency and functional-clocking at least another of those partitions at a second clock frequency, both said first and second clock frequency emanating from the tree circuit.

32. The process claimed in claim 22 further comprising providing at least two test patterns in succession that each include both partition-specific bits and the programming bits compressed together.

33. The process claimed in claim 22 further comprising applying functional clock via the tree circuit responsive to a first set of programming bits prior to decompressing the second of the at least two test patterns.

34. The process claimed in claim 22 further comprising decompressing the at least two test patterns successively to provide partition-specific bits to the scan chain for a first such partition and a first set of programming bits for the shared control circuit and then to provide partition-specific bits to the scan chain for a second such partition and a second set of programming bits for the shared control circuit.

35. The process claimed in claim 34 further comprising applying functional clock via the tree circuit responsive to the second set of programming bits after decompressing the second of the at least two test patterns so that first and second such partitions are partition-specifically functional-clocked by the tree circuit.

36. The process claimed in claim 22 further comprising partition-specifically applying resets in response to the at least some of programming bits.

37. The process claimed in claim 22 further comprising partition-specifically applying power controls in response to the at least some of programming bits.

38. The process claimed in claim 22 further comprising partition-specifically applying isolation controls in response to the at least some of programming bits.

39. The process claimed in claim 22 wherein said another part of the decompressed test patterns includes other control bits selected from the group consisting of:

2) control,

     2) reset control,

     3) power management control,

     4) isolation control.

40. The process claimed in claim 22 further comprising subsequently scanning out at least some scan chains in at least one of the partitions.

41. The process claimed in claim 40 wherein the scanning out scans out the scan chains in at least two of the partitions sequentially, one partition after the other.

42. The process claimed in claim 22 further comprising compacting the scan chains from partitions with multiple scan compactors and selectively coupling the shared control circuit for scan output through any selected one of said multiple scan compactors.

43. The process claimed in claim 42 further comprising selectively coupling at least one dummy chain for a given partition to a scan compactor unless said shared control circuit is currently coupled to that said scan compactor.

44. The process claimed in claim 43 wherein the decompressing uses decompressor circuits for different partitions and the process further comprising selectively coupling the shared control circuit for scan input through any selected one of said decompressor circuits and coupling such dummy chain to a decompressor unless the shared control circuit is coupled to that decompressor.

45. A process of manufacturing an integrated circuit comprising using fabrication equipment to make an integrated circuit having functional circuitry with scan chains, multiple scan decompressors each operable to supply scan bits to some of the scan chains, a shared scan-programmable control circuit, a tree circuit coupled with the functional circuitry, the control circuit coupled to control the tree circuit, and a selective coupling circuit operable to provide coupling of said shared scan-programmable control circuit for scan programming through any selected one of said multiple scan decompressors.

46. A telecommunications device comprising:

a printed circuit board;

a first integrated circuit having functional circuitry with scan chains, multiple scan decompressors each operable to supply scan bits to some of the scan chains, a shared scan-programmable control circuit, a tree circuit coupled with the functional circuitry, the control circuit coupled to control the tree circuit, and a selective coupling circuit operable to provide coupling of said shared scan-programmable control circuit for scan programming through any selected one of said multiple scan decompressors; and

a modem integrated circuit electrically coupled with said first integrated circuit and to said printed circuit board.