Enhanced diagnosis with limited failure cycles
First Claim
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1. A method for an electronic circuit design, the design comprising one or more scan chains with a plurality of scan cells, the method comprising:
- receiving one or more coverage scores for one or more of the scan cells, the coverage scores being associated with one or more scan patterns;
determining, according to the one or more coverage scores, a diagnosis coverage figure for at least one scan chain of the one or more scan chains in relation to the one or more scan patterns, wherein the diagnosis coverage figure indicates a likelihood of detecting scan chain defects in the at least one scan chain using the one or more scan patterns; and
storing the diagnosis coverage figure.
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Abstract
Chain or logic diagnosis resolution can be enhanced in the presence of limited failure cycles using embodiments of the various methods, systems, and apparatus described herein. For example, pattern sets can be ordered according to a diagnosis coverage figure, which can be used to measure chain or logic diagnosability of the pattern set. Per-pin based diagnosis techniques can also be used to analyze limited failure data.
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Citations
20 Claims
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1. A method for an electronic circuit design, the design comprising one or more scan chains with a plurality of scan cells, the method comprising:
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receiving one or more coverage scores for one or more of the scan cells, the coverage scores being associated with one or more scan patterns; determining, according to the one or more coverage scores, a diagnosis coverage figure for at least one scan chain of the one or more scan chains in relation to the one or more scan patterns, wherein the diagnosis coverage figure indicates a likelihood of detecting scan chain defects in the at least one scan chain using the one or more scan patterns; and storing the diagnosis coverage figure. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method for an electronic circuit design, the design comprising one or more system logic sections, the method comprising:
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determining one or more diagnosis coverage figures for one or more test patterns in a set of test patterns, wherein the diagnosis coverage figure is based at least in part on a number of fault pairs in the one or more system logic sections distinguished by the one or more patterns; ordering at least some of the patterns based at least in part on the one or more diagnosis coverage figures; and storing the ordered patterns. - View Dependent Claims (10)
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11. One or more computer-readable storage media having encoded thereon instructions which, when executed by a computer, cause the computer to perform a method for an electronic circuit design, the design comprising one or more scan chains with a plurality of scan cells, the method comprising:
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receiving one or more coverage scores for one or more of the scan cells, the coverage scores being associated with one or more scan patterns; and determining, according to the one or more coverage scores, a diagnosis coverage figure for at least one scan chain of the one or more scan chains in relation to the one or more scan patterns, wherein the diagnosis coverage figure indicates a likelihood of detecting scan chain defects in the at least one scan chain using the one or more scan patterns. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18)
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19. One or more computer-readable storage media having encoded thereon instructions which, when executed by a computer, cause the computer to perform a method for an electronic circuit design, the design comprising one or more system logic sections, the method comprising:
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determining one or more diagnosis coverage figures for one or more test patterns in a set of test patterns, wherein the diagnosis coverage figure is based at least in part on a number of fault pairs in the one or more system logic sections distinguished by the one or more patterns; and ordering at least some of the patterns based at least in part on the one or more diagnosis coverage figures. - View Dependent Claims (20)
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Specification