Expert system reliability assistance for electronics
First Claim
1. A method to increase electronic device reliability, comprising:
- screening an electronic device by one or more expert systems without requiring human interaction to detect a potential failure, wherein said screening includes measuring at least one characteristic of said electronic device;
selectively testing said electronic device without requiring human interaction when said screening indicates a potential failure; and
providing one or more output(s) if said selective testing of said electronic device indicates said failure.
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Abstract
Methods and systems using one or more expert systems to increase electronic device reliability. One embodiment is a method to screen an electronic device by one or more expert systems to detect a potential failure of the electronic device, selectively testing the electronic device when the screening indicates a potential failure, and providing one or more outputs if the selective testing of the electronic device indicates a failure. A second embodiment is a system to screen an electronic device by one or more expert systems to detect a potential failure, selectively testing the electronic device when the screening indicates a potential failure and providing one or more outputs if the selective testing of the electronic device indicates the failure.
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Citations
20 Claims
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1. A method to increase electronic device reliability, comprising:
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screening an electronic device by one or more expert systems without requiring human interaction to detect a potential failure, wherein said screening includes measuring at least one characteristic of said electronic device; selectively testing said electronic device without requiring human interaction when said screening indicates a potential failure; and providing one or more output(s) if said selective testing of said electronic device indicates said failure. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method to increase the reliability of an electronic device, comprising:
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screening an electronic device by one or more expert systems without requiring human interaction to detect a potential failure, wherein said screening includes measuring at least one characteristic of said electronic device; selectively testing said electronic device without requiring human interaction when said screening of said electronic device detects a potential failure; and providing a correct output to replace an incorrect output from said electronic device if said selective testing of said electronic device indicates said failure. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15, 16)
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17. A system to increase the reliability of an electronic device, comprising:
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a screening module to detect potential failure of an electronic device without requiring human interaction and selectively test said electronic device without requiring human interaction when said screening detects a potential failure, wherein said screening module includes at least one module to measure at least one characteristic of said electronic device, wherein said screening module utilizes one or more expert system modules in screening said electronic device; and a response module to provide an output if said selective test of said electronic device indicates said failure. - View Dependent Claims (18, 19, 20)
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Specification