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Expert system reliability assistance for electronics

  • US 8,447,553 B1
  • Filed: 07/22/2010
  • Issued: 05/21/2013
  • Est. Priority Date: 07/22/2010
  • Status: Expired due to Fees
First Claim
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1. A method to increase electronic device reliability, comprising:

  • screening an electronic device by one or more expert systems without requiring human interaction to detect a potential failure, wherein said screening includes measuring at least one characteristic of said electronic device;

    selectively testing said electronic device without requiring human interaction when said screening indicates a potential failure; and

    providing one or more output(s) if said selective testing of said electronic device indicates said failure.

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