Microwave datum tool

• US 8,451,162 B2
• Filed: 12/19/2006
• Issued: 05/28/2013
• Est. Priority Date: 12/20/2005
• Status: Active Grant

• Current Assignee: Walleye Technologies, Inc.
• Original Assignee: Walleye Technologies, Inc.
• Inventors: Holbrook, David S., Adams, Christopher P.
• Primary Examiner(s): Sotomayor, John B
• Assistant Examiner(s): Barker, Matthew M
• Application Number:
  US12/158,456
• Publication Number:
  US 20090153392A1
• Time in Patent Office: 2,352 Days
• Field of Search: 342/22
• US Class Current: 342/22
• CPC Class Codes: G01N 22/00 Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more G01N3/00 - G01N17/00, G01N24/00 take precedence

Abstract

In one aspect, a measurement system is disclosed that includes a source of microwave radiation having one or more wavelengths capable of penetrating through a visibly opaque obstruction, e.g., a wall. The source can be movably positioned on one side of the obstruction for illuminating thereof. The system can further include a microwave reflecting element disposed on another side of the obstruction, where the reflecting element is capable of reflecting at least a portion of the radiation transmitted through the obstruction. A plurality of radiation sensors are positioned relative to the obstruction so as to differentially detect at least a portion of the reflected radiation transmitted through the obstruction so as to determine a position of the source relative to the reflective element.

Claims

1. A measurement system, comprising

a source of radiation having one or more wavelengths capable of penetrating through an obstruction, said source being movably positioned on one side of the obstruction for illuminating thereof with said radiation,

a reflecting imaging element adapted for placement at a measurement location of interest on another side of the obstruction, said reflecting element being capable of reflecting at least a portion of the radiation transmitted through the obstruction, and

a plurality of radiation sensors positioned relative to the obstruction so as to detect at least a portion of the reflected radiation transmitted through the obstruction so as to determine a position of said source relative to said reflective element

wherein said reflecting imaging element is configured to retro-focus the radiation to form an image of the source.

2. The system of claim 1, wherein said obstruction is visibly opaque.

3. The system of claim 1, wherein said sensors differentially detect said reflected radiation.

4. The system of claim 1, wherein said sensors are positioned as so to generate a null signal when said source and said reflective element are substantially aligned.

5. The system of claim 1, wherein said source generates microwave radiation with one or more frequency components in a range of about 1 GHz to about 24 GHz.

6. The system of claim 5, wherein said source generates microwave radiation with one or more frequency components in a range of about 1 GHz to about 2 GHz.

7. The system of claim 5, wherein said source generates microwave radiation with one or more frequency components in a range of about 10 GHz to about 20 GHz.

8. The system of claim 1, wherein said obstruction comprises a wall and wherein said reflecting element is adapted for attachment to a surface of the wall.

9. The system of claim 1, wherein said reflecting imaging element forms the image of the source at an image distance greater than a distance between the source and the reflecting element.

10. The system of claim 1, wherein said reflecting imaging element comprises a Fresnel Zone Plate.

11. The system of claim 1, wherein the system comprises one or more indicators that indicate the direction of the location of interest at which the reflecting element is placed.

12. A measurement method, comprising

movably disposing a radiation source on one side of a visibly opaque obstruction, said source generating radiation having at least one wavelength capable of penetrating through said obstruction,

associating a reference imaging element to a location at an opposed side of said obstruction, said element being reflective to said at least one wavelength and being configured to retro-focus at least a portion of radiation incident thereon to form an image of said source,

directing a radiation beam having said wavelength from the source to the obstruction such that at least a portion of said radiation penetrates the obstruction to illuminate said reference element, and

detecting at least a portion of radiation reflected by said element at two or more spatially separate locations so as to determine a position of the source relative to the reflective element.

13. The method of claim 12, further comprising selecting said at least one frequency to be in a range of about 1 GHz to about 24 GHz.

14. The method of claim 13, further comprising selecting said at least one frequency to be in a range of about 10 GHz to about 20 GHz.

15. The method of claim 12, wherein said detecting step comprises differentially detecting said reflected radiation at said two or more locations.

16. The method of claim 12, wherein the step of associating said reflective element with a location comprises disposing said reflective element on a surface of said obstruction.

17. The method of claim 16, wherein said obstruction comprises a wall and disposing said reflective element on a surface of said obstruction comprises attaching the reflective element to a surface of the wall.

18. The method of claim 12, wherein the step of directing the radiation further comprises positioning the source so as to illuminate said reflective element by the radiation beam.

19. The method of claim 12, wherein determining a position of the source relative to the reflective element comprises determining an angle of incident of said radiation beam on said reflective element.

20. The method of claim 12, wherein said location is a measurement location of interest.

21. The method of claim 12, wherein said reflecting imaging element forms the image of the source at an image distance greater than a distance between the source and the reflecting element.

22. The method of claim 12, wherein said reflecting imaging element comprises a Fresnel Zone Plate.

23. The method of claim 12, further comprising one or more indicators that indicate the direction of the location of the reflecting element.

24. A measurement system, comprising

a source of radiation having one or more wavelengths capable of penetrating through an obstruction, said source being movably positioned on one side of the obstruction for illuminating thereof with said radiation,

a reflecting imaging microwave optical device disposed on another side of said obstruction, said reflecting microwave optical device being capable of reflecting at least a portion of the radiation transmitted through the obstruction and being configured to retro-focus the radiation to form an image of said source, and

a plurality of radiation sensors positioned relative to the obstruction so as to detect at least a portion of the reflected radiation transmitted through the obstruction so as to determine a position of said source relative to said reflecting microwave optical device.