Differential polarization measuring extension unit for a laser-scanning microscope
First Claim
1. A differential polarization laser-scanning microscope (DP-LSM) for determining differential polarization quantities of a material, comprising:
- a laser light source (L) for scanning the sample and illuminating it with a coherent and monochromatic light,a microscope unit (ME) with a sample holder for providing a preselected optical magnification and imaging,a polarization state setting unit (PAA) positioned in the illuminating beam path (between the light source and the sample holder), whereindetectors (D1, D2) in the observing beam path and at least one filter holder in front of the detectors, anda signal-processing unit (VE) for processing the electric signals of the detectors, andan optical element (DP), located in the common beam path comprising the illuminating and the observing beams, for separating the orthogonal polarization components, wherein optical elements for separating the illuminating and observing light beam are provided on both sides of the photo-elastic modulator (PEM) or electro-optical unit.
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Accused Products
Abstract
The invention relates to a differential polarizing laser-scanning microscope (DP LSM) for determining differential polarization quantities of a material, comprising a laser light source (L) for scanning the sample and illuminating it with a coherent and monochromatic light, a microscope unit (ME) with a sample holder for providing a preselected optical magnification and imaging and a polarization state setting unit (PAA) positioned in the illuminating beam path (between the light source and the sample holder). The microscope is further provided with detectors (D1, D2) in the observing beam path, at least one filter holder in front of the detectors and a signal-processing unit (VE) for processing the electrical signals of the detectors. In the DP-LSM microscope an optical element (DP) is located in the common beam path comprising the illuminating and the observing beams, for separating the orthogonal polarization components.
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Citations
12 Claims
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1. A differential polarization laser-scanning microscope (DP-LSM) for determining differential polarization quantities of a material, comprising:
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a laser light source (L) for scanning the sample and illuminating it with a coherent and monochromatic light, a microscope unit (ME) with a sample holder for providing a preselected optical magnification and imaging, a polarization state setting unit (PAA) positioned in the illuminating beam path (between the light source and the sample holder), wherein detectors (D1, D2) in the observing beam path and at least one filter holder in front of the detectors, and a signal-processing unit (VE) for processing the electric signals of the detectors, and an optical element (DP), located in the common beam path comprising the illuminating and the observing beams, for separating the orthogonal polarization components, wherein optical elements for separating the illuminating and observing light beam are provided on both sides of the photo-elastic modulator (PEM) or electro-optical unit. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A laser-scanning microscope (LSM) for determining differential polarization quantities of a sample, comprising:
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a laser light source (L) for generating a coherent and monochromatic light, a laser optical unit (LOE) with a dichroic beam splitter (DBS) and a laser scanning unit (LPE) for scanning the laser beam onto the sample and illuminating it with the laser light, a polarization state setting unit (PAA) between the laser light source (L) and the laser optical unit (LOE), a microscope unit (ME) with a sample holder (S), a mirror (M), and an objective (O) arranged on the optical axis between the sample holder (S) and the mirror (M), for providing a preselected optical magnification and imaging, a detector (D1) attached to the microscope unit (ME) for detecting an observing beam transmitted through the sample and a detector (D2) attached to the laser optical unit (LOE) for detecting the reflected or fluorescent observing beam received from the sample, and a signal-processing unit (VE) for processing the electric signals of the detectors (D1, D2), and a DP extension unit, in the form of an optical element (DP), located between the microscope unit (ME) and the laser optical unit (LOE) in the common beam path comprising the illuminating laser beam and the observing reflected laser beam or fluorescence emission elicited by the laser beam, for separating the orthogonal polarization components either of the illuminating laser beam or of the observing beam, in time. - View Dependent Claims (8, 9, 10, 11, 12)
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Specification