Temperature control within storage device testing systems

• US 8,451,608 B2
• Filed: 04/16/2009
• Issued: 05/28/2013
• Est. Priority Date: 04/17/2008
• Status: Active Grant

• Current Assignee: Teradyne Incorporated
• Original Assignee: Teradyne Incorporated
• Inventors: Merrow, Brian S.
• Primary Examiner(s): Datskovskiy, Michail V
• Application Number:
  US12/937,918
• Publication Number:
  US 20110083825A1
• Time in Patent Office: 1,503 Days
• Field of Search: 361/679.31, 361/679.33, 36167946-67953, 361/688, 361/689, 361690-699, 361724-728, 361/831, 165/80.2, 165/80.4, 165/80.5, 165/104.33, 165/104.34, 165121-126, 165/114, 165/119, 165/185, 324/73.1, 324/158.1, 324/750.03, 324/750.08, 324/750.14, 62/32, 62/37, 622/592, 714/25, 714/42, 738/625.41, 738/656
• US Class Current: 361/696
• CPC Class Codes: G05D 23/1934 each space being provided with one sensor acting on one or more control means

Abstract

A storage device testing system cooling circuit includes a plurality of test racks. Each of the test racks include a test slot compartment and a test electronics compartment. Each of the test slot compartments includes multiple test slots, and one or more cooling conduits configured to convey a cooling liquid toward the test slots. Each of the test electronics compartments includes test electronics configured to communicate with the test slots for executing a test algorithm, and a heat exchanger in fluid communication with the one or more cooling conduits. The heat exchanger is configured to cool an air flow directed toward the test electronics.

Claims

1. A storage device testing system cooling circuit (20) comprising:

a plurality of test racks each comprising;

a test slot compartment comprising

multiple test slots; and

one or more cooling conduits configured to convey a cooling liquid toward the test slots; and

a test electronics compartment comprising;

test electronics configured to communicate with the test slots for executing a test algorithm; and

a heat exchanger in fluid communication with the one or more cooling conduits and configured to cool an air flow directed toward the test electronics.

2. The storage device testing system cooling circuit of claim 1, further comprising an inlet conduit disposed between the cooling conduits and a liquid supply line and configured to convey a liquid flow from the liquid supply line toward the cooling conduits.

3. The storage device testing system cooling circuit of claim 2, wherein the inlet conduit includes a strainer configured to remove particulate from the liquid flow.

4. The storage device testing system cooling circuit of claim 2 or claim 3, wherein the inlet conduit includes a forward-pressure regulator configured to control the inlet pressure of the liquid flow to the cooling conduits.

5. The storage device testing system cooling circuit of claim 2, wherein the inlet conduit includes a distribution manifold comprising a plurality of tee connections each configured to portion the liquid flow to a corresponding one of test racks.

6. The storage device testing system cooling circuit of claim 2, wherein the inlet conduit comprises a shut-off valve configured to isolate the test racks from the liquid supply line.

7. The storage device testing system cooling circuit of claim 2, wherein the inlet conduit comprises a plurality of shut-off valves each configured to isolate a corresponding one of the test racks from the liquid supply line.

8. The storage device testing system cooling circuit of claim 1, further comprising an outlet conduit disposed between the heat exchangers and a liquid return line and configured to convey a liquid flow from the heat exchangers toward the liquid return line.

9. The storage device testing system cooling circuit of claim 8, wherein the outlet conduit comprises a return manifold comprising a plurality of tee connections each providing a fluid connection between a corresponding one of the heat exchangers and the return manifold.

10. The storage device testing system cooling circuit of claim 8, wherein the outlet conduit includes an outlet shut-off valve configured to isolate the test racks from the liquid return line.

11. The storage device testing system cooling circuit of claim 8, wherein the outlet conduit comprises a plurality of outlet shut-off valves each configured to isolate a corresponding one of the test racks from the liquid return line.

12. The storage device testing system cooling circuit of claim 8, wherein at least one of the test racks further comprises an air mover disposed within the test electronics compartment and configured to direct an air flow across the heat exchanger and toward the test electronics for cooling the test electronics.

13. The storage device testing system cooling circuit of claim 1, wherein the test electronics compartments are substantially isolated from the test slot compartments such that air flow between the test electronics compartments and the test slot compartments is substantially inhibited.

14. A storage device testing system cooling circuit comprising:

a test rack comprising;

a test slot compartment comprising;

a test slot, and

a test electronics compartment comprising;

test electronics configured to communicate with the test slot for executing a test algorithm;

an inlet conduit configured to convey a liquid to the test rack from an external source;

an outlet conduit in fluid communication with the inlet conduit and configured to convey a liquid from the test rack to a location remote from the test rack;

a heat exchanger comprising;

an inlet port in fluid communication with the inlet conduit, and

an outlet port in fluid communication with the outlet conduit;

a first air mover configured to direct cooled air from the heat exchanger toward the test electronics for cooling the test electronics;

a cooling conduit disposed within the test slot compartment configured to convey a cooling liquid towards the test slot, the cooling conduit comprising;

an inlet opening in fluid communication with the inlet conduit, and

an outlet opening in fluid communication with the outlet conduit; and

a thermoelectric device connected to the cooling conduit and configured to cool an air flow entering the test slot.

15. The storage device testing system cooling circuit of claim 14, wherein the thermoelectric device is operable to heat an air flow entering the test slot.

16. The storage device testing system cooling circuit of claim 14, wherein the test slot comprises:

a housing comprising;

an outer surface,

an internal cavity defined by the housing and comprising a test compartment for receiving a storage device for testing, and

an inlet aperture extending from the outer surface of the housing to the internal cavity.

17. The storage device testing system cooling circuit of claim 16, further comprising a second air mover disposed outside of the internal cavity and configured to direct an air flow towards the test compartment through the inlet aperture.

18. The storage device testing system cooling circuit of claim 17, wherein the thermoelectric device is disposed downstream of the second air mover and upstream of the inlet aperture.

19. The storage device testing system cooling circuit of claim 14, wherein the thermoelectric device is in electrical communication with the test electronics, wherein the test electronics are configured to control operation of the thermoelectric device.

20. The storage device testing system cooling circuit of claim 19, wherein the test slot includes a temperature sensor in electrical communication with the test electronics, wherein the test electronics are configured to control operation of the thermoelectric device based, at least in part, on signals received from the temperature sensor.

21. The storage device testing system cooling circuit of claim 19, wherein the test electronics are configured to control operation of the thermoelectric device based, at least part, on a predetermined test algorithm.