Temperature control within storage device testing systems
First Claim
Patent Images
1. A storage device testing system cooling circuit (20) comprising:
- a plurality of test racks each comprising;
a test slot compartment comprisingmultiple test slots; and
one or more cooling conduits configured to convey a cooling liquid toward the test slots; and
a test electronics compartment comprising;
test electronics configured to communicate with the test slots for executing a test algorithm; and
a heat exchanger in fluid communication with the one or more cooling conduits and configured to cool an air flow directed toward the test electronics.
4 Assignments
0 Petitions
Accused Products
Abstract
A storage device testing system cooling circuit includes a plurality of test racks. Each of the test racks include a test slot compartment and a test electronics compartment. Each of the test slot compartments includes multiple test slots, and one or more cooling conduits configured to convey a cooling liquid toward the test slots. Each of the test electronics compartments includes test electronics configured to communicate with the test slots for executing a test algorithm, and a heat exchanger in fluid communication with the one or more cooling conduits. The heat exchanger is configured to cool an air flow directed toward the test electronics.
-
Citations
21 Claims
-
1. A storage device testing system cooling circuit (20) comprising:
a plurality of test racks each comprising; a test slot compartment comprising multiple test slots; and one or more cooling conduits configured to convey a cooling liquid toward the test slots; and a test electronics compartment comprising; test electronics configured to communicate with the test slots for executing a test algorithm; and a heat exchanger in fluid communication with the one or more cooling conduits and configured to cool an air flow directed toward the test electronics. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
-
14. A storage device testing system cooling circuit comprising:
-
a test rack comprising; a test slot compartment comprising; a test slot, and a test electronics compartment comprising; test electronics configured to communicate with the test slot for executing a test algorithm; an inlet conduit configured to convey a liquid to the test rack from an external source; an outlet conduit in fluid communication with the inlet conduit and configured to convey a liquid from the test rack to a location remote from the test rack; a heat exchanger comprising; an inlet port in fluid communication with the inlet conduit, and an outlet port in fluid communication with the outlet conduit; a first air mover configured to direct cooled air from the heat exchanger toward the test electronics for cooling the test electronics; a cooling conduit disposed within the test slot compartment configured to convey a cooling liquid towards the test slot, the cooling conduit comprising; an inlet opening in fluid communication with the inlet conduit, and an outlet opening in fluid communication with the outlet conduit; and a thermoelectric device connected to the cooling conduit and configured to cool an air flow entering the test slot. - View Dependent Claims (15, 16, 17, 18, 19, 20, 21)
-
Specification