Device and method for testing a circuit
First Claim
1. A device, the device comprises:
- a processor;
an interface adapted to receive a test vector and to output a test response, wherein the test vector comprises a first group of signals that comprises idle signals and at least one information frame and a second group of signals that comprises timing signals and data signals, wherein a location in time of the at least one information frame with respect to the idle signals of the first group in the test vector is shifted as compared to a location in time of a previous test vector'"'"'s corresponding at least one information frame with respect to its idle signals, wherein the location in time of the at least one information within the first group of signals does not affect locations in time of the second group of signals with respect to a beginning of the first group of signals; and
a receiver, coupled to the interface and to the processor, wherein the receiver is adapted to receive the first group of signals and filter out the idle signals and at least one instruction frame delimiters to provide at least one instruction;
wherein the device is adapted to send the at least one instruction to at least one instruction buffer;
wherein the processor is adapted to execute the at least one instruction stored in the at least one instruction buffer and to respond to the second group of signals such as to provide the test response.
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Accused Products
Abstract
A device and a method. The device includes: (i) a processor, connected to the receiver, (ii) an interface adapted to receive a test vector and to output a test response, the test vector includes a first group of signals that include idle signals and at least one information frame and a second group of signals that include timing signals and data signals; and (iii) a receiver, connected to the interface. The receiver is adapted to receive the first group of signals and filter out the idle signals and at least one instruction frame delimiters to provide at least one instruction. The device is adapted to send the at least one instruction to at least one instruction buffer. The processor is adapted to execute at least one instruction stored in the at least one instruction buffer and to respond to the second group of signals such as to provide test responses.
27 Citations
20 Claims
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1. A device, the device comprises:
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a processor; an interface adapted to receive a test vector and to output a test response, wherein the test vector comprises a first group of signals that comprises idle signals and at least one information frame and a second group of signals that comprises timing signals and data signals, wherein a location in time of the at least one information frame with respect to the idle signals of the first group in the test vector is shifted as compared to a location in time of a previous test vector'"'"'s corresponding at least one information frame with respect to its idle signals, wherein the location in time of the at least one information within the first group of signals does not affect locations in time of the second group of signals with respect to a beginning of the first group of signals; and a receiver, coupled to the interface and to the processor, wherein the receiver is adapted to receive the first group of signals and filter out the idle signals and at least one instruction frame delimiters to provide at least one instruction; wherein the device is adapted to send the at least one instruction to at least one instruction buffer; wherein the processor is adapted to execute the at least one instruction stored in the at least one instruction buffer and to respond to the second group of signals such as to provide the test response. - View Dependent Claims (2, 3, 4, 5, 18, 20)
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6. A tester that comprises:
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a pattern generator adapted to generate a second group of signals that comprises timing signals and data signals; an interface adapted to receive information representative of at least one instruction; and a controller adapted to control a provision of a test vector to a tested device; wherein the test vector comprises the second group of signals and a first group of signals that comprises idle signals and at least one information frame, wherein a location in time of the at least one information frame with respect to the idle signals of the first group of signals in the test vector is shifted as compared to a location in time of a previous test vector'"'"'s corresponding at least one information frame with respect to its idle signals, wherein the location in time of the at least one information frame within the first group of signals does not affect locations in time of the second group of signals with respect to a beginning of the first group of signals, and wherein a size of the first group of signals in each of the first test vector is inversely proportional to a number of input pins of the tested device; wherein the controller is adapted to evaluate a test response received from the tested device in response to the test vector provided to the tested device. - View Dependent Claims (7, 8)
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9. A method for testing a device, the method comprises:
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outputting a test response; receiving a test vector, wherein the test vector comprises a first group of signals that comprises idle signals and at least one information frame and a second group of signals that comprises timing signals and data signals, wherein a location in time of the at least one information frame with respect to the idle signals of the first group of signals in the test vector is shifted as compared to a location in time of a previous test vector'"'"'s corresponding at least one information frame with respect to its idle signals, wherein the location in time of the at least one information frame within the first group of signals does not affect locations in time of the second group of signals with respect to a beginning of the first group of signals; filtering out, by a receiver, the idle signals and at least one instruction delimiters to provide at least one instruction; sending the at least one instruction to at least one instruction buffer; and generating the test response by executing the at least one instruction and by responding to the second group of signals. - View Dependent Claims (10, 11, 12, 13, 14, 19)
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15. A method for testing a tested device, the method comprises:
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generating a second group of signals that comprises timing signals and data signals; receiving information representative of at least one instruction; generating a test vector that comprises the second group of signals and a first group of signals that comprises idle signals and at least one information frame, wherein the first group of signals is responsive to the information representative of at least one instruction, and wherein a location in time of the at least one information frame with respect to the idle signals of the first group of signals in the test vector is shifted as compared to a location in time of a previous test vector'"'"'s corresponding at least one information frame with respect to its idle signals, wherein the location in time of the at least one information frame within the first group of signals does not affect locations in time of the second group of signals with respect to a beginning of the first group of signals; providing the test vector to the tested device; and comparing a test response associated with the test vector to a previous test response associated with a previous test vector in order to evaluate a functionality of the tested device, each of the test response and the previous test response received from the tested device in response to a provision of the test vector and the previous test vector respectively. - View Dependent Claims (16, 17)
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Specification