Data storage device tester
First Claim
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1. A data storage device (DSD) tester for testing a DSD, the DSD tester comprising control circuitry operable to:
- receive a DSD log from the DSD, wherein the DSD log comprises at least one entry identifying at least one marginal data sector identified during a read operation;
execute a sequence of commands associated with the marginal data sector; and
determine whether the DSD is defective in response to the executed sequence of commands,wherein the sequence of commands comprises at least one of;
commands executed prior to the read operation; and
commands executed after the read operation.
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Abstract
A data storage device (DSD) tester for testing a DSD is disclosed. The DSD tester comprises control circuitry operable to receive a DSD log from the DSD, wherein the DSD log comprises at least one entry identifying at least one error condition. A sequence of commands associated with the error condition is executed in order to determine whether the DSD is defective.
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Citations
34 Claims
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1. A data storage device (DSD) tester for testing a DSD, the DSD tester comprising control circuitry operable to:
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receive a DSD log from the DSD, wherein the DSD log comprises at least one entry identifying at least one marginal data sector identified during a read operation; execute a sequence of commands associated with the marginal data sector; and determine whether the DSD is defective in response to the executed sequence of commands, wherein the sequence of commands comprises at least one of; commands executed prior to the read operation; and commands executed after the read operation. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A method of operating a data storage device (DSD) tester for testing a DSD, the method comprising:
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receiving a DSD log from the DSD, wherein the DSD log comprises at least one entry identifying at least one marginal data sector identified during a read operation; executing a sequence of commands associated with the marginal data sector; and determining whether the DSD is defective in response to the executed sequence of commands, wherein the sequence of commands comprises at least one of; commands executed prior to the read operation; and commands executed after the read operation. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32)
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33. A data storage device (DSD) tester for testing a DSD, the DSD tester comprising control circuitry operable to:
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receive a DSD log from the DSD, wherein the DSD log comprises at least one entry identifying at least one error condition; execute a sequence of commands associated with the error condition, wherein the sequence of commands comprises at least one write command; read data from a data sector identified by the write command; write the read data to the data sector when executing the write command as part of the sequence of commands; and determine whether the DSD is defective in response to the executed sequence of commands.
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34. A method of operating a data storage device (DSD) tester for testing a DSD, the method comprising:
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receiving a DSD log from the DSD, wherein the DSD log comprises at least one entry identifying at least one error condition; executing a sequence of commands associated with the error condition, wherein the sequence of commands comprises at least one write command; reading data from a data sector identified by the write command; writing the read data to the data sector when executing the write command as part of the sequence of commands; and determining whether the DSD is defective in response to the executed sequence of commands.
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Specification