Imaging systems with column randomizing circuits

• US 8,462,240 B2
• Filed: 09/15/2010
• Issued: 06/11/2013
• Est. Priority Date: 09/15/2010
• Status: Active Grant

• Current Assignee: Aptina Imaging Corporation (ON Semiconductor Corporation)
• Original Assignee: Aptina Imaging Corporation (ON Semiconductor Corporation)
• Inventors: Takayanagi, Isao, Kawamura, Katsuyuki, Sato, Toshiaki, Matsuo, Shinichiro, Osawa, Shinji, Yoshimura, Norio, Honda, Hidenari
• Primary Examiner(s): Fan, Chieh M
• Assistant Examiner(s): CHIU, WESLEY JASON
• Application Number:
  US12/883,160
• Publication Number:
  US 20120062772A1
• Time in Patent Office: 1,000 Days
• Field of Search: 348/241
• US Class Current: 348/294
• CPC Class Codes: H04N 25/40 Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
• CPC Class Codes: H04N 25/677 for reducing the column or line fixed pattern noise
• CPC Class Codes: H04N 25/75 Circuitry for providing, modifying or processing image signals from the pixel array

Abstract

An imaging system may include an image sensor array and column randomizing multiplexers. The imaging system may include a data output circuit and image readout circuitry such as analog amplifiers, analog-to-digital converters, and memory circuits. The column randomizing multiplexers may include a first column randomizing multiplexer between the image sensor array and at least some of the image readout circuitry. The first column randomizing multiplexer may randomly connect columns of the image sensor array to the image readout circuitry. The connections made by the first column randomizing multiplexer may be randomized as each row of the image sensor array is read out. The column randomizing multiplexers may include a second column randomizing multiplexer between at least some of the image readout circuitry and the data output circuit. The second column randomizing multiplexer may reorder image data for the image readout circuitry.

Claims

1. An image sensor comprising:

an array of image sensing pixels arranged in rows and columns;

a plurality of image readout circuits;

data output circuitry;

a first multiplexer having inputs and outputs, wherein each of the inputs of the first multiplexer is coupled to a respective one of the columns of the array and wherein each of the outputs of the first multiplexer is coupled to a respective one of the image readout circuits;

a plurality of bias circuits, each of which provides a bias voltage; and

a second multiplexer that connects each of the bias circuits to a randomly-selected and different one of the columns of image sensing pixels in the array.

2. The image sensor defined in claim 1 further comprising:

a third multiplexer having inputs and outputs, wherein each of the inputs of the third multiplexer is coupled to a respective one of the image readout circuits and wherein the outputs of the third multiplexer are coupled to the data output circuitry.

3. The image sensor defined in claim 2 wherein each of the image readout circuits comprises an analog-to-digital converter.

4. The image sensor defined in claim 3 wherein each of the image readout circuits further comprises an analog amplifier.

5. The image sensor defined in claim 4 further comprising a plurality of memory circuits, wherein each memory circuit has an input connected to a respective one of the outputs of the first multiplexer and has an output connected to the data output circuitry.

6. The image sensor defined in claim 3 further comprising control circuitry that directs at least one of the first and third multiplexers to connect each of its inputs to a randomly-selected and different one of its outputs.

7. The image sensor defined in claim 3 further comprising control circuitry that directs the first multiplexer to randomize connections between the columns of the array and the image readout circuits by connecting each of the inputs of the first multiplexer to a randomly-selected and different one of the outputs of the first multiplexer, wherein the control circuitry directs the third multiplexer to de-randomize the connections as image data is transferred from the image readout circuits to the data output circuitry.

8. The image sensor defined in claim 7 wherein the control circuitry directs the third multiplexer to connect the inputs of the third multiplexer to the outputs of the third multiplexer to compensate for the randomized connections made by the first multiplexer between the columns of the array and the image readout circuits.

9. The image sensor defined in claim 3 wherein the first and third multiplexers are each formed from a plurality of smaller multiplexers having fewer inputs and outputs than the first and third multiplexers.

10. The image sensor defined in claim 9 wherein the image sensing pixels comprise red pixels, blue pixels, and green pixels arranged in a Bayer pattern.

11. An image sensor comprising:

an array of image sensing pixels arranged in rows and columns;

a plurality of bias circuits, wherein each of the bias circuits comprises a plurality of transistors and wherein, when one of the transistors is turned on, that transistor provides a bias voltage; and

circuitry that turns on a random one of the transistors in each of the bias circuits.

17. The image sensor defined in claim 11 further comprising:

a plurality of image readout circuits, wherein each of the image readout circuits comprises an analog-to-digital converter;

data output circuitry;

a first multiplexer having inputs and outputs, wherein each of the inputs of the first multiplexer is coupled to a respective one of the image readout circuits and wherein the outputs of the first multiplexer are coupled to the data output circuitry; and

a second multiplexer having inputs and outputs, wherein each of the inputs of the second multiplexer is coupled to a respective one of the columns of the array and wherein each of the outputs of the second multiplexer is coupled to a respective one of the image readout circuits.

12. An image sensor comprising:

an array of image sensing pixels arranged in rows and columns;

a plurality of analog-to-digital converters;

a first multiplexer having inputs and outputs, wherein each of the inputs of the first multiplexer is coupled to a respective one of the columns of the array and wherein each of the outputs of the first multiplexer is coupled to a respective one of the analog-to-digital converters;

an output buffer;

a second multiplexer having inputs and outputs, wherein each of the inputs of the second multiplexer is coupled to a respective one of the analog-to-digital converters and wherein the outputs of the second multiplexer are coupled to the output buffer; and

a plurality of bias circuits, wherein each of the bias circuits comprises a plurality of transistors and wherein, when one of the transistors is turned on, that transistor provides a bias voltage; and

circuitry that turns on a random one of the transistors in each of the bias circuits.

13. The image sensor defined in claim 12 further comprising a plurality of analog amplifiers each of which is connected between a respective one of the outputs of the first multiplexer and a respective one of the analog-to-digital converters.

14. A method of reducing fixed pattern column noise in images captured by an imager, wherein the imager comprises a pixel array including image sensing pixels arranged in rows and columns, a switching array, a data output circuit, and image readout circuits coupled between the pixel array and the data output circuit, the method comprising:

enabling column randomizing functions that utilize the switching array;

while the column randomizing functions are enabled, reading image data associated with a first image from the image sensing pixels in the pixel array;

disabling the column randomizing functions; and

while the column randomizing functions are disabled, reading image data associated with a second image from the image sensing pixels in the pixel array, wherein the imager further comprises circuitry that detects lower-light-flux conditions and that detects higher-light-flux conditions, wherein enabling the column randomizing functions comprises enabling the column randomizing functions in response to the circuitry detecting the lower-light-flux-conditions, and wherein disabling the column randomizing functions comprises disabling the column randomizing functions in response to the circuitry detecting the higher-light-flux-conditions.

15. The method defined in claim 14 wherein reading the image data associated with the second image from the image sensing pixels in the pixel array while the column randomizing functions are disabled comprises:

using the switching array to connect, in turn as each of the rows of the image sensing pixels is read out, each of the image sensing pixels in a given one of the columns of the image sensing pixels to a given one of the image readout circuits.

16. The method defined in claim 15 wherein reading the image data associated with the first image from the image sensing pixels while the column randomizing functions are enabled comprises:

reading image data associated with the first image from a first one of the rows of the image sensing pixels by using the switching array to connect each of the image sensing pixels in the first one of the rows to a randomly-selected and different one of the image readout circuits; and

reading image data associated with the first image from a second one of the rows of image sensing pixels by using the switching array to connect each of the image sensing pixels in the second one of the rows to a randomly-selected and different one of the image readout circuits, wherein, while reading image data associated with the first image, the switching array connects the image sensing pixels in the first one of the rows of the array to the image readout circuits in a different pattern than the switching array connects the image sensing pixels in the second one of the rows of the array to the image readout circuits.