Method for integrating event-related information and trace information

• US 8,473,275 B2
• Filed: 05/22/2008
• Issued: 06/25/2013
• Est. Priority Date: 03/29/2002
• Status: Expired due to Fees

• Current Assignee: Monterey Research, LLC (Vector Capital Corporation)
• Original Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Inventors: Nemecek, Craig, Pleis, Matt, Bartz, Manfred
• Primary Examiner(s): Fernandez Rivas, Omar
• Assistant Examiner(s): LUU, CUONG V
• Application Number:
  US12/125,766
• Publication Number:
  US 20080222453A1
• Time in Patent Office: 1,860 Days
• Field of Search: 703/23, 703/24, 703/27, 703/28, 717/128, 717/158, 381/370, 719/327, 702/188
• US Class Current: 703/28
• CPC Class Codes: G06F 11/3636 by tracing the execution of the program

Abstract

A method for emulating and debugging a microcontroller is described. In one embodiment, an event thread is executed on an emulator that operates in lock-step with the microcontroller. Event information is sampled at selected points. Trace information is also recorded at the selected points. As such, the event information and trace information are effectively pre-filtered. Accordingly, it is not incumbent on a designer to read and understand the event and trace information and sort out the information that is of interest. Instead, this task is essentially done automatically, helping the designer and reducing the probability of error. Furthermore, because only selected event and trace information is recorded, the resources of the in-circuit emulator system are not taxed.

Claims

1. A method for emulating and debugging a device, said method comprising:

executing an event thread on an emulator of said device, said event thread comprising a condition, wherein the condition is detected when an input signal exceeds at least one threshold;

sampling event information from said device for a period of time during which said condition is detected for the input signal; and

starting and stopping trace memory to record trace information from said device for a period of time in response to the input signal exceeding the at least one threshold.

2. The method of claim 1 further comprising:

applying time stamps to said event information and said trace information; and

displaying said event information and said trace information as timewise waveforms.

3. The method of claim 2 comprising parsing said event information and said trace information using said time stamps.

4. The method of claim 1 further comprising

receiving a signal via an external pin of said emulator, said signal causing a response from said device;

sampling second event information from said device and stopping said trace memory to record second trace information from said device at the time of said response; and

correlating said second event information and said second trace information with said signal.

5. The method of claim 4 further comprising time-stamping said signal.

6. The method of claim 4 further comprising displaying said signal as a waveform.

7. The method of claim 1 wherein said device is a mixed signal microcontroller for processing analog and digital signals.

8. A method for emulating and debugging a device, said method comprising:

receiving and executing an event thread comprising an event point, wherein said executing is performed on an emulator;

detecting said event point when an input signal exceeds at least one threshold;

recording trace information from said device by starting and stopping trace memory in response to the input signal exceeding the at least one threshold; and

storing event information for a period of time corresponding to said starting and stopping trace memory.

9. The method of claim 8 further comprising displaying said trace information as a first timewise waveform and said event information as a second timewise waveform.

10. The method of claim 8 further comprising:

applying time stamps to said trace information and to said event information; and

using said time stamps to display said event information and said trace information as timewise waveforms.

11. The method of claim 10 further comprising parsing said event information and said trace information using said time stamps.

12. The method of claim 8 further comprising:

receiving a signal via an external pin;

sampling said signal;

correlating said signal with said trace information; and

displaying said signal as waveform.

13. The method of claim 8 wherein said device is a mixed signal microcontroller for processing analog and digital signals.

14. An emulation and debugging system comprising:

an in-circuit emulator capable of being coupled with a device, wherein said in-circuit emulator is configured to execute an event thread and is further configured to detect a condition defined for said event thread, wherein event information generated as a result of executing said event thread is sampled in response to detecting said condition and wherein sampled event information is stored in memory, and wherein the in-circuit emulator further comprises a trace memory configured to start and stop recording trace information in response to an input signal exceeding at least one threshold.

15. The system of claim 14 wherein time-stamps are applied to said sampled event information and recorded trace information.

16. The system of claim 14 further comprising a display device coupled to said in-circuit emulator, said display device operable to display a first waveform representing said sampled event information and a second waveform representing said recorded trace information.

17. The system of claim 14 further comprising an external pin coupled to said in-circuit emulator, wherein a signal received via said external pin is sampled and correlated with said recorded trace information.

18. The system of claim 17 wherein said signal is time-stamped.

19. The system of claim 17 wherein said signal is displayed as a waveform.

20. The system of claim 14 wherein said device is a mixed signal microcontroller for processing analog and digital signals.