Interface for MEMS inertial sensors

• US 8,476,970 B2
• Filed: 09/13/2011
• Issued: 07/02/2013
• Est. Priority Date: 09/14/2010
• Status: Active Grant

• Current Assignee: Goodix Technology Co., Ltd. (Shenzhen Goodix Technology Co., Ltd.), Shenzhen Goodix Technology Co., Ltd.
• Original Assignee: Ware Systems Sae Si
• Inventors: Mokhtar, Ahmed, Elmallah, Ahmed, Elshennawy, Ahmed, Shaban, Ahmed, George, Botros, Elmala, Mostafa, Ismail, Ayman, Sakr, Mostafa, Elsayed, Ayman
• Primary Examiner(s): POOS, JOHN W
• Application Number:
  US13/231,758
• Publication Number:
  US 20120235724A1
• Time in Patent Office: 658 Days
• Field of Search: 327/552, 327/554, 330/9, 735/041.2
• US Class Current: 327/554
• CPC Class Codes: G01C 19/5776 Signal processing not specific to any of the devices covered by groups G01C19/5607 - G01C19/5719
• CPC Class Codes: G01P 15/125 by capacitive pick-up

Abstract

In a high-performance interface circuit for micro-electromechanical (MEMS) inertial sensors, an excitation signal (used to detect capacitance variation) is used to control the value of an actuation signal bit stream to allow the dynamic range of both actuation and detection paths to be maximized and to prevent folding of high frequency components of the actuation bit stream due to mixing with the excitation signal. In another aspect, the effects of coupling between actuation signals and detection signals may be overcome by performing a disable/reset of at least one of and preferably both of the detection circuitry and the MEMS detection electrodes during actuation signal transitions. In a still further aspect, to get a demodulated signal to have a low DC component, fine phase adjustment may be achieved by configuring filters within the sense and drive paths to have slightly different center frequencies and hence slightly different delays.

Claims

1. An integrated circuit for interfacing with a MEMS sensor, comprising:

a electrostatic actuation controller configured to generate an actuation signal and an excitation signal and to receive a sense information signal;

a drive capacitance-to-voltage converter responsive to a signal from the MEMS sensor for producing a drive signal, and a sensing capacitance-to-voltage converter responsive to a signal from the MEMS sensor for producing a sense signal;

a demodulator coupled to the drive signal and the sense signal for demodulating sense information carried by the sense signal to produce the sense information signal; and

time alignment circuitry coupled to at least one of the drive signal and the sense signal for, prior to multiplying, performing time alignment of the drive signal and the sense signal by creating a relative delay between the drive signal and the sense signal, comprising;

a fine time delay circuit comprising at least one filter configured to create a fine time delay between the drive signal and the sense signal.

2. The apparatus of claim 1, further comprising a coarse time delay circuit coupled to one of the drive signal and the sense signal.

3. The apparatus of claim 2, wherein the coarse time delay circuit comprises a programmable shift register.

4. A method of processing MEMS sensor signals including a drive signal and a sense signal for detecting capacitance variations caused by motion of a mass of the MEMS sensor, the method comprising:

multiplying the drive signal and the sense signal; and

prior to multiplying performing time alignment of the drive signal and the sense signal by creating a relative delay between the drive signal and the sense signal, wherein creating a relative delay comprises;

performing filtering of at least one of the drive signal and the sense signal so as to create a fine time delay between the drive signal and the sense signal.

5. The method of claim 4, further comprising creating a coarse time delay between the drive signal and the sense signal.

6. The method of claim 5, wherein creating the coarse time delay is performed using a programmable shift register.

7. The method of claim 4, wherein creating the fine time delay comprises:

filtering the drive signal using a first filter; and

filtering the sense signal using a second filter;

wherein the first filter and the second filter have different time delays.

8. The method of claim 7, wherein the first filter and the second filter have different center frequencies.

9. The method of claim 8, wherein the first filter and the second filter are bandpass filters.

10. An integrated circuit for processing MEMS sensor signals including a drive signal and a sense signal for detecting capacitance variations caused by motion of a mass of the MEMS sensor, the method comprising:

circuitry for multiplying the drive signal and the sense signal; and

circuitry coupled to at least one of the drive signal and the sense signal for, prior to multiplying, performing time alignment of the drive signal and the sense signal by creating a relative delay between the drive signal and the sense signal, comprising;

a fine time delay circuit comprising at least one filter configured to create a fine time delay between the drive signal and the sense signal.

11. The apparatus of claim 10, wherein the circuitry for performing time alignment further comprises a coarse time delay circuit.

12. The apparatus of claim 11, wherein the coarse time delay circuit comprises a programmable shift register.

13. The apparatus of claim 10, wherein the fine time delay circuit comprises:

a first filter for filtering the drive signal; and

a second filter for filtering the sense signal;

wherein the first filter and the second filter are configured to have different time delays.

14. The apparatus of claim 13, wherein the first filter and the second filter have different center frequencies.

15. The apparatus of claim 14, wherein the first filter and the second filter are bandpass filters.