Process for making an electric testing of electronic devices
First Claim
1. A process for electrically testing an electronic device, the process comprising:
- coupling the electronic device to an automatic testing apparatus suitable for testing digital circuits;
sending control signals through said automatic testing apparatus to electrically test said electronic device;
coupling a reconfigurable digital interface to said automatic testing apparatus and to said electronic device through a dedicated digital communication channel having a limited number of communication lines configured to exchange test information between the automatic testing apparatus and the electronic device;
testing said electronic device through said reconfigurable digital interface; and
sending from said electronic device to said automatic testing apparatus response messages containing test result data in response to said control signals, the response messages being sent through said dedicated digital communication channel.
1 Assignment
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Accused Products
Abstract
A process for electrically testing electronic devices includes connecting at least one electronic device to an automatic testing apparatus suitable for testing digital circuits, and sending, through the apparatus, control signals for electrically testing the electronic device. The process further includes electrically testing the electronic device through at least one reconfigurable digital interface connected to the apparatus through a dedicated digital communication channel and comprising a limited number of communication or connection lines strictly appointed to the exchange of the testing information. Response messages are sent from the electronic device to the apparatus through the digital communication channel in response to the control signals. The response messages contain mesaurements, failure information, and data.
17 Citations
26 Claims
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1. A process for electrically testing an electronic device, the process comprising:
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coupling the electronic device to an automatic testing apparatus suitable for testing digital circuits; sending control signals through said automatic testing apparatus to electrically test said electronic device; coupling a reconfigurable digital interface to said automatic testing apparatus and to said electronic device through a dedicated digital communication channel having a limited number of communication lines configured to exchange test information between the automatic testing apparatus and the electronic device; testing said electronic device through said reconfigurable digital interface; and sending from said electronic device to said automatic testing apparatus response messages containing test result data in response to said control signals, the response messages being sent through said dedicated digital communication channel. - View Dependent Claims (2, 3, 4, 5, 6)
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7. An electronic device comprising:
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a first circuit configured to be tested by an automatic testing apparatus; a communication interface coupled to the first circuit and having a communication line, the communication interface being configured to receive control signals from the automatic testing apparatus for testing the first circuit, the communication interface being further configured to communicate test response messages from the first circuit to the automatic testing apparatus; a reconfigurable digital interface RDI coupled to the first circuit and to the communication interface, the communication interface being configured to communicatively couple the reconfigurable digital interface to the automatic testing apparatus, the reconfigurable digital interface being configured to digitally interface with the automatic testing apparatus through the communication interface and to couple the first circuit to the automatic testing apparatus to facilitate testing of the first circuit by the automatic testing apparatus. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A system comprising:
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a first circuit; an automatic testing apparatus configured to test a functionality of the first circuit; and a reconfigurable digital interface coupled to the first circuit and configured to interface with the automatic testing apparatus, to receive configuration signals from the automatic testing apparatus to reconfigure the reconfigurable digital interface to enable the automatic testing apparatus to test the functionality first circuit, to communicate test signals from the automatic testing apparatus to the first circuit, and to communicate test response signals from the first circuit to the automatic testing apparatus. - View Dependent Claims (23, 24, 25, 26)
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Specification