Particle beam microscope and method for operating the particle beam microscope
First Claim
1. A method of operating a particle beam microscope, which comprises an objective lens having an object region, wherein the method comprises:
- detecting at least one of light rays which emanate from a structure and particles which emanate from the structure, wherein the structure comprises at least one of at least a portion of a surface of an object and at least a portion of a surface of an object holder of the particle beam microscope;
generating a surface model of the structure depending on the at least one of the detected light rays and the detected particles;
determining a position and an orientation of the surface model of the structure relative to the object region;
determining a measurement location relative to the surface model of the structure; and
positioning the object depending on the generated surface model of the structure, depending on the determined position and orientation of the surface model of the structure, and depending on the determined measurement location.
3 Assignments
0 Petitions
Accused Products
Abstract
A method for operating a particle beam microscope comprising detecting light rays or particles which emanate from a structure, wherein the structure comprises at least one of: at least a portion of a surface of an object and at least a portion of a surface of an object holder of the particle beam microscope; generating a surface model of the structure depending on the at least one of the detected light rays and the particles; determining a position and an orientation of the surface model of the structure relative to the object region; determining a measurement location relative to the surface model of the structure; and positioning the object depending on the generated surface model of the structure, depending on the determined position and orientation of the surface model of the structure, and depending on the determined measurement location.
14 Citations
26 Claims
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1. A method of operating a particle beam microscope, which comprises an objective lens having an object region, wherein the method comprises:
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detecting at least one of light rays which emanate from a structure and particles which emanate from the structure, wherein the structure comprises at least one of at least a portion of a surface of an object and at least a portion of a surface of an object holder of the particle beam microscope; generating a surface model of the structure depending on the at least one of the detected light rays and the detected particles; determining a position and an orientation of the surface model of the structure relative to the object region; determining a measurement location relative to the surface model of the structure; and positioning the object depending on the generated surface model of the structure, depending on the determined position and orientation of the surface model of the structure, and depending on the determined measurement location. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method of operating a particle beam microscope, wherein the method comprises:
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detecting at least one of light rays, which emanate from a structure and particles, which emanate from the structure, wherein the structure comprises at least one of at least a portion of a surface of an object and at least a portion of a surface of an object holder of the particle beam microscope; generating a surface model of the structure depending on the at least one of the detected light rays and the detected particles; generating a surface model of a microscope portion of the particle beam microscope; combining the surface model of the structure and the surface model of the microscope portion to generate a combined surface model; determining a distance between the surface model of the structure and the surface model of the microscope portion depending on the combined surface model; and monitoring the distance during a positioning of the object. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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19. A particle beam microscope system, comprising:
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an objective lens, having an object region; an object holder which is configured such that an object is mountable on the object holder; a positioning device, which is configured to adjust at least one of a position and an orientation of the object holder relative to the object region; a detecting device, which is configured to detect at least one of light rays, which emanate from a structure, and particles, which emanate from the structure, wherein the structure comprises at least one of at least a portion of a surface of the object holder and at least a portion of a surface of the object; a computer, which is configured for signal communication with the positioning device and the detecting device, wherein the computer is further configured to; generate a surface model of the structure depending on the at least one of the detected light rays and the detected particles; determine a position and an orientation of the surface model of the structure relative to the object region; determine a measurement location relative to the surface model of the structure; and
toposition the object depending on the determined surface model of the structure, the determined position and orientation of the surface model of the structure and the determined measurement location. - View Dependent Claims (20, 21, 22, 23)
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24. A particle beam microscope system, comprising:
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an objective lens, having an object region; an object holder, which is configured such that an object is mountable on the object holder; a positioning device, which is configured to adjust at least one of a position and an orientation of the object holder relative to the object region; a detecting device, which is configured to detect at least one of light rays which emanate from a structure and particles, which emanate from the structure, wherein the structure comprises at least one of at least a portion of a surface of the object holder and at least a portion of a surface of the object; a computer, which is configured for signal communication with the positioning device and with the detecting device; wherein the computer is configured to; generate a surface model of the structure depending on the at least one of the detected light rays and the detected particles; generate a surface model of a microscope portion of the particle beam microscope system; combine the surface model of the structure and the surface model of the microscope portion to generate a combined surface model; determine a distance between the surface model of the structure and the surface model of the microscope portion depending on the combined surface model; and
tomonitor the distance during a positioning of the object. - View Dependent Claims (25, 26)
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Specification