Magnetic ink for marking defective parts or assemblies during manufacturing

• US 8,494,787 B2
• Filed: 03/21/2008
• Issued: 07/23/2013
• Est. Priority Date: 03/21/2007
• Status: Expired due to Fees

• Current Assignee: Quidel Corporation
• Original Assignee: Quidel Corporation
• Inventors: McLeod, Scot
• Primary Examiner(s): Teixeira Moffat, Jonathan C
• Assistant Examiner(s): SUN, XIUQIN
• Application Number:
  US12/077,885
• Publication Number:
  US 20080262644A1
• Time in Patent Office: 1,950 Days
• Field of Search: 702/35, 156/64, 156/248, 700/222, 700/224, 101/35, 209/3.3, 209/33, 235/449, 436/174, 348/127, 114/356, 427/130, 429/127
• US Class Current: 702/35
• CPC Class Codes: G01N 27/84 by applying magnetic powder or magnetic ink

Abstract

Magnetic ink is used to mark defective parts or assemblies during manufacturing, thereby allowing the defective parts or assemblies to be detected in products following manufacturing, even if they are concealed or hidden in the final product. An example of such a defect-containing product is a laminated microfluidic device which contains a defective capillary.

Claims

1. A method for detecting a defective component in a laminated device which is a final or intermediate product of a continuous manufacturing process which employs an assembly line,

the method comprising:

a) identifying a defect in said defective component during said continuous manufacturing process, by means of a scanning device placed at one of a plurality of inspection points within the assembly line, wherein each said inspection point comprises such a scanning device in communication with means for applying magnetic ink;

b) marking the defective component with said magnetic ink during said continuous manufacturing process;

c) detecting the magnetic ink in said final or intermediate product containing the defective component; and

d) isolating the final or intermediate product in which said magnetic ink is detected, said product containing the defective component,

wherein said magnetic ink is substantially concealed in said final or intermediate product,

and wherein said defect is in a layer of said laminated device which is substantially concealed in said final or intermediate product, due to lamination of components.

2. The method of claim 1, wherein the final or intermediate product is a laminated microfluidic device, and the defect is a defective capillary within the microfluidic device.

3. The method of claim 1, wherein the manufacturing process comprises a reel-to-reel process.

4. The method of claim 3, wherein the defect is identified using a camera to visually inspect the defective component during the manufacturing process.

5. The method of claim 1, wherein the marking is performed by spraying magnetic ink on the defective component.

6. The method of claim 1, wherein the marking is performed by spotting magnetic ink on the defective component.

7. The method of claim 1, wherein the final or intermediate product is an assay device.

8. The method of claim 7, wherein the assay device is a laminated test strip-based assay device.