Electrical connecting apparatus
First Claim
1. An electrical connecting apparatus comprising a probe base plate, and a plurality of contacts provided with tips to be pressed against electrodes of a device under test and arranged on an underside of said probe base plate, wherein the nearer the contacts are to a center of said probe base plate, the smaller are distance dimensions from an imaginary plane under the tips to the tips of said contacts, the imaginary plane being parallel to said probe base plate.
1 Assignment
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Accused Products
Abstract
An embodiment of an electrical connecting apparatus comprises a probe base plate and a plurality of contacts provided with tips to be pressed against electrodes of a device under test and arranged on the underside of the probe base plate. The distance dimensions from an imaginary plane parallel to the probe base plate to the tips of the contacts are made the greater toward the center of the probe base plate.
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Citations
19 Claims
- 1. An electrical connecting apparatus comprising a probe base plate, and a plurality of contacts provided with tips to be pressed against electrodes of a device under test and arranged on an underside of said probe base plate, wherein the nearer the contacts are to a center of said probe base plate, the smaller are distance dimensions from an imaginary plane under the tips to the tips of said contacts, the imaginary plane being parallel to said probe base plate.
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11. A probe assembly, comprising:
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a base plate; a first contact protruding from a first region of the base plate and having a dimension of a first size, a tip of said first contact contacting a device under test; and a second contact protruding from a second region of the base plate and having the dimension of a second size, a tip of said second contact contacting the device under test, wherein the dimensions are distances from said base plate to the tip of each contact and the dimensions of the first size is greater than the second size. - View Dependent Claims (12, 13, 14, 15, 16, 17)
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18. A test head, comprising:
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a wiring board having first and second conductive paths; and a probe assembly, including; a base plate; a first contact protruding from a first region of the base plate, having a dimension of a first size, and coupled to the first conductive path; and a second contact protruding from a second region of the base plate, having the dimension of a second size, and coupled to the second conductive path, wherein the dimensions are distances from said base plate to the tip of each contact and the dimensions of the first size is greater than the second size.
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19. A test system, comprising:
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a test head operable to provide a signal to and receive a signal from at least one integrated circuit, the test head including; a wiring board having first and second conductive paths; and a probe assembly, including; a base plate; a first contact protruding from a first region of the base plate, having a dimension of a first size, coupled to the first conductive path, and operable to press against a first node of the at least one integrated circuit; and a second contact protruding from a second region of the base plate, having the dimension of a second size, coupled to the second conductive path, and operable to press against a second node of the at least one integrated circuit; and a chuck operable to hold the at least one integrated circuit for engagement with the test head, wherein the dimensions are distances from said base plate to the tip of each contact and the dimensions of the first size is greater than the second size.
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Specification