Spatially-selective reflector structures, reflector disks, and systems and methods for use thereof

• US 8,508,592 B2
• Filed: 02/25/2010
• Issued: 08/13/2013
• Est. Priority Date: 02/25/2009
• Status: Active Grant

• Current Assignee: University of Memphis Research Foundation
• Original Assignee: University of Memphis Research Foundation
• Inventors: Furxhi, Orges, Jacobs, Eddie L., Layton, Thomas
• Primary Examiner(s): Divecha, Kamal B
• Assistant Examiner(s): MADAMBA, GLENFORD J
• Application Number:
  US12/713,049
• Publication Number:
  US 20100253783A1
• Time in Patent Office: 1,265 Days
• Field of Search: 348/143, 372/14
• US Class Current: 348/143
• CPC Class Codes: G01J 1/04 Optical or mechanical part supplementary adjustable parts
• CPC Class Codes: G01V 8/005 operating with millimetre waves, e.g. measuring the black losey radiation
• CPC Class Codes: G02B 26/0816 by means of one or more reflecting elements
• CPC Class Codes: H04N 23/20 for generating image signals from infrared radiation only
• CPC Class Codes: H04N 5/33 Transforming infrared radiation cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20
• CPC Class Codes: Y10T 156/10 Methods of surface bonding and/or assembly therefor
• CPC Class Codes: Y10T 29/49888 Subsequently coating

Abstract

The invention provides a spatially-selective reflective structure for the detection of submillimeter electromagnetic waves and systems and methods incorporating spatially-selective reflective structures. One aspect of the invention provides a spatially-selective reflective structure including a partially-conducting slab and a modulating reflector disk adjacent to the partially-conducting slab. The modulating reflector disk includes a plurality of modulations. Another aspect of the invention provides a submillimeter imaging device including submillimeter wave optics, a spatially-selective reflective structure located in the focal plane of the submillimeter wave optics, a submillimeter wave receiver positioned to capture waves reflected from the spatially-selective reflective structure, and a motor configured to rotate the spatially-selective reflective structure. The spatially-selective reflective structure includes a partially-conducting slab and a modulating reflector disk adjacent to the partially-conducting slab. The modulating reflector plate includes one or more modulations.

Claims

1. A spatially-selective reflective structure comprising:

a partially-conducting slab; and

a modulating reflector disk adjacent to the partially-conducting slab, the modulating reflector disk having one or more modulations;

wherein;

the distance between the modulations of the modulating reflector disk and the partially-conducting slab is defined by the formula

2. The spatially-selective reflective structure of claim 1, wherein the one or more modulations is a single modulation.

3. The spatially-selective reflective structure of claim 1, wherein the one or more modulations is a plurality of modulations.

4. The spatially-selective reflective structure of claim 3, wherein the plurality of modulations are arranged in a spiral pattern.

5. The spatially-selective reflective structure of claim 3, wherein the plurality of modulations are arranged randomly.

6. The spatially-selective reflective structure of claim 1, wherein the plurality of modulations are arranged such that a matrix having a plurality rows, each with elements corresponding to a fraction of each pixel in a viewing window projected onto the disk that is backed by a modulation at a distinct rotational position of the disk, has linearly independent rows.

7. The spatially-selective reflective structure of claim 1, wherein the plurality of modulations are separated by a multiple of a wavelength of interest.

8. The spatially-selective reflective structure of claim 7, wherein the multiple is an odd multiple.

9. The spatially-selective reflective structure of claim 7, wherein the multiple is greater than five.

10. The spatially-selective reflective structure of claim 1, wherein the one or more modulations have well-defined edges.

11. The spatially-selective reflective structure of claim 1, wherein the partially-conducting slab is a semiconductor.

12. The spatially-selective reflective structure of claim 1, wherein the partially-conducting slab is a dielectric doped with conductive particles.

13. The spatially-selective reflective structure of claim 1, wherein the partially-conducting slab comprises:

a non-conductive plate; and

a thin metal film applied to the non-conductive plate.

14. The spatially-selective reflective structure of claim 1, wherein the modulating reflector disk comprises a highly-conductive metal.

15. The spatially-selective reflective structure of claim 1, wherein the partially-conducting slab and the modulating reflector disk are coupled with one or more mechanical fasteners.

16. The spatially-selective reflective structure of claim 1, wherein the modulating reflector disk can rotate independently of the partially-conducting slab.

17. The spatially-selective reflective structure of claim 1, wherein the partially-conducting slab and the modulating reflector disk are separated by a gap.

18. The spatially-selective reflective structure of claim 17, wherein the gap is adjustable.

19. The spatially-selective reflective structure of claim 1, wherein one or more modulations are depressions.

20. The spatially-selective reflective structure of claim 1, wherein the one or more modulations are bumps.

21. The spatially-selective reflective structure of claim 1, wherein the one or more modulations have a cross-sectional dimension greater or equal to about one wavelength of interest.

22. The spatially-selective reflective structure of claim 1, wherein the one or more modulations have a cross-sectional dimension greater or equal to three wavelengths of interest.

23. The spatially-selective reflective structure of claim 1, wherein the one or more modulations have a cross-sectional dimension less than the wavelength of interest multiplied by an F-number for an optics system directing radiation at the spatially-selective reflective structure.