Structure and method to improve threshold voltage of MOSFETs including a high k dielectric
First Claim
Patent Images
1. A semiconductor structure comprising:
- at least one patterned gate stack in at least one device region of a semiconductor substrate, said at least one patterned gate stack including from bottom to top, a patterned gate dielectric material having a dielectric constant of greater than silicon oxide, a patterned threshold voltage adjusting layer and a patterned gate conductor, wherein said patterned threshold voltage adjusting layer is an nFET threshold voltage adjusting material, said nFET threshold adjusting material includes a rare earth metal-containing material or an alkaline earth metal-containing material; and
a conformal nitride-containing liner located on at least exposed sidewalls of the patterned gate dielectric material, said conformal nitride-containing liner having a thickness of from 0.5 nm to 50 nm.
5 Assignments
0 Petitions
Accused Products
Abstract
Threshold voltage controlled semiconductor structures are provided in which a conformal nitride-containing liner is located on at least exposed sidewalls of a patterned gate dielectric material having a dielectric constant of greater than silicon oxide. The conformal nitride-containing liner is a thin layer that is formed using a low temperature (less than 500° C.) nitridation process.
-
Citations
20 Claims
-
1. A semiconductor structure comprising:
-
at least one patterned gate stack in at least one device region of a semiconductor substrate, said at least one patterned gate stack including from bottom to top, a patterned gate dielectric material having a dielectric constant of greater than silicon oxide, a patterned threshold voltage adjusting layer and a patterned gate conductor, wherein said patterned threshold voltage adjusting layer is an nFET threshold voltage adjusting material, said nFET threshold adjusting material includes a rare earth metal-containing material or an alkaline earth metal-containing material; and a conformal nitride-containing liner located on at least exposed sidewalls of the patterned gate dielectric material, said conformal nitride-containing liner having a thickness of from 0.5 nm to 50 nm. - View Dependent Claims (2, 3, 4)
-
-
5. A semiconductor structure comprising:
-
at least one patterned gate stack in at least one device region of a semiconductor substrate, said at least one patterned gate stack including from bottom to top, a patterned gate dielectric material having a dielectric constant of greater than silicon oxide and a patterned gate conductor; and a conformal nitride-containing liner located on at least exposed sidewalls of the patterned gate dielectric material, said conformal nitride-containing liner having a thickness of from 0.5 nm to 50 nm, wherein said conformal nitride-containing liner has an upper surface that does not extend above an upper surface of said patterned gate dielectric material. - View Dependent Claims (6, 7, 8, 9, 10)
-
-
11. A semiconductor structure comprising:
-
a first patterned gate stack in a first device region of a semiconductor substrate, and a second patterned gate stack in a second device region of the semiconductor substrate, wherein said first patterned gate stack includes from bottom to top, a patterned gate dielectric material having a dielectric constant of greater than silicon oxide, a first patterned threshold voltage adjusting layer and a patterned gate conductor and said second patterned gate stack includes from bottom to top, a patterned gate dielectric material having a dielectric constant of greater than silicon oxide, a second patterned threshold voltage adjusting layer and a patterned gate conductor, wherein one of the first or second patterned threshold voltage adjusting layers is a pFET threshold voltage adjusting material selected from Al, Al2O3, Ge, GeO2, Ta, Ta2O5, Ti, and TiO2 and the other of said first or second patterned threshold voltage adjusting layers not including a pFET threshold voltage adjusting material is an nFET threshold voltage adjusting material, said nFET threshold adjusting material includes a rare earth metal-containing material or an alkaline earth metal-containing material; and a conformal nitride-containing liner located on at least exposed sidewalls of the patterned gate dielectric material in both device regions, the conformal nitride-containing liner having a thickness of from 0.5 nm to 50 nm. - View Dependent Claims (12, 13, 14)
-
-
15. A semiconductor structure comprising:
-
a first patterned gate stack in a first device region of a semiconductor substrate, and a second patterned gate stack in a second device region of the semiconductor substrate, wherein said first patterned gate stack includes from bottom to top, a patterned gate dielectric material having a dielectric constant of greater than silicon oxide and a patterned gate conductor and said second patterned gate stack includes from bottom to top, a patterned gate dielectric material having a dielectric constant of greater than silicon oxide and a patterned gate conductor; and a conformal nitride-containing liner located on at least exposed sidewalls of the patterned gate dielectric material in both device regions, the conformal nitride-containing liner having a thickness of from 0.5 nm to 50 nm, wherein said conformal nitride-containing liner in each device region has an upper surface that does not extend above an upper surface of each patterned gate dielectric material. - View Dependent Claims (16, 17, 18, 19, 20)
-
Specification