Apparatus and method of testing singulated dies
First Claim
Patent Images
1. An apparatus comprising:
- a die carrier comprising;
a carrier;
die sites on the carrier, each die site comprising an area on the carrier where a singulated die can be placed;
application circuitry disposed on the carrier and configured to generate data signals for input into a die disposed at one of the die sites;
electrical connections from the application circuitry, wherein the electrical connections terminate immediately next to the one of the die sites but are spaced sufficiently away from all die sites on the carrier that the electrical connections do not physically connect to any die disposed at any die site on the carrier; and
electrical inputs configured to receive control signals for input into the application circuitry; and
a contactor device that is structurally distinct from the die carrier, the contactor device comprising;
a substrate; and
a first set of probe pairs disposed on the substrate, wherein each said probe pair comprises a first electrically conductive probe disposed to contact, without being attached to, one of the electrical connections of the die carrier and a second electrically conductive probe electrically connected to the first probe and disposed to contact, without being attached to, an input terminal of the die disposed at the one of the die sites.
1 Assignment
0 Petitions
Accused Products
Abstract
An exemplary die carrier is disclosed. In some embodiments, the die carrier can hold a plurality of singulated dies while the dies are tested. The dies can be arranged on the carrier in a pattern that facilities testing the dies. The carrier can be configured to allow interchangeable interfaces to different testers to be attached to and detached from the carrier. The carrier can also be configured as a shipping container for the dies.
49 Citations
19 Claims
-
1. An apparatus comprising:
-
a die carrier comprising; a carrier; die sites on the carrier, each die site comprising an area on the carrier where a singulated die can be placed; application circuitry disposed on the carrier and configured to generate data signals for input into a die disposed at one of the die sites; electrical connections from the application circuitry, wherein the electrical connections terminate immediately next to the one of the die sites but are spaced sufficiently away from all die sites on the carrier that the electrical connections do not physically connect to any die disposed at any die site on the carrier; and electrical inputs configured to receive control signals for input into the application circuitry; and a contactor device that is structurally distinct from the die carrier, the contactor device comprising; a substrate; and a first set of probe pairs disposed on the substrate, wherein each said probe pair comprises a first electrically conductive probe disposed to contact, without being attached to, one of the electrical connections of the die carrier and a second electrically conductive probe electrically connected to the first probe and disposed to contact, without being attached to, an input terminal of the die disposed at the one of the die sites. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
-
Specification