Machine motion control system for testing electronic components
First Claim
1. A machine motion control system for testing electronic devices, comprising:
- two test machines, each test machine comprising a plurality of moving parts for securing the electronic devices, and a plurality of driving modules electrically connected to the moving parts, respectively, the driving modules driving and controlling the corresponding moving parts, each driving module comprising a delay, a solenoid valve and a cylinder electrically connected to a moving part;
a control card electrically connected to the driving modules of each of the two test machines, the control card controlling the driving modules; and
a main controller electrically connected to the control card, wherein the main controller provides and transmits a movement instruction to the control card, the control card monitors and controls the driving modules according to the movement instruction, and the driving modules accordingly adjusts and drives the moving parts on the test machines;
wherein the control card comprises a main control module, two signal processing modules, and two switches, the main control module is electrically connected to the main controller, the two switches and the signal processing modules, each of the two test machines are electrically connected to the signal processing modules, respectively, the main control module comprises a main microcontroller, the main microcontroller comprises an activating signal transmitting pin and a finished signal receiving pin, the main controller comprises an activating signal receiving port and a finished signal transmitting port, the activating signal receiving port is electrically connected to the activating signal transmitting pin to receiving an activating signal, the finished signal transmitting port is electrically connected to the finished signal receiving pin to transmit a finished signal, each of the signal processing module comprises a signal processing integrated circuit and a signal amplifying integrated circuit, the signal processing integrated circuit comprises a group of data input pins and a group of data output pins, the data input pins are electrically connected to one group of signal transmission pins, respectively, of the main microcontroller, the data output pins are electrically connected to the signal amplifying integrated circuit, the signal amplifying integrated circuit amplifies command signals and movement instructions from the main microcontroller, the signal amplifying integrated circuit comprises a group of signal amplifying input pins and a group of signal amplifying output pins, the signal amplifying input pins are electrically connected to the data output pins, respectively, the signal amplifying output pins are electrically connected to the corresponding driving modules, respectively, the delay of each driving module is electrically connected to the signal amplifying output pins, respectively, of the signal amplifying integrated circuit to delay the amplified signals, the solenoid valves receive the delayed signals from the delays to control the movement of the cylinders, and the cylinders drives the moving parts on the test machine.
1 Assignment
0 Petitions
Accused Products
Abstract
A machine motion control system for testing electronic devices includes two test machines, a control card and a main controller. The test machines secure the electronic devices, whereby each test machine includes a plurality of moving parts for securing the electronic devices and a plurality of driving modules. The driving modules drive and control the corresponding moving parts of the test machine. The control card controls the driving modules. The main controller provides and transmits a movement instruction to the control card, the control card monitors and controls the driving modules according to the movement instruction, and the driving modules accordingly adjusts and drives the test machines and the moving parts on the test machines.
-
Citations
11 Claims
-
1. A machine motion control system for testing electronic devices, comprising:
-
two test machines, each test machine comprising a plurality of moving parts for securing the electronic devices, and a plurality of driving modules electrically connected to the moving parts, respectively, the driving modules driving and controlling the corresponding moving parts, each driving module comprising a delay, a solenoid valve and a cylinder electrically connected to a moving part; a control card electrically connected to the driving modules of each of the two test machines, the control card controlling the driving modules; and a main controller electrically connected to the control card, wherein the main controller provides and transmits a movement instruction to the control card, the control card monitors and controls the driving modules according to the movement instruction, and the driving modules accordingly adjusts and drives the moving parts on the test machines; wherein the control card comprises a main control module, two signal processing modules, and two switches, the main control module is electrically connected to the main controller, the two switches and the signal processing modules, each of the two test machines are electrically connected to the signal processing modules, respectively, the main control module comprises a main microcontroller, the main microcontroller comprises an activating signal transmitting pin and a finished signal receiving pin, the main controller comprises an activating signal receiving port and a finished signal transmitting port, the activating signal receiving port is electrically connected to the activating signal transmitting pin to receiving an activating signal, the finished signal transmitting port is electrically connected to the finished signal receiving pin to transmit a finished signal, each of the signal processing module comprises a signal processing integrated circuit and a signal amplifying integrated circuit, the signal processing integrated circuit comprises a group of data input pins and a group of data output pins, the data input pins are electrically connected to one group of signal transmission pins, respectively, of the main microcontroller, the data output pins are electrically connected to the signal amplifying integrated circuit, the signal amplifying integrated circuit amplifies command signals and movement instructions from the main microcontroller, the signal amplifying integrated circuit comprises a group of signal amplifying input pins and a group of signal amplifying output pins, the signal amplifying input pins are electrically connected to the data output pins, respectively, the signal amplifying output pins are electrically connected to the corresponding driving modules, respectively, the delay of each driving module is electrically connected to the signal amplifying output pins, respectively, of the signal amplifying integrated circuit to delay the amplified signals, the solenoid valves receive the delayed signals from the delays to control the movement of the cylinders, and the cylinders drives the moving parts on the test machine. - View Dependent Claims (2, 3, 4, 5, 6)
-
-
7. A machine motion control system for testing electronic devices, comprising:
-
a plurality of moving parts for securing the electronic devices; two test machines for supporting the moving parts, each test machine comprising a plurality of driving modules electrically connected to the moving parts, respectively, and a detection module electrically connected to one of the driving modules, the driving modules driving and controlling movements of the corresponding moving parts of the test machine, each driving module comprising a delay, a solenoid valve and a cylinder electrically connected to a moving part, the detection module providing a detecting result; an axis control card electrically connected to the driving modules and the detection module of each of the two test machines, the axis control card generating and providing a command signal according to the detecting result; and a main controller electrically connected to the axis control card, the main controller providing a movement instruction according to the command signal, the axis control card receiving the movement instruction from the main controller and then controlling the driving modules according to the movement instruction, the driving modules alternately driving and adjusting the test machines and the moving parts of the test machines to test the electronic devices; wherein the axis control card comprises a main control module, two signal processing modules, and two switches, the main control module is electrically connected to the main controller, the switches and the signal processing modules, the test machines are electrically connected to the signal processing modules, respectively, the main control module comprises a main microcontroller, the main microcontroller comprises two groups of signal transmission pins, two signal control pins, an activating signal transmitting pin and a finished signal receiving pin, and comprises an activating signal receiving port and a finished signal transmitting port, the activating signal receiving port is electrically connected to the activating signal transmitting pin to receiving an activating signal, the finished signal transmitting port is electrically connected to the finished signal receiving pin to transmit a finished signal, each signal processing module comprises a signal processing integrated circuit, the signal processing integrated circuit comprises two enabled pins, a group of data input pins and a group of data output pins, the data input pins are electrically connected to one group of signal transmission pins, respectively, the enabled pins are electrically connected to the signal control pins, respectively, and are controlled by the voltage level of the signal control pins, command signals and movement instructions from the main microcontroller are transmitted to the signal processing integrated circuits through the data input pins and are output to the driving modules through the data output pins when the signal control pins output low voltage signals to the enabled pins, the delay of each driving module is electrically connected to the data output pins, respectively, of the signal processing modules, the solenoid valves receive signals from the delays to control the movement of the cylinders, and the cylinders are capable of driving the moving parts on the test machine. - View Dependent Claims (8, 9, 10)
-
-
11. A machine motion control system for testing electronic devices, comprising:
-
two test machines, each test machine comprising a plurality of moving parts for securing the electronic devices, and a plurality of driving modules electrically connected to the moving parts, respectively, the driving modules driving and controlling the corresponding moving parts, each driving module comprises a delay, a solenoid valve and a cylinder electrically connected to a moving part; a control card electrically connected to the driving modules of each of the two test machines, the control card controlling the driving modules; and a main controller electrically connected to the control card, wherein the main controller provides and transmits a movement instruction to the control card, the control card monitors and controls the driving modules according to the movement instruction, and the driving modules accordingly adjusts and drives the moving parts on the test machines; wherein the control card comprises a main control module, two signal processing modules, and two switches, each of the signal processing module comprises a signal processing integrated circuit and a signal amplifying integrated circuit, the signal amplifying integrated circuit amplifies command signals and the movement instructions from the main control module, the delay of each driving module is electrically connected to the signal amplifying integrated circuit to delay the amplified signals of the signal amplifying integrated circuit, the solenoid valves receive the delayed signals from the delays to control the movement of the cylinders, and the cylinders drives the moving parts on the test machine.
-
Specification