Machine motion control system for testing electronic components

• US 8,515,583 B2
• Filed: 01/06/2011
• Issued: 08/20/2013
• Est. Priority Date: 07/16/2010
• Status: Active Grant

• Current Assignee: FIH (Hong Kong) Limited (Hon Hai Precision Industry Co., Ltd.), Shenzhen Futaihong Precision Industrial Company Limited (Hon Hai Precision Industry Co., Ltd.)
• Original Assignee: FIH (Hong Kong) Limited (Hon Hai Precision Industry Co., Ltd.), Shenzhen Futaihong Precision Industrial Company Limited (Hon Hai Precision Industry Co., Ltd.)
• Inventors: Li, Guang-chen
• Primary Examiner(s): Ali, Mohammad
• Assistant Examiner(s): Booker, Kelvin
• Application Number:
  US12/985,347
• Publication Number:
  US 20120016498A1
• Time in Patent Office: 957 Days
• Field of Search: 700/56, 700/275, 318/560, 318/51, 318/574
• US Class Current: 700/275
• CPC Class Codes: G05B 15/02 electric
• CPC Class Codes: G05B 19/19 characterised by positioning or contouring control systems, e.g. to control position from one programmed point to another or to control movement along a programmed continuous path
• CPC Class Codes: G05B 19/40 Open loop systems, e.g. using stepping motor
• CPC Class Codes: G05B 19/4142 characterised by the use of a microprocessor G05B19/4141 takes precedence
• CPC Class Codes: G05B 2219/34206 Motion controller independent from nc, lmc local motor controller

Abstract

A machine motion control system for testing electronic devices includes two test machines, a control card and a main controller. The test machines secure the electronic devices, whereby each test machine includes a plurality of moving parts for securing the electronic devices and a plurality of driving modules. The driving modules drive and control the corresponding moving parts of the test machine. The control card controls the driving modules. The main controller provides and transmits a movement instruction to the control card, the control card monitors and controls the driving modules according to the movement instruction, and the driving modules accordingly adjusts and drives the test machines and the moving parts on the test machines.

Claims

1. A machine motion control system for testing electronic devices, comprising:

two test machines, each test machine comprising a plurality of moving parts for securing the electronic devices, and a plurality of driving modules electrically connected to the moving parts, respectively, the driving modules driving and controlling the corresponding moving parts, each driving module comprising a delay, a solenoid valve and a cylinder electrically connected to a moving part;

a control card electrically connected to the driving modules of each of the two test machines, the control card controlling the driving modules; and

a main controller electrically connected to the control card, wherein the main controller provides and transmits a movement instruction to the control card, the control card monitors and controls the driving modules according to the movement instruction, and the driving modules accordingly adjusts and drives the moving parts on the test machines;

wherein the control card comprises a main control module, two signal processing modules, and two switches, the main control module is electrically connected to the main controller, the two switches and the signal processing modules, each of the two test machines are electrically connected to the signal processing modules, respectively, the main control module comprises a main microcontroller, the main microcontroller comprises an activating signal transmitting pin and a finished signal receiving pin, the main controller comprises an activating signal receiving port and a finished signal transmitting port, the activating signal receiving port is electrically connected to the activating signal transmitting pin to receiving an activating signal, the finished signal transmitting port is electrically connected to the finished signal receiving pin to transmit a finished signal, each of the signal processing module comprises a signal processing integrated circuit and a signal amplifying integrated circuit, the signal processing integrated circuit comprises a group of data input pins and a group of data output pins, the data input pins are electrically connected to one group of signal transmission pins, respectively, of the main microcontroller, the data output pins are electrically connected to the signal amplifying integrated circuit, the signal amplifying integrated circuit amplifies command signals and movement instructions from the main microcontroller, the signal amplifying integrated circuit comprises a group of signal amplifying input pins and a group of signal amplifying output pins, the signal amplifying input pins are electrically connected to the data output pins, respectively, the signal amplifying output pins are electrically connected to the corresponding driving modules, respectively, the delay of each driving module is electrically connected to the signal amplifying output pins, respectively, of the signal amplifying integrated circuit to delay the amplified signals, the solenoid valves receive the delayed signals from the delays to control the movement of the cylinders, and the cylinders drives the moving parts on the test machine.

2. The machine motion control system as claimed in claim 1, wherein when one of the two switches is operated, the corresponding signal processing module and the test machine are enabled and form a corresponding signal transmission path, the main controller transmits the command signals or movement instructions to the signal processing module and the test machine to control and drive the moving parts of the test machine.

3. The machine motion control system as claimed in claim 1, wherein the main microcontroller further comprises two groups of signal transmission pins and two selecting pins, the selecting pins are electrically connected to the two switches, respectively, the two groups of signal transmission pins are electrically connected to the signal processing modules, when one of the two switches is operated, the voltage level of a corresponding selecting pin is converted to a low voltage level, the corresponding group of signal transmission pins are enabled, and the command signals or the movement instructions are transmitted to the signal processing module though the group of signal transmission pins.

4. The machine motion control system as claimed in claim 1, wherein the signal processing integrated circuit further comprises two enabled pins, the main microcontroller further comprises two signal control pins, and the enabled pins are electrically connected to the signal control pins, respectively and are controlled by the voltage level of the signal control pins.

5. The machine motion control system as claimed in claim 4, wherein when the signal control pins output low voltage signals to the enabled pins, the signal processing integrated circuits are enabled, and the command signals and the movement instructions from the main microcontroller are transmitted to the signal processing integrated circuits through the data input pins and are output to the signal amplifying integrated circuit through the data output pins.

6. The machine motion control system as claimed in claim 1, wherein the main microcontroller further comprises two signal feedback pins, the test machine further comprises a detection module, the detection module is electrically connected to one solenoid valve and the signal feedback pins, and the detection module is capable of generating a detecting result and transmitting the detecting result to the main control module.

7. A machine motion control system for testing electronic devices, comprising:

a plurality of moving parts for securing the electronic devices;

two test machines for supporting the moving parts, each test machine comprising a plurality of driving modules electrically connected to the moving parts, respectively, and a detection module electrically connected to one of the driving modules, the driving modules driving and controlling movements of the corresponding moving parts of the test machine, each driving module comprising a delay, a solenoid valve and a cylinder electrically connected to a moving part, the detection module providing a detecting result;

an axis control card electrically connected to the driving modules and the detection module of each of the two test machines, the axis control card generating and providing a command signal according to the detecting result; and

a main controller electrically connected to the axis control card, the main controller providing a movement instruction according to the command signal, the axis control card receiving the movement instruction from the main controller and then controlling the driving modules according to the movement instruction, the driving modules alternately driving and adjusting the test machines and the moving parts of the test machines to test the electronic devices;

wherein the axis control card comprises a main control module, two signal processing modules, and two switches, the main control module is electrically connected to the main controller, the switches and the signal processing modules, the test machines are electrically connected to the signal processing modules, respectively, the main control module comprises a main microcontroller, the main microcontroller comprises two groups of signal transmission pins, two signal control pins, an activating signal transmitting pin and a finished signal receiving pin, and comprises an activating signal receiving port and a finished signal transmitting port, the activating signal receiving port is electrically connected to the activating signal transmitting pin to receiving an activating signal, the finished signal transmitting port is electrically connected to the finished signal receiving pin to transmit a finished signal, each signal processing module comprises a signal processing integrated circuit, the signal processing integrated circuit comprises two enabled pins, a group of data input pins and a group of data output pins, the data input pins are electrically connected to one group of signal transmission pins, respectively, the enabled pins are electrically connected to the signal control pins, respectively, and are controlled by the voltage level of the signal control pins, command signals and movement instructions from the main microcontroller are transmitted to the signal processing integrated circuits through the data input pins and are output to the driving modules through the data output pins when the signal control pins output low voltage signals to the enabled pins, the delay of each driving module is electrically connected to the data output pins, respectively, of the signal processing modules, the solenoid valves receive signals from the delays to control the movement of the cylinders, and the cylinders are capable of driving the moving parts on the test machine.

8. The machine motion control system as claimed in claim 7, wherein when one of the two switches is operated, the corresponding signal processing module and the test machine are enabled and form a corresponding signal transmission path, the main controller transmits the command signals or movement instructions from the main microcontroller to the signal processing module and the test machine to control and drive the moving parts of the test machine.

9. The machine motion control system as claimed in claim 7, wherein the main microcontroller further comprises two selecting pins, the selecting pins are electrically connected to the two switches, respectively, the two groups of signal transmission pins are electrically connected to the signal processing modules, when one of the two switches is operated, the voltage level of the corresponding selecting pin is converted to a low voltage level, the corresponding group of signal transmission pins are enabled, and the command signals or the movement instructions are transmitted to the signal processing module though the group of signal transmission pins.

10. The machine motion control system as claimed in claim 7, wherein the main microcontroller further comprises two signal feedback pins, the test machine further comprises a detection module, the detection module is electrically connected to one solenoid valve and the signal feedback pins, the detection module is capable of generating a detecting result and transmitting the detecting result to the main control module.

11. A machine motion control system for testing electronic devices, comprising:

two test machines, each test machine comprising a plurality of moving parts for securing the electronic devices, and a plurality of driving modules electrically connected to the moving parts, respectively, the driving modules driving and controlling the corresponding moving parts, each driving module comprises a delay, a solenoid valve and a cylinder electrically connected to a moving part;

a control card electrically connected to the driving modules of each of the two test machines, the control card controlling the driving modules; and

a main controller electrically connected to the control card, wherein the main controller provides and transmits a movement instruction to the control card, the control card monitors and controls the driving modules according to the movement instruction, and the driving modules accordingly adjusts and drives the moving parts on the test machines;

wherein the control card comprises a main control module, two signal processing modules, and two switches, each of the signal processing module comprises a signal processing integrated circuit and a signal amplifying integrated circuit, the signal amplifying integrated circuit amplifies command signals and the movement instructions from the main control module, the delay of each driving module is electrically connected to the signal amplifying integrated circuit to delay the amplified signals of the signal amplifying integrated circuit, the solenoid valves receive the delayed signals from the delays to control the movement of the cylinders, and the cylinders drives the moving parts on the test machine.