Accuracy of battery monitor parts
First Claim
1. A monitoring system comprising:
- a plurality of monitors, each having a plurality of input pairs, coupled to respective components of a component stack, that measure voltages of the components;
wherein adjacent monitors each have an input pair coupled to a common overlapping component of the stack; and
at least one of the monitors compares a measurement that it takes of an overlapping component to measurement data received from an adjacent monitor, representing the adjacent monitor'"'"'s measurement of the overlapping component, to calculate a corresponding correction factor for the system.
1 Assignment
0 Petitions
Accused Products
Abstract
Embodiments of the present invention provide a monitoring system that may include a plurality of monitors. Each may have a plurality of input pairs coupled to respective components of a component stack, wherein adjacent monitors each have an input pair coupled to a common component. Embodiments of the present invention provide an integrated circuit that may include a plurality of detectors to locally measure a first group of channels. The integrated circuit may also include a receiver operable to receive a measurement of at least one channel of the first group of channels, and a controller to calculate a correction factor based on the received measurement and a local measurement of the at least one channel and to correct all first group measurements with the correction factor.
5 Citations
26 Claims
-
1. A monitoring system comprising:
-
a plurality of monitors, each having a plurality of input pairs, coupled to respective components of a component stack, that measure voltages of the components; wherein adjacent monitors each have an input pair coupled to a common overlapping component of the stack; and at least one of the monitors compares a measurement that it takes of an overlapping component to measurement data received from an adjacent monitor, representing the adjacent monitor'"'"'s measurement of the overlapping component, to calculate a corresponding correction factor for the system. - View Dependent Claims (2, 3, 4, 5)
-
-
6. An integrated circuit, comprising:
-
a plurality of detectors to locally measure a first group of channels, one of said channels being an overlap channel; a receiver to receive measurement data from another integrated circuit, representing a measurement of the overlap channel; a controller to calculate a correction factor based on a local measurement of the overlap channel and the received measurement data to correct all first group measurements with the correction factor. - View Dependent Claims (7, 8, 9, 10, 11)
-
-
12. A calibration method for an integrated circuit, comprising:
-
locally measuring voltages on a plurality of inputs of the integrated circuit, one of said voltages being an overlap voltage; receiving data representing a measurement, taken by another integrated circuit, of the overlap voltage; generating a correction factor, by a controller within the integrated circuit, from the received measurement data and a local measurement of the overlap voltage; and
adjusting, by the controller, the locally measured voltages by the correction factor. - View Dependent Claims (13, 14, 15)
-
-
16. An integrated circuit, comprising:
-
a plurality of detectors to measure a first group of channels with a coupled external reference voltage source, one of said channels being an overlap channel; and a transmitter to transmit a local measurement of the overlap channel to another integrated circuit, wherein the transmitted local measurement of the overlap channel and a second measurement of the overlap channel taken by the other integrated circuit are used to calculate a correction factor for the other integrated circuit. - View Dependent Claims (17, 18, 19)
-
-
20. A system controller, comprising:
-
a receiver to receive measurements, taken by a plurality of monitoring devices, of respective components of a component stack, wherein adjacent monitoring devices each measure a common overlapping component; and a processor to adjust all received measurements based on common overlapping component measurements taken by adjacent monitoring devices. - View Dependent Claims (21, 22, 23)
-
-
24. A method, comprising:
-
receiving a first set of measurement signals from a first circuit, one of said first signals being a first overlap measurement signal representing a measurement of an overlap component taken by the first circuit; receiving a second set of measurement signals from a second circuit, one of said second signals being a second overlap measurement signal representing a measurement of the overlap component taken by the second circuit; calculating a correction factor based on the first and second overlap measurement signals; and adjusting, by a controller, the second set of measurement signals based on the correction factor. - View Dependent Claims (25, 26)
-
Specification