Sensitivity and static timing analysis for integrated circuit designs using a multi-CCC current source model
First Claim
1. A method of characterizing a standard cell for a cell library, the method comprising:
- characterizing a standard cell for a voltage transform function of a transform stage of a multi-channel-connected component (multi-CCC) current source model with a plurality of input signal waveforms having different slew rates, the voltage transform function to transform an input voltage waveform with a given slew rate into an intermediate voltage waveform;
characterizing parasitic capacitances of the standard cell; and
characterizing the standard cell for an output current for a driving stage of the multi-CCC current source model;
wherein at least one of the characterizing processes is performed with a processor.
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Abstract
In one embodiment of the invention, a multi-CCC current source model is disclosed to perform statistical timing analysis of an integrated circuit design. The multi-CCC current source model includes a voltage waveform transfer function, a voltage dependent current source, and an output capacitor. The voltage waveform transfer function receives an input voltage waveform and transforms it into an intermediate voltage waveform. The voltage dependent current source generates an output current in response to the intermediate voltage waveform. The output capacitor is coupled in parallel to the voltage dependent current source to generate an output voltage waveform for computation of a timing delay.
29 Citations
33 Claims
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1. A method of characterizing a standard cell for a cell library, the method comprising:
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characterizing a standard cell for a voltage transform function of a transform stage of a multi-channel-connected component (multi-CCC) current source model with a plurality of input signal waveforms having different slew rates, the voltage transform function to transform an input voltage waveform with a given slew rate into an intermediate voltage waveform; characterizing parasitic capacitances of the standard cell; and characterizing the standard cell for an output current for a driving stage of the multi-CCC current source model; wherein at least one of the characterizing processes is performed with a processor. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
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24. A system for characterizing a standard cell of a cell library, the system comprising:
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one or more processors to execute instructions; and a storage device coupled to the one or more processors, the storage device to store instructions including instructions to characterize a standard cell for a voltage transform function of a transform stage of a multi-channel-connected component (multi-CCC) current source model with a plurality of input signal waveforms having different slew rates, the voltage transform function to transform an input voltage waveform with a given slew rate into an intermediate voltage waveform; instructions to characterize parasitic capacitances of the standard cell; and instructions to characterize the standard cell for an output current for a driving stage of the multi-CCC current source model. - View Dependent Claims (25, 26, 27, 28, 29, 30)
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31. A computer readable product to characterize a standard cell of a cell library, the computer readable product comprising:
a computer readable storage device storing instructions including instructions to characterize a standard cell for a voltage transform function of a transform stage of a multi-channel-connected component (multi-CCC) current source model with a plurality of input signal waveforms having different slew rates, the voltage transform function to transform an input voltage waveform with a given slew rate into an intermediate voltage waveform; instructions to characterize parasitic capacitances of the standard cell; and instructions to characterize the standard cell for an output current for a driving stage of the multi-CCC current source model. - View Dependent Claims (32, 33)
Specification