Physical information acquisition method, physical information acquisition device, and semiconductor device
First Claim
1. An apparatus including a semiconductor device with a substrate, comprising:
- at least one visible light detection unit coupled to an image signal processing unit, each said visible light detection unit comprising a color filter adapted to transmit a corresponding wavelength region of visible light;
at least one infrared light detection unit adapted to detect a wavelength region of infrared light and coupled to said image signal processing unit; and
electrical isolation between the at least one light detection unit and the at least one infrared light detection unit,wherein,the at least one infrared light detection unit is positioned deeper within the substrate than the at least one visible light detection unit relative to a side on which light is incident on the semiconductor device,the substrate is an N-type substrate, anda P-N junction of the at least one visible light detection unit has a same ordered arrangement on the N-type substrate relative to a side on which light is incident on the semiconductor device as a P-N junction of the at least one infrared light detection unit.
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Abstract
A physical information acquisition method in which a corresponding wavelength region of visible light with at least one visible light detection unit coupled to an image signal processing unit is detected, each said visible light detection unit comprising a color filter adapted to transmit the corresponding wavelength region of visible light; a wavelength region of infrared light with at least one infrared light detection unit coupled to the image signal processing unit is detected; and, with the signal processing unit, a first signal received from the at least one visible light detection unit by subtracting a product from said first signal is corrected, said product resulting from multiplication of a second signal received from the at least one infrared light detection unit and a predetermined coefficient factor.
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Citations
10 Claims
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1. An apparatus including a semiconductor device with a substrate, comprising:
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at least one visible light detection unit coupled to an image signal processing unit, each said visible light detection unit comprising a color filter adapted to transmit a corresponding wavelength region of visible light; at least one infrared light detection unit adapted to detect a wavelength region of infrared light and coupled to said image signal processing unit; and electrical isolation between the at least one light detection unit and the at least one infrared light detection unit, wherein, the at least one infrared light detection unit is positioned deeper within the substrate than the at least one visible light detection unit relative to a side on which light is incident on the semiconductor device, the substrate is an N-type substrate, and a P-N junction of the at least one visible light detection unit has a same ordered arrangement on the N-type substrate relative to a side on which light is incident on the semiconductor device as a P-N junction of the at least one infrared light detection unit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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Specification