Method and apparatus for testing projected capacitance matrices and determining the location and types of faults
First Claim
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1. A method comprising:
- measuring a capacitance value of a sensor;
comparing the measured capacitance values to a first reference value;
adjusting a calibration parameter in response to comparing the measured capacitance value to the first reference value; and
determining sensor integrity by comparing the value of the adjusted calibration parameter to one or more second reference values, wherein determining sensor integrity comprises identifying at least one of a plurality of fault conditions, and wherein each of the plurality of fault conditions is defined by at least one of the one or more second reference values.
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Abstract
A method, system and apparatus is described for measuring a sensor, comparing measured values of a sensor to a reference value, adjusting a calibration parameter in response to the comparing of measured values to a reference value and determining sensor integrity based on the value o the adjusted parameter.
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Citations
21 Claims
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1. A method comprising:
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measuring a capacitance value of a sensor; comparing the measured capacitance values to a first reference value; adjusting a calibration parameter in response to comparing the measured capacitance value to the first reference value; and determining sensor integrity by comparing the value of the adjusted calibration parameter to one or more second reference values, wherein determining sensor integrity comprises identifying at least one of a plurality of fault conditions, and wherein each of the plurality of fault conditions is defined by at least one of the one or more second reference values. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. An apparatus comprising:
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means for measuring a capacitance value of a sensor; means for comparing the measured capacitance values to a first reference value; means for adjusting a calibration parameter in response to comparing the measured capacitance value to the first reference value; and means for determining sensor integrity by comparing the value of the adjusted calibration parameter to one or more second reference values, wherein the means for determining sensor integrity identifies at least one of a plurality of fault conditions, and wherein each of the plurality of fault conditions is defined by at least one of the one or more second reference values. - View Dependent Claims (14, 15)
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16. A system comprising:
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a capacitance sensor; a capacitance measurement circuit coupled with the capacitance sensor, the capacitance measurement circuit configured to measure a capacitance value of the capacitance sensor; a calibration circuit coupled with the capacitance measurement circuit, the calibration circuit configured to adjust a calibration parameter based on the measured capacitance value and a first reference value; and a controller coupled with the capacitance measurement circuit and the calibration circuit and configured to compare the value of the adjusted calibration parameter to one or more second reference values in order to identify faults and fault types in the capacitance sensor, wherein the one or more second reference values define the faults and the fault types. - View Dependent Claims (17, 18, 19, 20, 21)
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Specification