Opener and buffer table for test handler

• US 8,523,158 B2
• Filed: 07/02/2008
• Issued: 09/03/2013
• Est. Priority Date: 07/16/2007
• Status: Active Grant

• Current Assignee: Techwing Co., Ltd.
• Original Assignee: Techwing Co., Ltd.
• Inventors: Na, Yun-Sung, Jeon, In-Gu, Ahn, Seung-Chul, Kim, Dong-Han, Son, Jae-Hyun
• Primary Examiner(s): Carter, Monica
• Assistant Examiner(s): Deonauth, Nirvana
• Application Number:
  US12/666,124
• Publication Number:
  US 20100320348A1
• Time in Patent Office: 1,889 Days
• Field of Search: 269/56.21, 269/310, 269/309.289 R, 269/302.1, 269/71, 269/95, 269/20, 269/21, 269/43, 439/607.14, 324/756.01, 324/756.02
• US Class Current: 269/56
• CPC Class Codes: G01R 31/2893 Handling, conveying or loading, e.g. belts, boats, vacuum fingers G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H01L21/67

Abstract

An opener and a buffer table for a test handler are disclosed. The opener includes an opening plate, a plurality of pin blocks forming pairs, and at least one or more interval retaining apparatus for retaining an interval between the pin blocks forming a pair. Each of the pin blocks is movably coupled to the opening plate, and includes opening pins for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board. Although semiconductor devices to be tested are altered in size and a carrier board loading with the semiconductor devices is thus replaced, the opener does not need to be replaced, thereby reducing the replacement cost and the waste of resources.

Claims

1. An opener for a test handler comprising:

an opening plate;

a plurality of pin blocks that are formed in pairs, are movably coupled to the opening plate, and comprise opening pins fixed with the pin blocks for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board; and

at least one or more interval retaining apparatuses for retaining an interval between the pin blocks forming a pair, and comprising an interval securing element for securing an interval between the pin blocks forming a pair, wherein the interval securing element is placed between the pin blocks and detachably coupled to the opening plate, wherein the interval between the plurality of the pin blocks that are formed in pairs varies based on movement of each of the plurality of the pin block, wherein each of the at least one or more interval retaining apparatuses comprises an interval retaining element for retaining the interval that is secured by the interval securing element, and wherein the interval retaining element comprises at least one or more elastic members for applying an elastic force to at least one of the pin blocks forming a pair.

2. The opener according to claim 1, wherein the interval retaining element is integrally formed with the interval securing element.

4. The opener according to claim 2 wherein the interval retaining element comprises interval retaining protrusions that are integrally formed with the interval securing element.

3. An opener for a test handler comprising:

an opening plate;

a plurality of pin blocks that are formed in pairs, are movably coupled to the opening plate, and comprise opening pins fixed with the pin blocks for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board; and

at least one or more interval retaining apparatuses for retaining an interval between the pin blocks forming a pair, and comprising an interval securing element for securing an interval between the pin blocks forming a pair, wherein the interval securing element is placed between the pin blocks and detachably coupled to the opening plate, wherein the interval between the plurality of the pin blocks that are formed in pairs varies based on movement of each of the plurality of the pin block, wherein each of the at least one or more interval retaining apparatuses comprises an interval retaining element for retaining the interval that is secured by the interval securing element, wherein the interval retaining element is integrally formed with the interval securing element, and wherein the interval retaining element comprises interval retaining protrusions that are integrally formed with the interval securing element, in which the interval retaining protrusions are inserted into protrusion receiving grooves that are formed in the pin blocks forming a pair.

5. An opener for a test handler comprising:

an opening plate;

a plurality of pin blocks that are formed in pairs, are movably coupled to the opening plate, and comprise opening pins fixed with the pin blocks for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board; and

at least one or more interval retaining apparatuses for retaining an interval between the pin blocks forming a pair, and comprising an interval securing element for securing an interval between the pin blocks forming a pair, wherein the interval securing element is placed between the pin blocks and detachably coupled to the opening plate, wherein the interval between the plurality of the pin blocks that are formed in pairs varies based on movement of each of the plurality of the pin block, wherein the opening plate comprises block receiving elements to receive the plurality of pin blocks, wherein the opener further comprises;

guide rods that pass through respective through holes of the plurality of the pin blocks that are formed in pairs to secure the plurality of the pin blocks to the opening plate; and

springs that are formed on a first end of the guide rods and a second end of the guide rods.

6. The opener according to claim 5, wherein the springs that are formed on the first end of the guide rods and the second end of the guide rods push the plurality of pin blocks that are formed in pairs in opposing directions toward the interval retaining apparatus.