Calibration for three dimensional motion sensor

• US 8,527,228 B2
• Filed: 06/04/2010
• Issued: 09/03/2013
• Est. Priority Date: 06/04/2010
• Status: Expired due to Fees

• Current Assignee: Apple Inc.
• Original Assignee: Apple Inc.
• Inventors: Panagas, Peter
• Primary Examiner(s): Teixeira Moffat, Jonathan C
• Assistant Examiner(s): BETSCH, REGIS J
• Application Number:
  US12/794,578
• Publication Number:
  US 20110301901A1
• Time in Patent Office: 1,187 Days
• Field of Search: 702/93, 702/104, 702/151, 702/152, 702/153, 702/154, 73/13.8, 701/500
• US Class Current: 702/93
• CPC Class Codes: G01C 25/005 initial alignment, calibration or starting-up of inertial devices
• CPC Class Codes: G01P 21/00 Testing or calibrating of apparatus or devices covered by the preceding groups

Abstract

An electronic device can include an inertial measurement unit (IMU) operative to monitor the movement of the electronic device. The IMU used in the device can be inaccurate due to the manufacturing process used to construct the IMU and to incorporate the IMU in the electronic device. To correct the IMU output, the electronic device in which the IMU is incorporated can be placed in a testing apparatus that moves the device to known orientations. The IMU output at the known orientations can be compared to an expected true IMU output, and correction factors (e.g., sensitivity and offset matrices) can be calculated. The correction factors can be stored in the device, and applied to the IMU output to provide a true output. The testing apparatus can include a fixture placed in a gimbal movable around three axes.

Claims

1. A method for simultaneously calibrating several electronic devices having inertial measurement units (IMUs), the method comprising:

placing several electronic devices having embedded IMUs in a testing apparatus;

placing a separate true IMU in the testing apparatus;

moving the testing apparatus in a sequence of testing positions;

retrieving, at each testing position, an IMU output from at least one embedded IMU of each of the several electronic devices and a true IMU output from the true IMU;

calculating, for each electronic device, sensitivity and offset factors for adjusting the IMU output of the at least one embedded IMU to approach the true IMU output of the true IMU; and

storing, in storage of each electronic device, the calculated sensitivity and offset factors corresponding to the electronic device.

2. The method of claim 1, wherein:

moving further comprises moving the testing apparatus through at least four different positions.

3. The method of claim 2, wherein:

the at least four different positions are not correlated.

4. The method of claim 1, wherein:

moving further comprises moving the testing apparatus through six different positions.

5. The method of claim 2, further comprising:

rotating the testing apparatus around an axis for each of the different positions.

6. The method of claim 1, further comprising:

retrieving the true IMU output from the IMU associated with the testing apparatus.

7. The method of claim 6, wherein:

the IMU associated with the testing apparatus is more accurate than the IMUs embedded in each of the several electronic devices.

8. The method of claim 1, wherein:

the IMUs embedded in each of the several electronic devices comprise commercially available IMUs possessing an accuracy that is one of less than and equal to the accuracy of the IMU associated with the testing apparatus.

20. The method of claim 1, wherein the embedded IMUs are at least one of at least one gyroscope and at least one accelerometer.

21. The method of claim 1, wherein the embedded IMUs comprise a plurality of accelerometers.

22. The method of claim 21, further comprising detecting linear acceleration in a pair of perpendicular axes using the plurality of accelerometers.

23. The method of claim 1, wherein the embedded IMUs comprise at least one of a rotating element and a vibrating element.

9. A testing apparatus for calibrating inertial measurement units embedded in a plurality of electronic devices, the testing apparatus comprising a processor operative to:

direct the plurality of electronic devices and a separate inertial measurement unit to move in a sequence of positions while the plurality of electronic devices are placed in the testing apparatus;

receive, from an inertial measurement unit embedded in each electronic device of the plurality of electronic devices, an output corresponding to each of the sequence of positions in a reference frame associated with the inertial measurement unit embedded in each electronic device;

receive, from the separate inertial measurement unit, an output in a reference frame associated with at least one electronic device of the plurality of electronic devices;

make a comparison of the received output from the inertial measurement unit embedded in each electronic device to the output of the separate inertial measurement unit for each of the sequence of positions;

calculate correction factors for the inertial measurement unit embedded in each electronic device, wherein calculating the correction factors for the inertial measurement unit embedded in each electronic device comprises converting the reference frame associated with the inertial measurement unit embedded in each electronic device to the reference frame associated with the at least one electronic device based on the comparison; and

direct each electronic device of the plurality of electronic devices to store the correction factors.

10. The testing apparatus of claim 9, wherein the processor is further operative to:

move a gimbal in which the plurality of electronic devices are placed in a sequence of positions that are not correlated.

11. The testing apparatus of claim 10, wherein the processor is further operative to:

move the gimbal to a first position;

rotate the gimbal around a single axis while in the first position; and

retrieve an inertial measurement unit output from the inertial measurement unit embedded in each electronic device of the plurality of electronic devices and the separate inertial measurement unit while the gimbal rotates.

12. The testing apparatus of claim 9, wherein the processor is further operative to:

receive a plurality of outputs from the inertial measurement unit embedded in each electronic device of the plurality of electronic devices over a duration for a single position; and

extract a single value from the plurality of outputs for the single position.

13. The testing apparatus of claim 12, wherein the processor is further operative to:

average the plurality of outputs over the duration.

14. The testing apparatus of claim 9, wherein the processor is further operative to:

receive more outputs than required to calculate the correction factors; and

apply a least square regression to calculate the correction factors.

15. A method for calibrating a plurality of electronic devices, the method comprising:

placing the plurality of electronic devices in a testing apparatus, wherein each electronic device of the plurality of electronic devices includes a first inertial measurement unit (IMU) oriented in an IMU reference frame;

moving the testing apparatus through a plurality of different orientations;

receiving a first output from the first IMU in each electronic device as the testing apparatus is moved;

receiving, from a second IMU of the testing apparatus, a second output as the testing apparatus is moved, wherein the second IMU is oriented in a testing apparatus reference frame;

for each electronic device of the plurality of electronic devices, comparing the first and the second outputs at a same moment in time to calculate a correction factor for transforming the IMU reference frame to the testing apparatus reference frame; and

for each electronic device of the plurality of electronic devices, applying the calculated correction factor to the electronic device, wherein the correction factor is stored in memory of the electronic device.

16. The method of claim 15, wherein:

each of the plurality of electronic devices is positioned in a corresponding electronic device reference frame.

17. The method of claim 16, wherein:

the testing apparatus reference frame is substantially the same as the electronic device reference frame.

18. The method of claim 15, further comprising:

after the applying, comparing a third output of the first IMU to a corresponding fourth output of the second IMU.

19. The method of claim 18, further comprising:

determining whether the difference between the third output of the first IMU and the fourth output of the second IMU is less than a threshold.