Semiconductor recording device with error recovery

• US 8,533,559 B2
• Filed: 04/20/2009
• Issued: 09/10/2013
• Est. Priority Date: 05/12/2008
• Status: Active Grant

• Current Assignee: Panasonic Corporation (Panasonic Holdings Corporation)
• Original Assignee: Panasonic Corporation (Panasonic Holdings Corporation)
• Inventors: Ootsuka, Takeshi
• Primary Examiner(s): Baderman, Scott
• Assistant Examiner(s): KUDIRKA, JOSEPH R
• Application Number:
  US12/988,660
• Publication Number:
  US 20110041036A1
• Time in Patent Office: 1,604 Days
• Field of Search: 714/6.2, 714/6.22, 714/6.24, 714/758, 714/763, 714/764, 714/766, 714/773, 711/100, 711102-104, 711/114, 365/185.09, 365/185.33
• US Class Current: 714/758
• CPC Class Codes: G06F 11/1048 using arrangements adapted for a specific error detection or correction feature

Abstract

An error correction code of (N+M) words is configured by adding an ECC parity of M word (M is a natural number) to N words extracted at an interval of A words with respect to data of (A*N) words (A and N are natural numbers) inputted via an interface. A data distributor distributes (N+M) words to the respective (N+M) physical blocks to record by A words. In a case where a writing error has occurred, data recorded in a cell sharing page of the page and in a page of another physical block configuring the error correction code is read. A disappearing correction is carried out to the data of the cell sharing page by using the data, and thus the data of the cell sharing page is recovered and written. In this manner, in the multi-level nonvolatile memory, an error in writing of a certain page can be prevented from propagating to a written page sharing a cell.

Claims

1. A semiconductor recording device incorporating a multi-level nonvolatile memory storing a plurality of bits per memory cell and having physical blocks composed of a plurality of pages, wherein a plurality of said physical blocks are configured as one group, comprising:

a first error correcting code (ECC) generator for adding an ECC parity extracted at a predetermined interval in inputted data and for generating a first ECC;

a data distributor for distributing the first ECC generated by said first ECC generator to different physical blocks in the group in a predetermined size;

a data writer for writing data distributed by said data distributor to the respective physical blocks of a group;

a writing error detector for detecting, when writing to said nonvolatile memory in a page of the physical block, a writing error;

an error flag generator for generating an error flag showing a possibility of the writing error with respect to a page of a cell that stores a plurality of bits, wherein respective bits of a page in which an error is detected by said writing error detector share a common cell of said nonvolatile memory;

a data reader for reading data of a page in which the error flag is generated by said error flag generator and all data configuring the first ECC from the respective physical blocks; and

a data recovering part for recovering data of a cell sharing page specified by said error flag generator from the data read by said data reader and writing the recovered data to a page of a physical block in which data is not previously written.

2. The semiconductor recording device according to claim 1, wherein

said error flag generator generates an error flag showing possibility of a writing error with respect to all written pages of the physical block to which a page where an error is detected by said writing error detector belongs.

3. The semiconductor recording device according to claim 1, wherein

said data writer writes data distributed by said data distributor to same pages of the respective physical blocks.

4. The semiconductor recording device according to claim 1, wherein

each physical block of the plurality of physical blocks are different nonvolatile memories, respectively.